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Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference最新文献

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TiN-encapsulized copper interconnects for ULSI applications 用于ULSI应用的锡封装铜互连
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference Pub Date : 1989-06-12 DOI: 10.1109/VMIC.1989.78025
K. Hoshino, H. Yagi, H. Tsuchikawa
{"title":"TiN-encapsulized copper interconnects for ULSI applications","authors":"K. Hoshino, H. Yagi, H. Tsuchikawa","doi":"10.1109/VMIC.1989.78025","DOIUrl":"https://doi.org/10.1109/VMIC.1989.78025","url":null,"abstract":"TiN-encapsulized Cu interconnects were developed for ultra-large-scale integration (ULSI) by nitriding the Cu-10%Ti alloy. The 500-nm-thick Cu-Ti alloy layer was separated into an upper TiN layer and a lower Cu layer after nitriding at 800 degrees C. The interconnects had a higher oxidation resistance than Cu interconnects, and their resistivity was as low. The electromigration lifetime of the new interconnects was two orders of magnitude larger than that of pure Cu interconnects.<<ETX>>","PeriodicalId":302853,"journal":{"name":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129908772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Superior metal step coverage and dielectric quality in a simple two-level metal 1.0 mu m CMOS technology 优越的金属台阶覆盖和介电质量在一个简单的两级金属1.0 μ m CMOS技术
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference Pub Date : 1989-06-12 DOI: 10.1109/VMIC.1989.78006
C. Fieber, E. Martin, H. Chew, G. Hills, N. Selamoglu, S. Lytle
{"title":"Superior metal step coverage and dielectric quality in a simple two-level metal 1.0 mu m CMOS technology","authors":"C. Fieber, E. Martin, H. Chew, G. Hills, N. Selamoglu, S. Lytle","doi":"10.1109/VMIC.1989.78006","DOIUrl":"https://doi.org/10.1109/VMIC.1989.78006","url":null,"abstract":"A two-level metal process for a fourth-generation 1.0- mu m CMOS technology has been developed which yields superior aluminum step coverages and high-quality dielectrics without introducing complicated processing sequences. The process is cost-effective since it includes traditional materials and high throughput operations and is readily extendable to three levels of metal. The process incorporates a highly smoothed BPSG for dielectric I and resist-etchback planarization of plasma-enhanced TEOS for dielectric II. Also featured are a tapered aluminum I profile and modified contact window and via etch profiles. Defect density and electromigration data predict excellent yield and reliability for this process.<<ETX>>","PeriodicalId":302853,"journal":{"name":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130262298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fabrication of CMOS circuits using non-etchback SOG processing for dielectric planarization 采用无腐蚀SOG工艺制备介质平面化CMOS电路
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference Pub Date : 1989-06-12 DOI: 10.1109/VMIC.1989.77997
H.W.M. Chung, S.K. Gupta, T. Baldwin
{"title":"Fabrication of CMOS circuits using non-etchback SOG processing for dielectric planarization","authors":"H.W.M. Chung, S.K. Gupta, T. Baldwin","doi":"10.1109/VMIC.1989.77997","DOIUrl":"https://doi.org/10.1109/VMIC.1989.77997","url":null,"abstract":"Planarization of interlevel dielectrics by nonetchback spin-on glass (SOG) techniques requires the use of a dense, inorganic SOG with good dielectric characteristics. The authors have evaluated two recently developed phosphosilicate-type SOG materials, Accuglass P-114 and P-114A, for use in nonetchback processing. Both materials were successfully applied to the fabrication of 1.2- mu m CMOS ASIC circuits. Extensive reliability tests, including thermal stressing of via chains, DHTL, PPOT, and THBS were performed at the wafer level and on packaged parts fabricated with P-114. The very favorable results confirm the viability of the nonetchback process used.<<ETX>>","PeriodicalId":302853,"journal":{"name":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131081495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Increase in EM resistance by planarizing dielectric film over Al wirings 通过在铝电线上平面化介电膜来增加电磁电阻
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference Pub Date : 1989-06-12 DOI: 10.1109/VMIC.1989.78019
A. Isobe, Y. Numazawa, M. Sakamoto
{"title":"Increase in EM resistance by planarizing dielectric film over Al wirings","authors":"A. Isobe, Y. Numazawa, M. Sakamoto","doi":"10.1109/VMIC.1989.78019","DOIUrl":"https://doi.org/10.1109/VMIC.1989.78019","url":null,"abstract":"The relation between EM (electromigration) characteristics and interlayer dielectric film structure is described. It was found that a well-planarized interlayer significantly increases EM resistance for underlying Al wirings. This EM improvement is attributed to reinforcement and crack suppression at interlayer sidewalls. A constant atom flux model is proposed that explains the mechanism for this phenomenon.<<ETX>>","PeriodicalId":302853,"journal":{"name":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133567356","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Metalization process parasitic reduction by structure modeling 基于结构建模的金属化过程寄生还原
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference Pub Date : 1989-06-12 DOI: 10.1109/VMIC.1989.78044
P.A. Poenisch
{"title":"Metalization process parasitic reduction by structure modeling","authors":"P.A. Poenisch","doi":"10.1109/VMIC.1989.78044","DOIUrl":"https://doi.org/10.1109/VMIC.1989.78044","url":null,"abstract":"Summary form only given. A description is given of an effort to determine the effect of modifying metal process parameters, notably metal and dielectric thickness, to decrease propagation delay in the long metal lines found on many gate array and microprocessor devices. The method used involved the use of electrical, thermal, and structural simulation program ANSYS to calculate two-dimensional capacitance values for metal lines with differing thicknesses and widths and varying dielectric thicknesses. Results from the ANSYS models are then used to find empirical second-order equations to describe the relationship between each of the process variables and the metal line capacitance. These equations were then placed into the spread sheet program EXCEL, and different values of the process parameters were used to try to minimize the RC product of the metal line.<<ETX>>","PeriodicalId":302853,"journal":{"name":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128056561","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Stress migration resistance of Al-Si-Pd alloy interconnects Al-Si-Pd合金互连的抗应力迁移性能
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference Pub Date : 1989-06-12 DOI: 10.1109/VMIC.1989.78003
Y. Koubuchi, J. Onuki, M. Suwa, S. Fukada
{"title":"Stress migration resistance of Al-Si-Pd alloy interconnects","authors":"Y. Koubuchi, J. Onuki, M. Suwa, S. Fukada","doi":"10.1109/VMIC.1989.78003","DOIUrl":"https://doi.org/10.1109/VMIC.1989.78003","url":null,"abstract":"Al-Si-Pd alloy with high stress-induced migration resistance was developed for VLSI interconnects. Pd was selected to depress grain boundary diffusion of Al alloys. The microstructures of Al matrices alloyed with Pd and Cu were investigated. The morphologies of precipitation in Al alloy conductors were examined after high-temperature heat treatment. The stress-induced migration resistances of the Al-Si-Pd and Al-Si-Cu were found to be influenced by the microstructures of Al matrices.<<ETX>>","PeriodicalId":302853,"journal":{"name":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122893277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Properties of LPCVD titanium nitride for ULSI metallization ULSI金属化用LPCVD氮化钛的性能
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference Pub Date : 1989-06-12 DOI: 10.1109/VMIC.1989.78051
A. Sherman
{"title":"Properties of LPCVD titanium nitride for ULSI metallization","authors":"A. Sherman","doi":"10.1109/VMIC.1989.78051","DOIUrl":"https://doi.org/10.1109/VMIC.1989.78051","url":null,"abstract":"Summary form only given. A report is presented on a low-temperature CVD process (TiCl/sub 4/+NH/sub 3/) for deposition of conformal films, as an alternative to sputtering. Studies have been carried out at pressures of 100-300 mtorr and temperatures of 450-700 degrees C on silicon wafers with a NH/sub 3//TiCl/sub 4/ ratio of 20:1. Deposition rates as high as 1000 AA/min have been observed. Film resistivities as low as 80- Omega -cm have been seen for the thinnest films ( approximately 500 AA). The resistivity increases as the films grow thicker, apparently due to a decrease in their density. The films contain small amounts of chlorine (<4%), oxygen (<6%), and hydrogen (<11%), and have Ti/N ratios close to one. They are crystalline with columnar crystals and are adherent. Contact resistance measurements on p/sup +/ contacts annealed at 500 degrees C gave values of 2-3*10/sup -6/ Omega -cm/sup 2/. Multicontact diodes, under the same conditions, showed less than 1- mu A leakage at 10-V reverse bias.<<ETX>>","PeriodicalId":302853,"journal":{"name":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129645785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Selective CVD tungsten contact plug technology with plasma pre-treatment 等离子体预处理的选择性CVD钨接触塞技术
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference Pub Date : 1989-06-12 DOI: 10.1109/VMIC.1989.78018
O. Yamazaki, S. Shimizu, H. Sakamoto, K. Mitsuhashi, K. Ohtake, M. Koba
{"title":"Selective CVD tungsten contact plug technology with plasma pre-treatment","authors":"O. Yamazaki, S. Shimizu, H. Sakamoto, K. Mitsuhashi, K. Ohtake, M. Koba","doi":"10.1109/VMIC.1989.78018","DOIUrl":"https://doi.org/10.1109/VMIC.1989.78018","url":null,"abstract":"Low-resistance contact plug technology using selective CVD of W by the SiH/sub 4/ reduction of WF/sub 6/ with SF/sub 6/ pretreatment was developed. This technology solved problems such as encroachment, wormholes, Si consumption, and poor adhesion encountered in only the H/sub 2/-reduction system or only the SiH/sub 4/-reduction system without pretreatment. The contact resistance in this system is lower than that in conventional metallization with Al-Si/Si contacts. It is predicted that this technology will become important for improving the reliability of the interconnection for submicron VLSI.<<ETX>>","PeriodicalId":302853,"journal":{"name":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128481327","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Copper as the future interconnection material 铜作为未来的互连材料
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference Pub Date : 1989-06-12 DOI: 10.1109/VMIC.1989.78029
P. Pai, C. Ting
{"title":"Copper as the future interconnection material","authors":"P. Pai, C. Ting","doi":"10.1109/VMIC.1989.78029","DOIUrl":"https://doi.org/10.1109/VMIC.1989.78029","url":null,"abstract":"Cu film was evaluated as a candidate for future interconnection. As the device dimensions are scaled below 0.5 mu m, the RC time constant of interconnection becomes a major part of the total delay. By reducing the resistivity of interconnect, the operating speed can be increased by more than 20% without any change in design rule. An electroless deposition process is proposed to solve the Cu patterning difficulty. Patterns of 2.0- mu m pitch were achieved with this process. Copper contamination was addressed, and dielectric films such as silicon oxynitride and silicon nitride were shown to be effective in stopping Cu diffusion. The authors also investigated Cu corrosion. By coating a thin Ni film on Cu they reduced the corrosion from 0.2 mu m/h to less than 0.05 mu m/h at 100 degrees C in 1-mol/1 KCl solution.<<ETX>>","PeriodicalId":302853,"journal":{"name":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114369684","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 32
Comparison of cobalt and titanium silicides for SALICIDE process and shallow junction formation 钴和钛硅化物在盐化工艺和浅结形成中的比较
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference Pub Date : 1989-06-12 DOI: 10.1109/VMIC.1989.78027
C. Wei, G. Raghavan, M. Dass, M. Frost, T. Brat, D. Fraser
{"title":"Comparison of cobalt and titanium silicides for SALICIDE process and shallow junction formation","authors":"C. Wei, G. Raghavan, M. Dass, M. Frost, T. Brat, D. Fraser","doi":"10.1109/VMIC.1989.78027","DOIUrl":"https://doi.org/10.1109/VMIC.1989.78027","url":null,"abstract":"A comparison of TiSi/sub 2/ and CoSi/sub 2/ for the SALICIDE (self-aligned silicide) process is presented. Both TiSi/sub 2/ and CoSi/sub 2/ are formed by RTA in nitrogen. The comparison is based on the formation kinetics, film properties, process compatibilities, and electrical properties. The results are summarized in table form. Co silicide is found to be a better candidate for use in SALICIDE process for submicron devices because it has a less severe lateral gate-S/D encroachment problem, less sensitivity to oxygen, higher resistivity to dry/wet etch, less film stress, better sheet resistance control, less junction leakage, the capability to form low-resistance polycide, and shallow junctions. However, substrate cleaning must ensure no SiO/sub 2/ on Si surfaces that are to be converted to CoSi/sub 2/.<<ETX>>","PeriodicalId":302853,"journal":{"name":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129844820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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