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2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)最新文献

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PCB Laminate Material Out-of-plane Dielectric Constant Extraction Methodology PCB层压材料面外介电常数提取方法
2022 IEEE 26th Workshop on Signal and Power Integrity (SPI) Pub Date : 2022-05-22 DOI: 10.1109/SPI54345.2022.9874947
Huiyin Zhou, Wei Zhang
{"title":"PCB Laminate Material Out-of-plane Dielectric Constant Extraction Methodology","authors":"Huiyin Zhou, Wei Zhang","doi":"10.1109/SPI54345.2022.9874947","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874947","url":null,"abstract":"PCB laminate material with dense glass style has a layered structure of resin-fiberglass-resin. Out-of-plane dielectric constant (Dk) is required to achieve accurate transmission line modeling, but laminate manufacturers usually only provide in-plane Dk. This paper introduces a 3D electromagnetic analysis based methodology to extract out-of-plane Dk out from in-plane Dk specification. The correctness of the extracted out-of-plane Dk is confirmed by TDR correlation between measurement and simulation.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"23 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121011677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SPI 2022 Cover Page SPI 2022封面
2022 IEEE 26th Workshop on Signal and Power Integrity (SPI) Pub Date : 2022-05-22 DOI: 10.1109/spi54345.2022.9874938
{"title":"SPI 2022 Cover Page","authors":"","doi":"10.1109/spi54345.2022.9874938","DOIUrl":"https://doi.org/10.1109/spi54345.2022.9874938","url":null,"abstract":"","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122164722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Application of Neural Network Based Cascade-able Transceiver Model in Serial Link Simulation 基于神经网络的可级联收发器模型在串行链路仿真中的应用
2022 IEEE 26th Workshop on Signal and Power Integrity (SPI) Pub Date : 2022-05-22 DOI: 10.1109/SPI54345.2022.9874932
Yixuan Zhao, Thong Nguyen, J. Schutt-Ainé
{"title":"Application of Neural Network Based Cascade-able Transceiver Model in Serial Link Simulation","authors":"Yixuan Zhao, Thong Nguyen, J. Schutt-Ainé","doi":"10.1109/SPI54345.2022.9874932","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874932","url":null,"abstract":"This paper describes the work-flow of developing black-box transceiver models for channel cascading using feedforward neural network (FNN). Compared to transistor level models, the FNN model is independent of the circuit simulator, whereas the former suffers from slow Newton-Raphson iterations. Furthermore, the generation of FNN model requires no substantial knowledge in circuit design, making it more feasible to the end-users who work in another field.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128533734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Estimation of PSIJ in CMOS inverters via Knowledge Based Artificial Neural Networks 基于知识的人工神经网络对CMOS逆变器PSIJ的估计
2022 IEEE 26th Workshop on Signal and Power Integrity (SPI) Pub Date : 2022-05-22 DOI: 10.1109/SPI54345.2022.9874942
Ahsan Javaid, R. Achar, Jai Narayan Tripathi
{"title":"Estimation of PSIJ in CMOS inverters via Knowledge Based Artificial Neural Networks","authors":"Ahsan Javaid, R. Achar, Jai Narayan Tripathi","doi":"10.1109/SPI54345.2022.9874942","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874942","url":null,"abstract":"In this paper, a knowledge based artificial neural network is developed for predicting jitter for a CMOS inverter in the presence of power supply noise (PSN). The proposed ANN provides for efficient training in an hybrid approach using input data extracted from both analytical closed-form expressions as well as a circuit simulator. The proposed ANN demonstrates a reasonably accurate prediction of PSIJ with results that closely match with that from directly using a circuit simulator (ADS) for a case study with 50nm CMOS technology.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114153767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Machine Learning based Metaheuristic Technique for Decoupling Capacitor Optimization 基于机器学习的电容解耦优化元启发式技术
2022 IEEE 26th Workshop on Signal and Power Integrity (SPI) Pub Date : 2022-05-22 DOI: 10.1109/SPI54345.2022.9874924
Heman Vaghasiya, Akash Jain, J. N. Tripathi
{"title":"A Machine Learning based Metaheuristic Technique for Decoupling Capacitor Optimization","authors":"Heman Vaghasiya, Akash Jain, J. N. Tripathi","doi":"10.1109/SPI54345.2022.9874924","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874924","url":null,"abstract":"Decoupling capacitors are commonly used in the design and optimization of Power Delivery Networks (PDNs) in high-speed very large scale integration systems (VLSI) to minimize the variations in the power supply and to maintain a low PDN ratio. In this paper, an efficient and fast Machine Learning (ML) based surrogate-assisted metaheuristic approach is proposed for the decoupling capacitor optimization problem to reduce the cumulative impedance of the PDN below the target impedance. The performance comparison of the proposed approach with state-of-the-art approaches is also presented.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"76 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121232456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
EMC Issues and Signal Integrity Analysis of Neutron Diagnostics for Nuclear Fusion Machines 核聚变机中子诊断的电磁兼容问题和信号完整性分析
2022 IEEE 26th Workshop on Signal and Power Integrity (SPI) Pub Date : 2022-05-22 DOI: 10.1109/SPI54345.2022.9874927
A. Maffucci, D. Capriglione, F. Pompili, B. Esposito, D. Marocco, M. Passeri, M. Riva
{"title":"EMC Issues and Signal Integrity Analysis of Neutron Diagnostics for Nuclear Fusion Machines","authors":"A. Maffucci, D. Capriglione, F. Pompili, B. Esposito, D. Marocco, M. Passeri, M. Riva","doi":"10.1109/SPI54345.2022.9874927","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874927","url":null,"abstract":"This paper studies the Electromagnetic Compatibility (EMC) compliance of a diagnostic system intended for the nuclear fusion reactor ITER. Specifically, a neutron detection chain is analyzed, where the electrical signals emitted by a diamond matrix hit by neutrons. A non-conventional design of such an electronic chain is requested, to meet the specific requirements within the particular constraints imposed for such an application. This results in specific EMC issue related to the effect of common mode noise on the signal integrity. The EMC analysis is carried out on a mock-up system, and solutions to face the above issues are designed, implemented and experimentally validated.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127787466","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Low-Frequency Modal Extrapolation and Regularization for Full-Bandwidth Macromodeling of Electromagnetic Structures 电磁结构全带宽宏观建模的低频模态外推与正则化
2022 IEEE 26th Workshop on Signal and Power Integrity (SPI) Pub Date : 2022-05-22 DOI: 10.1109/SPI54345.2022.9874931
M. De Stefano, S. Grivet-Talocia, T. Wendt, C. Yang, C. Schuster
{"title":"Low-Frequency Modal Extrapolation and Regularization for Full-Bandwidth Macromodeling of Electromagnetic Structures","authors":"M. De Stefano, S. Grivet-Talocia, T. Wendt, C. Yang, C. Schuster","doi":"10.1109/SPI54345.2022.9874931","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874931","url":null,"abstract":"This paper provides a novel strategy for the extrapolation and regularization of low frequency data of low-loss or lossless structures, based on asymptotic modal trajectories. The proposed data-driven strategy is intended as a fundamental pre-processing step to obtain a full-bandwidth reliable macromodel to be used in transient simulations, providing full control of the low-frequency and DC behavior of the system.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115772071","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Accurate Characterization of Radiation from Interconnects on Interposer at mmWave Frequencies 毫米波频率下介面互连辐射的精确表征
2022 IEEE 26th Workshop on Signal and Power Integrity (SPI) Pub Date : 2022-05-22 DOI: 10.1109/SPI54345.2022.9874939
Martijn Huynen, Dries Bosman, A. Moerman, D. Ginste
{"title":"Accurate Characterization of Radiation from Interconnects on Interposer at mmWave Frequencies","authors":"Martijn Huynen, Dries Bosman, A. Moerman, D. Ginste","doi":"10.1109/SPI54345.2022.9874939","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874939","url":null,"abstract":"An electromagnetic interference (EMI) assessment of mmWave interposers becomes increasingly important as the need for heterogeneous systems increases. However, the small size and complexity of these platforms make it more difficult to accurately measure them and, thus, a dedicated set-up to isolate the interposer’s emission is required. In this contribution, we first show experimentally that at mmWave frequencies surface waves originating on the interposer test vehicles may interact with the larger measurement board and severely impact the radiation pattern and maximum electric field strength. Second, a simulation study into the exact origins confirms these surface waves indeed to be at the heart of this issue and calls for appropriate measures in interposer design to prevent any EMI complications when integrating this component in a larger system.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128258313","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Active Expansion Sampling of Magnetic Near-Fields in Unbounded Regions 无界区域磁场主动展开采样
2022 IEEE 26th Workshop on Signal and Power Integrity (SPI) Pub Date : 2022-05-22 DOI: 10.1109/SPI54345.2022.9874944
N. Seliger, Georg Faltlhauser
{"title":"Active Expansion Sampling of Magnetic Near-Fields in Unbounded Regions","authors":"N. Seliger, Georg Faltlhauser","doi":"10.1109/SPI54345.2022.9874944","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874944","url":null,"abstract":"We present a fast and accurate measurement technique for magnetic near-fields by employing an adaptive sampling method with unbounded input space. The proposed machine learning algorithm is tested against uniform sampling on a printed circuit board test structure and a buck converter. We demonstrate allocation of multiple, separated regions with predefined lateral field limits at MHz frequencies. Compared to uniform sampling, active expansion sampling identifies contours of given field limits in less than 3% of the reference measurement time.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"210 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132074521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Worst-Case Optimization of a Digital Link for Wearable Electronics in a Stochastic Framework 随机框架下可穿戴电子设备数字链路的最坏情况优化
2022 IEEE 26th Workshop on Signal and Power Integrity (SPI) Pub Date : 2022-05-22 DOI: 10.1109/SPI54345.2022.9874928
M. Telescu, R. Trinchero, I. Stievano, N. Tanguy
{"title":"Worst-Case Optimization of a Digital Link for Wearable Electronics in a Stochastic Framework","authors":"M. Telescu, R. Trinchero, I. Stievano, N. Tanguy","doi":"10.1109/SPI54345.2022.9874928","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874928","url":null,"abstract":"This paper demonstrates an optimization strategy for systems affected by uncertainties in the case of a textile interconnect line. Rather than simply conducting stochastic analysis at the end of the design process, tolerances are accounted for from the early stages of the flow. An unsupervised approach, used to describe the stochastic behavior of the line, is integrated within a heuristic optimization algorithm with the aim of selecting the optimal parameters of a passive equalizer.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131808543","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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