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2007 14th International Conference on Mixed Design of Integrated Circuits and Systems最新文献

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Logic Synthesis Importance in FPGA-Based Designing of Image and Signal Processing Systems 逻辑综合在基于fpga的图像与信号处理系统设计中的重要性
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286137
P. Tomaszewicz, M. Nowicka, B. Falkowski, T. Luba
{"title":"Logic Synthesis Importance in FPGA-Based Designing of Image and Signal Processing Systems","authors":"P. Tomaszewicz, M. Nowicka, B. Falkowski, T. Luba","doi":"10.1109/MIXDES.2007.4286137","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286137","url":null,"abstract":"General functional decomposition has been gaining more and more importance in recent years. Though it is mainly perceived as a method of logic synthesis for implementation of Boolean functions into FPGA-based architectures, it has found application in many other fields of modern engineering and science. In this paper, application of logic decomposition to efficient implementation of image and signal processing system in modern FPGA architectures is described. We have adapted an algorithm called Demain that can be used as a preprocessing tool in the FPGA synthesis flow. Wavelet filters are used to test Demain with Altera's Stratix device family and the experimental results are compared with those by Altera's Quartus tool. When Demain is used as a premapping processing, it shows 50% improvement in terms of the covered area by embedded memory blocks.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"107 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122939813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Digital Implementation of a Programmable Reconfigurable Fuzzy Automaton for Control Applications 用于控制应用的可编程可重构模糊自动机的数字实现
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286165
A. Wielgus, M. Maciąg
{"title":"Digital Implementation of a Programmable Reconfigurable Fuzzy Automaton for Control Applications","authors":"A. Wielgus, M. Maciąg","doi":"10.1109/MIXDES.2007.4286165","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286165","url":null,"abstract":"This paper presents the design of a digital CMOS integrated circuit implementing fuzzy finite state automaton as a fuzzy logic controller. The parameterised VHDL model allows to synthesise the circuit of the required size for a particular application. Moreover, on-chip programming and reconfiguration of the automaton is performed.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133399315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Modeling and the Simulator of Digital Circuits in Object-Oriented Programming 面向对象编程中的数字电路建模与仿真
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286201
S. Senczyna
{"title":"Modeling and the Simulator of Digital Circuits in Object-Oriented Programming","authors":"S. Senczyna","doi":"10.1109/MIXDES.2007.4286201","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286201","url":null,"abstract":"A designing of digital circuits is based on hardware description languages (HDLs). The dominating standard of HDLs is the VHDL, which basing on a digital circuit structure, a net-list, and an event-driven algorithm. In the publication is presented a description of the digital circuit built in an object-oriented programming. The base assumptions of a description are a digital circuit diagram and an event-driven algorithm. The descriptions are expressed in terms of the C#. A first part of the method based on a conception, which is widely published. A second part of the method is our conception of implementing an event-driven algorithm, using \"a reformulating\".","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"134 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133212936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Polysiloxane Thin Films Optimisation for Potassium Detection using EIS Characterisation with Microelectrode Structures 微电极结构EIS表征聚硅氧烷薄膜钾离子检测优化研究
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286209
B. Torbiéro, J. Launay, A. Benyahia, A. Martinez, P. Temple-Boyer
{"title":"Polysiloxane Thin Films Optimisation for Potassium Detection using EIS Characterisation with Microelectrode Structures","authors":"B. Torbiéro, J. Launay, A. Benyahia, A. Martinez, P. Temple-Boyer","doi":"10.1109/MIXDES.2007.4286209","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286209","url":null,"abstract":"Most chemical or biochemical analysis use current-voltage I(V) characterization as detection principle. Thus, the development of microelectrodes using standard silicon technologies process is required: they show advantages of mass production, generic structure, small dimensions, low cost, and are well adapted for the detection of chemical, biochemical or biological species in aqueous environment using specific impedimetric measurement methods.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"375 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133445711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Application of Advanced Thermal Analysis Method for Investigation of Internal Package Structure 先进热分析方法在内部封装结构研究中的应用
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286224
J. Banaszczyk, M. Janicki, B. Vermeersch, G. Mey, A. Napieralski
{"title":"Application of Advanced Thermal Analysis Method for Investigation of Internal Package Structure","authors":"J. Banaszczyk, M. Janicki, B. Vermeersch, G. Mey, A. Napieralski","doi":"10.1109/MIXDES.2007.4286224","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286224","url":null,"abstract":"This paper presents an application of thermal analysis methods for the investigation of the internal structure of electronic device packages. The problem is illustrated based on the example of two silicon carbide power diodes. These diodes provided by different manufacturers have the same ratings and package type but one of the diodes exhibits oscillatory behaviour when used in a power converter. The presented results of thermal tests and analyses confirmed that there exist important differences between the two devices in their internal structures, possibly indicating the presence of some imperfections in the die attach or the wire bonds. These faults, in turn, have negative impact on their electrical performance in the investigated circuit.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115752871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Model Parameter Extraction for the High Voltage SOI-Process using BSIMSOI3 Model and ICCAP 基于BSIMSOI3模型和ICCAP的高压soi过程模型参数提取
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286126
J. Pieczynski, T. Gneiting
{"title":"Model Parameter Extraction for the High Voltage SOI-Process using BSIMSOI3 Model and ICCAP","authors":"J. Pieczynski, T. Gneiting","doi":"10.1109/MIXDES.2007.4286126","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286126","url":null,"abstract":"This paper presents a procedure for electrical parameter extraction of high voltage SOI MOS transistors. Several types of NMOS and PMOS fully depleted SOI devices were measured and modelled in a voltage ranging up to 30V. The standard Berkeley BSIMSOI3 model with ICCAP software was applied as a basis for modelling work. In order to increase the maximum operation voltage of the MOSFETs, a number of devices were designed and fabricated with additional drain extension structures. However, this resulted in problematic parasitic effects, such as back gate control of the drain extension and drain current quasi-saturation. In order to account for these effects in the modelling procedure, special sub-circuits containing transistors, resistors and voltage sources were implemented.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115930497","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Heuristic Approach to System-Level Design Problems 系统级设计问题的启发式方法
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286148
A. Pułka
{"title":"A Heuristic Approach to System-Level Design Problems","authors":"A. Pułka","doi":"10.1109/MIXDES.2007.4286148","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286148","url":null,"abstract":"The paper concerns the problem of system level design i.e. generation of high quality abstract models of modern electronic embedded systems for simulation, verification and technology mapping. The work focuses on methodology and AI techniques that can be incorporated to CAD tools. The main effort has been done on formulation of the algorithm and inference engine that controls the process of SoC modeling. The presented methodology binds AI techniques and formal verification methods with complex digital systems modeling. The author's SMOG algorithm is briefly recalled as a basis for the presented approach. Then the algorithm modifications are proposed. Some aspects of the implementation of the method in PROLOG are emphasized. The results and conclusions summarize the work.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125523866","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Radtest - Testing Board for the Software Implemented Hardware Fault Tolerance Research Radtest——软件测试板实现硬件容错的研究
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286133
A. Piotrowski, D. Makowski, S. Tarnowski, A. Napieralski
{"title":"Radtest - Testing Board for the Software Implemented Hardware Fault Tolerance Research","authors":"A. Piotrowski, D. Makowski, S. Tarnowski, A. Napieralski","doi":"10.1109/MIXDES.2007.4286133","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286133","url":null,"abstract":"Modern experiments in particle physics are based on advanced and sophisticated electronic systems which have to operate under radiation impact. The problem of designing a hardened system becomes very important, especially in places such as accelerators and synchrotrons where the results of the experiments depend on control system based on digital devices eg. microcontrollers. This paper highlights new solutions of the reliability problem known as the software implemented hardware fault tolerance. That is a strict software approach and could be used with unhardened, commercial off-the-shelf (COTS) components.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115345459","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
STARC's Semiconductor Design Technology Research Activities and the HiSIM2 Advanced MOSFET Model Project STARC的半导体设计技术研究活动和HiSIM2先进MOSFET模型项目
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286118
Y. Furui, M. Miura-Mattausch, N. Sadachika, M. Miyake, T. Ezaki, H. Mattausch, T. Ohguro, T. Iizuka, R. Inagaki, N. Fudanuki
{"title":"STARC's Semiconductor Design Technology Research Activities and the HiSIM2 Advanced MOSFET Model Project","authors":"Y. Furui, M. Miura-Mattausch, N. Sadachika, M. Miyake, T. Ezaki, H. Mattausch, T. Ohguro, T. Iizuka, R. Inagaki, N. Fudanuki","doi":"10.1109/MIXDES.2007.4286118","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286118","url":null,"abstract":"STARC (Semiconductor Technology Academic Research Center) is a research consortium co-founded by major Japanese semiconductor companies, whose mission is to contribute to the growth of the Japanese semiconductor industry by developing leading-edge SoC design technologies. One of the achievements enabled by the academia collaboration is HiSIM (Hiroshima University STARC IGFET Model) an advanced MOSFET Model. The HiSIM2 version includes required features in modeling for the 45 nm technology node and beyond such as the STI effect. A major development is an improved model consistency, which enables even modeling of the technology variation accurately. HiSIM2 realizes both accurate and fast circuit simulation.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115094531","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterization at Cryogenic Temperatures of Piezostacks Dedicated to Fast Tuners for SRF Cavities 专用于SRF腔快速调谐器的压电堆的低温表征
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems Pub Date : 2007-06-21 DOI: 10.1109/MIXDES.2007.4286115
M. Fouaidy, G. Martinet, N. Hammoudi, F. Chatelet, A. Olivier
{"title":"Characterization at Cryogenic Temperatures of Piezostacks Dedicated to Fast Tuners for SRF Cavities","authors":"M. Fouaidy, G. Martinet, N. Hammoudi, F. Chatelet, A. Olivier","doi":"10.1109/MIXDES.2007.4286115","DOIUrl":"https://doi.org/10.1109/MIXDES.2007.4286115","url":null,"abstract":"In the frame of the European CARE project, we designed and constructed three apparatus dedicated to full characterization of low voltage piezoelectric actuators. These piezostacks are integrated in fast active cold tuning systems (FACTS) and used for dynamic stabilisation of the resonant frequency of Superconducting RF (SRF) cavities. The three facilities we developed allow the measurement of electromechanical (capacitance, loss factor, displacement), thermal (specific heat, interfacial thermal resistance) and dynamic properties (effect of a preloading force) of industrial piezostacks for temperature in the range 2K-300K. Moreover, several piezostacks supplied by three different companies were subjected to ionizing radiation with fast neutrons beams at T=4.2K and for fluence in excess of 2.1014 n/cm2. The test apparatus are described in details then the experimental data are analyzed and discussed.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126799208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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