16th Asian Test Symposium (ATS 2007)最新文献_第6页

Low Power Reduced Pin Count Test Methodology 低功耗减少引脚数测试方法

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI: 10.1109/ATS.2007.81

K. Chakravadhanula, N. Parimi, Brian Foutz, Bing-Hung Li, V. Chickermane

引用次数: 0

Fault Dictionary Based Scan Chain Failure Diagnosis 基于故障字典的扫描链故障诊断

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI: 10.1109/ATS.2007.43

Ruifeng Guo, Yu Huang, Wu-Tung Cheng

引用次数: 21

Fast and Low Cost HW Bit Map for Memory Test Based on Residue Polynomial System over GF(2) 基于GF(2)残差多项式系统的快速低成本HW位映射内存测试

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI: 10.1109/ATS.2007.48

J. Rivoir

引用次数: 0

Improving Performance of Effect-Cause Diagnosis with Minimal Memory Overhead 以最小的内存开销提高因果诊断的性能

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI: 10.1109/ATS.2007.47

Huaxing Tang, Chen Liu, Wu-Tung Cheng, Sudahkar M. Reddy, Wei Zou

引用次数: 10

Optimized Assignment Coverage Computation in Formal Verification of Digital Systems 数字系统形式化验证中的优化分配覆盖计算

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI: 10.1109/ATS.2007.40

Majid Nabi, H. Shojaei, S. Mohammadi, Z. Navabi

引用次数: 2

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost 扫描测试，完全覆盖路径延迟故障，减少测试数据量，测试应用时间和硬件成本

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI: 10.1109/ATS.2007.20

D. Xiang, K. Chakrabarty, D. Hu, H. Fujiwara

引用次数: 1

Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC 片上/片外总线桥的设计复用，实现基于amba的SoC的高效测试访问

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI: 10.1109/ATS.2007.13

Jaehoon Song, Juhee Han, Dooyoung Kim, Hyunbean Yi, Sungju Park

引用次数: 1

Effect of IR-Drop on Path Delay Testing Using Statistical Analysis ir下降对路径延迟测试的影响

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI: 10.1109/ATS.2007.89

Chunsheng Liu, Yang Wu, Yu Huang

引用次数: 15

Invited Talk 2: EDA to the Rescue of the Silicon Roadmap 特邀演讲2:EDA拯救硅路线图

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI: 10.1109/ATS.2007.108

T. Williams

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引用次数: 0

Bluetooth Hopping BER Testing Methodologies on a Production Test Platform 生产测试平台上的蓝牙跳变误码率测试方法

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI: 10.1109/ATS.2007.44

David Bement, David Karr

引用次数: 0