{"title":"Managing Heat with Diamond: the Example of Diamond/GaN HEMTs","authors":"J. Mendes, M. Liehr","doi":"10.1109/SPI54345.2022.9874940","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874940","url":null,"abstract":"Diamond is the ultimate thermal management material. Its high breakdown electric field and thermal conductivity, together with the availability of artificial diamond plates and the possibility of growing this material on non-diamond substrates have fueled research in applications where thermal management is of utmost importance. This is the case of gallium nitride (GaN) high electron mobility transistors (HEMTs). Power amplifiers based on GaN-ondiamond wafers are already commercially available, attesting the potential and feasibility of integrating diamond and power components. This work describes the different approaches that can be used to integrate diamond and GaN in hybrid devices with increased power capability.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129820613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hanzhi Ma, Erping Li, Yuechen Wang, Bobi Shi, J. Schutt-Ainé, A. Cangellaris, Xu Chen
{"title":"Channel Inverse Design Using Tandem Neural Network","authors":"Hanzhi Ma, Erping Li, Yuechen Wang, Bobi Shi, J. Schutt-Ainé, A. Cangellaris, Xu Chen","doi":"10.1109/SPI54345.2022.9874935","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874935","url":null,"abstract":"A tandem neural network (NN) with R2 score-based loss function is proposed in this paper for channel inverse design. Tandem NN consists of an inverse neural network from target performance to design parameters and a pre-trained forward neural network from design parameters to design targets. The training of the actual INN uses the fixed pre-trained forward model to evaluate the inverse design output. A channel inverse design example for target impedance and attenuation at multiple frequency points is applied in this paper to evaluate the performance of tandem NN. Numerical results show that tandem NN achieves a good design result compared with target performance and regular NN.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125692047","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Choi, Dongchul Kim, Jongjae Ryu, Chanyoung Jeong, KyeongJoon Ko, Youngwoo Jo, Wonsik Yu, Wooseok Kim, Minseok Kang, S. Moon
{"title":"Random Jitter Analysis and Measurement for Reference Clock Network in PCIe Gen3","authors":"J. Choi, Dongchul Kim, Jongjae Ryu, Chanyoung Jeong, KyeongJoon Ko, Youngwoo Jo, Wonsik Yu, Wooseok Kim, Minseok Kang, S. Moon","doi":"10.1109/SPI54345.2022.9874930","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874930","url":null,"abstract":"The Random Jitter (RJ) of the reference clock network to PCI express (PCIe) Gen3 was analyzed and compared with the measurement. The RJ was calculated using the phase noise results, which is analyzed from the on-chip clock network including Crystal (Xtal), IO pad, PCIe PHY to the SMA connectors of a test board, and the transfer function of PCIe Gen3 IP. The RJ was measured through the compliance test using an oscilloscope. The calculated RJ values show excellent agreement with the measured RJ values from the compliance test with -2.5% and 1.9% errors for two sample chips, respectively. As a result, if the proposed RJ analysis method is used, the RJ specification can be verified at the design stage through RJ analysis of the PCIe reference clock and a design can be made that minimizes system cost.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117018313","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Comparison of coplanar waveguide models at millimetre wave frequencies","authors":"G. Phung, U. Arz, W. Heinrich","doi":"10.1109/SPI54345.2022.9874929","DOIUrl":"https://doi.org/10.1109/SPI54345.2022.9874929","url":null,"abstract":"This paper investigates an improved empirical model predicting the propagation characteristics of coplanar waveguides (CPW) at G band based on a conventional analytical CPW model. A comparison with another quasi-analytic CPW model and fullwave em simulations is presented. The comparison results demonstrate that the improved CPW model shows excellent agreement with measurements on different substrate materials up to 220 GHz. This means that, for the first time, a comprehensive and efficient CPW description at higher frequency ranges up to G band is available. This improved CPW model can be applied and used during the design cycle of hybrid integrated circuits (ICs), monolithic microwave integrated circuits (MMICs) and printed circuits board (PCBs). Moreover, the enhanced accuracy of the improved CPW model can help to reduce uncertainties in on-wafer CPW-based measurements.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122285072","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}