B. Iiguez, Rodrigo Picos, Magali Estrada, A. Cerdeira, T. Ytterdal, Warren B. Jackson, Alexey Koudymov, Dmitry Veksler, Michael Shur
{"title":"Modelling of Thin Film Transistors for Circuit Simulation","authors":"B. Iiguez, Rodrigo Picos, Magali Estrada, A. Cerdeira, T. Ytterdal, Warren B. Jackson, Alexey Koudymov, Dmitry Veksler, Michael Shur","doi":"10.1109/MIXDES.2007.4286117","DOIUrl":null,"url":null,"abstract":"We review recent physics-based, compact models for thin film transistors (TFTs), including amorphous (a-Si), polysilicon (poly-Si), nanocrystalline silicon (nc-Si), and organic TFTs. The models accurately reproduce the DC characteristics for different geometries. We also present a universal TFT model paradigm, which allows to obtain a suitable estimation of TFT characteristics using only eight parameters, which are very easy to extract. This universal TFT model is used for the first iteration step in complete models adapted to each type of device.","PeriodicalId":310187,"journal":{"name":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","volume":"94 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 14th International Conference on Mixed Design of Integrated Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIXDES.2007.4286117","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
We review recent physics-based, compact models for thin film transistors (TFTs), including amorphous (a-Si), polysilicon (poly-Si), nanocrystalline silicon (nc-Si), and organic TFTs. The models accurately reproduce the DC characteristics for different geometries. We also present a universal TFT model paradigm, which allows to obtain a suitable estimation of TFT characteristics using only eight parameters, which are very easy to extract. This universal TFT model is used for the first iteration step in complete models adapted to each type of device.