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2007 14th International Conference on Mixed Design of Integrated Circuits and Systems最新文献

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CMOS Dual-Channel 0.5A Power Switch for Power Distribution Via USB Port CMOS双通道0.5A电源开关，用于USB接口配电
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286225
V. Nagy, V. Stopjaková, J. Brenkus, M. Simlastík, M. Konfal
{"title":"CMOS Dual-Channel 0.5A Power Switch for Power Distribution Via USB Port","authors":"V. Nagy, V. Stopjaková, J. Brenkus, M. Simlastík, M. Konfal","doi":"10.1109/MIXDES.2007.4286225","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286225","url":null,"abstract":"Dual-channel 0.5 A high-side intelligent power distribution switch with overcurrent and overtemperature circuit protection and soft start feature is proposed in this paper. The switch is dedicated to use in portable USB devices. Besides that, another motivation was to use the switch as a mixed-signal test vehicle to evaluate feasibility of current sensors for on-chip current testing. Parameters and features of the switch were investigated for a wide temperature range and process variations. The proposed power switch was designed in a standard CMOS technology and it is being physically implemented in 0.35 mum process by AMS.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131486803","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Eyelids Localization Method Designed for Iris Recognition System 虹膜识别系统中眼睑定位方法的设计
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286237
W. Sankowski, K. Grabowski, M. Napieralska, M. Zubert
{"title":"Eyelids Localization Method Designed for Iris Recognition System","authors":"W. Sankowski, K. Grabowski, M. Napieralska, M. Zubert","doi":"10.1109/MIXDES.2007.4286237","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286237","url":null,"abstract":"The main aim of the presented researches was to design and implement algorithm for eyelids localization that would be applied in iris recognition system. The authors' method searches for eyelids based on two criteria - presence of edges in the grayscale image of eye and intensity value in the sclera region. The algorithm was implemented in C++ language and was integrated in the iris finder - authors' software for iris localization. The method has been tested on two databases - the DMCS and the UBIRIS one. For both the two criteria approach proposed by the authors has yielded to satisfactory results.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129664449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
A Novel Fully-Differential Gm-C Filter Structure for Communication Channel Equalizer 一种新型通信信道均衡器全差分Gm-C滤波器结构
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286152
M. Aliparast, A. Khoei, K. Hadidi
{"title":"A Novel Fully-Differential Gm-C Filter Structure for Communication Channel Equalizer","authors":"M. Aliparast, A. Khoei, K. Hadidi","doi":"10.1109/MIXDES.2007.4286152","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286152","url":null,"abstract":"In this paper, a novel Gm-C filter for equalizers used in communication channels transmitting digital data for applications in CMOS integrated circuits is presented. Using the novel structure the poles of internal Gm-blocks are avoided and better stability and ability to operate in high frequencies are achieved. To tune the filter, instead of changing transconductance (Gm), we have used variation of capacitance (C). Cat5 data cable is used for testing and simulating the circuit. The design has been processed in a 0.3 5 mum four-metal single-poly CMOS process. Power consumption of the chip is 18mW and the area is 53000mum2 which are both improved in comparison to previous conventional designs.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131181254","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
The Influence of Defect Distribution Function Parameters on Test Patterns Generation 缺陷分布函数参数对测试模式生成的影响
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286222
M. Rakowski, W. Pleskacz, P. Borkowski
{"title":"The Influence of Defect Distribution Function Parameters on Test Patterns Generation","authors":"M. Rakowski, W. Pleskacz, P. Borkowski","doi":"10.1109/MIXDES.2007.4286222","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286222","url":null,"abstract":"This paper describes the analysis of influence of yield loss model parameters on the test patterns generation. The probability of shorts between conducting paths as well as the estimations of yield loss are presented on the example gates from industrial standard cell library in 0.8 mum CMOS technology.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124859251","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Improved Low-Power Low-Voltage CMOS Comparator for 4-Bit Flash ADCS for UWB Applications 用于超宽带应用的4位闪存adc的改进低功耗低压CMOS比较器
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286170
J. Oliveira, J. Goes, N. Paulino, J. Fernandes
{"title":"Improved Low-Power Low-Voltage CMOS Comparator for 4-Bit Flash ADCS for UWB Applications","authors":"J. Oliveira, J. Goes, N. Paulino, J. Fernandes","doi":"10.1109/MIXDES.2007.4286170","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286170","url":null,"abstract":"In this paper we propose a novel comparator structure, to be used in low-resolution ultra-high-speed ADCs that improve the energy-efficiency. In this comparator, the pre-amplification is embedded in the input switched-capacitor network by using the passive-amplification capability of MOS devices. Simulated results show that this comparator exhibits low-offset ultra-fast regeneration-time and high energy-efficiency.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116260505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Design of a Cascoded Operational Amplifier with High Gain 高增益级联编码运算放大器的设计
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286162
B. Lipka, U. Kleine
{"title":"Design of a Cascoded Operational Amplifier with High Gain","authors":"B. Lipka, U. Kleine","doi":"10.1109/MIXDES.2007.4286162","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286162","url":null,"abstract":"In this paper the design of a CMOS cascoded operational amplifier is described. Due to technology scaling the design of a former developed operational amplifier has now overcome its stability problems. A stable three stage operational amplifier is presented. A layout has been created automatically by using the ALADIN tool. With help of the extracted layout the performance data of the amplifier is simulated.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"2002 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128657225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
C-V Characterization of Nonlinear Capacitors using CBCM Method 用CBCM方法表征非线性电容器的C-V特性
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286214
T. Sutory, Z. Kolka
{"title":"C-V Characterization of Nonlinear Capacitors using CBCM Method","authors":"T. Sutory, Z. Kolka","doi":"10.1109/MIXDES.2007.4286214","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286214","url":null,"abstract":"The paper deals with a modification of CBCM (charge-based capacitance measurements) for nonlinear capacitance characterization. The method is characterized by high resolution although it is based on equipment found in any average laboratory. CBCM was originally developed for linear interconnect measurements. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. A test-chip implementing the method was designed and manufactured in 0.35 mum CMOS process. Verification against known capacitances proved the method correctness and accuracy. It was successfully used for MOSCAPs characterization in full operating voltage range.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129736768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Modelling of Thin Film Transistors for Circuit Simulation 用于电路仿真的薄膜晶体管建模
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286117
B. Iiguez, Rodrigo Picos, Magali Estrada, A. Cerdeira, T. Ytterdal, Warren B. Jackson, Alexey Koudymov, Dmitry Veksler, Michael Shur
{"title":"Modelling of Thin Film Transistors for Circuit Simulation","authors":"B. Iiguez, Rodrigo Picos, Magali Estrada, A. Cerdeira, T. Ytterdal, Warren B. Jackson, Alexey Koudymov, Dmitry Veksler, Michael Shur","doi":"10.1109/MIXDES.2007.4286117","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286117","url":null,"abstract":"We review recent physics-based, compact models for thin film transistors (TFTs), including amorphous (a-Si), polysilicon (poly-Si), nanocrystalline silicon (nc-Si), and organic TFTs. The models accurately reproduce the DC characteristics for different geometries. We also present a universal TFT model paradigm, which allows to obtain a suitable estimation of TFT characteristics using only eight parameters, which are very easy to extract. This universal TFT model is used for the first iteration step in complete models adapted to each type of device.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122759846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Nonlinear Model of Electrokinetic Phenomena in VHDL-AMS VHDL-AMS中电动力学现象的非线性模型
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286204
K. Slusarczyk, A. Napieralski
{"title":"Nonlinear Model of Electrokinetic Phenomena in VHDL-AMS","authors":"K. Slusarczyk, A. Napieralski","doi":"10.1109/MIXDES.2007.4286204","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286204","url":null,"abstract":"In this paper a new non-linear model of electrokinetic phenomena as well as results of the model simulations are presented. The origin of the model can be found in electric double layer and site binding theories, therefore the model is based on physical and physico-chemical constants such as buffer pH, zeta-potential or fluid viscosity. The model was thought as a first-attempt-model, very useful while the first stage of a new fluidic microsystem design process is being launched. Therefore it is not as precise as a 2D or 3D multidomain models, but because of implementing in VHDL-AMS language, it is fast and reliable, and also can show a global tendency of the designed microsystem behavior.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116131136","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Focus Assessment Issues in Iris Image Acquisition System 虹膜图像采集系统中的焦点评估问题
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286238
K. Grabowski, W. Sankowski, M. Zubert, M. Napieralska
{"title":"Focus Assessment Issues in Iris Image Acquisition System","authors":"K. Grabowski, W. Sankowski, M. Zubert, M. Napieralska","doi":"10.1109/MIXDES.2007.4286238","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286238","url":null,"abstract":"Iris recognition is considered as one of the best biometric method. Implementing this method to the practical system requires the special acquisition system for collecting iris image database, where the iris focus assessment plays a crucial role. Before iris focusing method is applied, iris localization in blurred image should be performed, and next the algorithm searches for sharpness in iris area. In this paper a three methods are discussed for iris focus assessment: Daugman's frequency criterion, simple edge detection and new quantity of information test. Proposed solution will be applied for iris image acquisition system, where image will be taken under several kinds of illumination.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123455669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
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