{"title":"Fault modeling for FinFET circuits","authors":"M. O. Simsir, A. Bhoj, N. Jha","doi":"10.1109/NANOARCH.2010.5510927","DOIUrl":"https://doi.org/10.1109/NANOARCH.2010.5510927","url":null,"abstract":"FinFETs are expected to supplant planar CMOS field-effect transistors (FETs) in the near future, owing to their superior electrical characteristics. From a circuit testing viewpoint, it is unclear if CMOS fault models are comprehensive enough to model all defects in FinFET circuits. In this work, we address the above problem using mixed-mode Sentaurus TCAD device simulations and demonstrate that while faults defined for planar MOSFETs show significant overlaps with FinFETs, they are insufficient to encompass all regimes of operation. Results indicate that new fault models are needed to adequately capture the behavior of logic gates based on independent-gate FinFETs with opens on the back gate, and shorted-gate FinFETs which have been accidentally etched into independent-gate structures.","PeriodicalId":306717,"journal":{"name":"2010 IEEE/ACM International Symposium on Nanoscale Architectures","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129439761","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Pino, James W. Bohl, N. McDonald, B. Wysocki, Peter J. Rozwood, K. Campbell, A. Oblea, Achyut Timilsina
{"title":"Compact method for modeling and simulation of memristor devices: Ion conductor chalcogenide-based memristor devices","authors":"R. Pino, James W. Bohl, N. McDonald, B. Wysocki, Peter J. Rozwood, K. Campbell, A. Oblea, Achyut Timilsina","doi":"10.1109/NANOARCH.2010.5510936","DOIUrl":"https://doi.org/10.1109/NANOARCH.2010.5510936","url":null,"abstract":"A compact model and simulation methodology for chalcogenide based memristor devices is proposed. From a microprocessor design view point, it is important to be able to simulate large numbers of devices within the integrated circuit architecture in order to speed up reliably the development process. Ideally, device models would accurately describe the characteristic device behavior and would be represented by single-valued equations without requiring the need for recursive or numerically intensive solutions. With this in mind, we have developed an empirical chalcogenide compact memristor model that accurately describes all regions of operations of memristor devices employing single-valued equations.","PeriodicalId":306717,"journal":{"name":"2010 IEEE/ACM International Symposium on Nanoscale Architectures","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124365615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Prasad Shabadi, A. Khitun, P. Narayanan, M. Bao, I. Koren, Kang L. Wang, C. A. Moritz
{"title":"Towards logic functions as the device","authors":"Prasad Shabadi, A. Khitun, P. Narayanan, M. Bao, I. Koren, Kang L. Wang, C. A. Moritz","doi":"10.1109/NANOARCH.2010.5510934","DOIUrl":"https://doi.org/10.1109/NANOARCH.2010.5510934","url":null,"abstract":"This paper argues for alternate state variables and new types of sophisticated devices that implement more functionality in one computational step than typical devices based on simple switches. Elementary excitations in solids enabling wave interactions are possible initial candidates to create such new devices. The paper focuses on magnon-based spin-wave-logic functions (SPWF) and presents high fan-in majority, weighted high fan-in majority, and frequency-multiplexed weighted high fan-in majority devices as initial SPWFs. Experiments proving feasibility are also shown. Benefits vs. scaled CMOS are quantified. Results show that for 128 or larger inputs even a 2.5µm SPWF carry-look-ahead adder implementation is faster than the 45nm CMOS version. The 45nm SPWF adder is expected to be significantly faster across the whole range of input widths. In particular, the 45nm SPWF CLA adder is estimated to be at least 77X faster than CMOS version for input widths equal to or greater than 1024. A second example of a counter circuit is presented to illustrate the considerable reduction in complexity possible vs. CMOS.","PeriodicalId":306717,"journal":{"name":"2010 IEEE/ACM International Symposium on Nanoscale Architectures","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124972785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Jabeur, D. Navarro, I. O’Connor, P. Gaillardon, M. B. Jamaa, F. Clermidy
{"title":"Reducing transistor count in clocked standard cells with ambipolar double-gate FETs","authors":"K. Jabeur, D. Navarro, I. O’Connor, P. Gaillardon, M. B. Jamaa, F. Clermidy","doi":"10.1109/NANOARCH.2010.5510928","DOIUrl":"https://doi.org/10.1109/NANOARCH.2010.5510928","url":null,"abstract":"This paper presents a set of circuit design approaches to achieve clocked standard logic cell functions with ambipolar double-gate devices such as the Double Gate Carbon Nanotube FET (DG-CNTFET). The cells presented in this work use the infield controllability of the device to reduce transistor count over conventional standard cells by only requiring n+1 transistors (where n is the fan-in), and achieve improved time delay by a factor of 2 for comparable power consumption.","PeriodicalId":306717,"journal":{"name":"2010 IEEE/ACM International Symposium on Nanoscale Architectures","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123685670","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Ashraf, Rajeev K. Nain, M. Chrzanowska-Jeske, S. Narendra
{"title":"Design methodology for Carbon Nanotube based circuits in the presence of metallic tubes","authors":"R. Ashraf, Rajeev K. Nain, M. Chrzanowska-Jeske, S. Narendra","doi":"10.1109/NANOARCH.2010.5510924","DOIUrl":"https://doi.org/10.1109/NANOARCH.2010.5510924","url":null,"abstract":"Carbon Nanotube Field Effect Transistor (CNFET) has a potential to become successor of Si-CMOS devices because of its excellent electronic properties. One of the most important challenges for the CNT-based technology is the undesired presence of metallic tubes which adversely impacts the performance, power and yield of CNT based circuits. Different tube configurations in CNFET transistor like Parallel Tube (PT) and Transistor Stacking (TrS) can be used to trade-off yield for performance. The Monte Carlo (MC) simulations of a full adder show that TrS implementation along with parallelism in the critical path can result in the same performance as the PT implementation (demonstrated significant improvements over CMOS) but with 4X increased functional yield and 6X reduced static power. Furthermore, we proposed architecture based on regular logic bricks that are designed using different tube configurations. Monte Carlo simulations show that for 10% metallic tubes logic bricks implemented with hybrid configurations of CNFETs can help to reduce the performance impact by 2X as compared to homogeneous bricks implemented with only TrS CNFETs. In comparison to homogeneous bricks realized with only PT CNFETs, the static power can be reduced by 2X and yield can be increased from 22% to 54%.","PeriodicalId":306717,"journal":{"name":"2010 IEEE/ACM International Symposium on Nanoscale Architectures","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122305614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Ottavi, S. Pontarelli, E. Debenedictis, A. Salsano, P. Kogge, F. Lombardi
{"title":"High throughput and low power dissipation in QCA pipelines using Bennett clocking","authors":"M. Ottavi, S. Pontarelli, E. Debenedictis, A. Salsano, P. Kogge, F. Lombardi","doi":"10.1109/NANOARCH.2010.5510931","DOIUrl":"https://doi.org/10.1109/NANOARCH.2010.5510931","url":null,"abstract":"This paper presents a detailed analysis of an architectural pipeline scheme for Quantum-dot Cellular Automata (QCA); this scheme utilizes the so-called Bennett clocking for attaining high throughput and low power dissipation. In this arrangement, computation stages (utilizing Bennett clocking) and memory stages combine the low power dissipation of reversible computing with the high throughput feature of a pipeline. An example of the application of the proposed scheme to an XOR tree circuit (parity generator) is presented; a detailed analysis of throughput and power consumption is provided to show the effectiveness of the proposed architectural solution for QCA.","PeriodicalId":306717,"journal":{"name":"2010 IEEE/ACM International Symposium on Nanoscale Architectures","volume":"PAMI-5 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121007409","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Stochastic nanoscale addressing for logic","authors":"Eric Rachlin, J. Savage","doi":"10.1109/NANOARCH.2010.5510926","DOIUrl":"https://doi.org/10.1109/NANOARCH.2010.5510926","url":null,"abstract":"In this paper we explore the area overhead associated with the stochastic assembly of nanoscale logic. In nanoscale architectures, stochastically assembled nanowire decoders have been proposed as a way of addressing many individual nanowires using as few photolithographically produced mesoscale wires as possible. Previous work has bounded the area of stochastically assembled nanowire decoders for controlling nanowire crossbar-based memories. We extend this analysis to nanowire crossbar-based logic and bound the area required to supply inputs to a nanoscale circuit via mesoscale wires. We also relate our analysis to the area required for stochastically assembled signal-restoration layers within nanowire crossbar-based logic.","PeriodicalId":306717,"journal":{"name":"2010 IEEE/ACM International Symposium on Nanoscale Architectures","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121985312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Design and comparison of NML systolic architectures","authors":"M. Crocker, X. Hu, M. Niemier","doi":"10.1109/NANOARCH.2010.5510929","DOIUrl":"https://doi.org/10.1109/NANOARCH.2010.5510929","url":null,"abstract":"Nanomagnet Logic (NML) is a device architecture that utilizes the magnetization of nano-scale magnets to perform logical operations. NML has been experimentally demonstrated and operates at room temperature. Because the nanomagnets are non-volatile, as data flows through a circuit, it is inherently pipelined. This feature makes NML an excellent fit for systolic architectures, which could enable low-power, high-throughput systems that can address a variety of application-level tasks. When considering possible NML systolic systems, the underlying systolic clocking scheme affects both architectural design and performance. In this paper we explore these issues in the context of two NML designs for convolution. One design is based on a 3-phase clocking scheme and uni-directional dataflow, and another is based on a 2-phase clocking scheme and bi-directional dataflow. We compare the two NML systolic designs in terms of area, delay, and energy. We also compare the NML and CMOS implementations of the design in terms of energy and delay. Results are supported by physical level simulation.","PeriodicalId":306717,"journal":{"name":"2010 IEEE/ACM International Symposium on Nanoscale Architectures","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133242211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"NanoV: Nanowire-based VLSI design","authors":"M. O. Simsir, N. Jha","doi":"10.1109/NANOARCH.2010.5510925","DOIUrl":"https://doi.org/10.1109/NANOARCH.2010.5510925","url":null,"abstract":"In the coming decade, CMOS technology is expected to approach its scaling limitations. Among the proposed nanotechnologies, nanowires have the edge in the size of circuits and logic arrays that have already been fabricated and experimentally evaluated. For this technology, logic-level design methodologies are being developed. The time has now come to develop automated tools for implementing VLSI designs using nanowires. In this paper, we discuss a design automation tool, called NanoV, to fulfill this need for nanowires. It is a complete logic-to-layout tool with built-in defect-aware steps since the defect levels in nanotechnologies are expected to be relatively high (between 1 to 10%). We are unaware of any other such comprehensive VLSI design tool for nanowires. We report area/delay/power results for various benchmarks implemented using our tool. We intend to make the tool available on the web.","PeriodicalId":306717,"journal":{"name":"2010 IEEE/ACM International Symposium on Nanoscale Architectures","volume":"111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127120245","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Regular fabric design with ambipolar CNTFETs for FPGA and structured ASIC applications","authors":"M. D. Marchi","doi":"10.1109/NANOARCH.2010.5510923","DOIUrl":"https://doi.org/10.1109/NANOARCH.2010.5510923","url":null,"abstract":"In this paper, we propose for the first time the application of ambipolar CNTFETs with in-field controllable polarities to design regular fabrics with static logic. We exploit the high expressive power provided by complementary static logic built with ambipolar CNTFETs to design compact and efficient configurable gates. After evaluating a polarity-aware logic design for the configurable gates, we selected a number of gates with an And-Or-Inverter structure and produced a first comparison with existent medium-grained logic blocks, like the Actel ACT1 and 4-input LUTs [1]. Preliminary evaluation of our gates indicates improvements of around 47% over the ACT1 and of about 18× with respect to 4-input LUTs in terms of area×normalized delay.","PeriodicalId":306717,"journal":{"name":"2010 IEEE/ACM International Symposium on Nanoscale Architectures","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127387215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}