{"title":"Active Expansion Sampling of Magnetic Near-Fields in Unbounded Regions","authors":"N. Seliger, Georg Faltlhauser","doi":"10.1109/SPI54345.2022.9874944","DOIUrl":null,"url":null,"abstract":"We present a fast and accurate measurement technique for magnetic near-fields by employing an adaptive sampling method with unbounded input space. The proposed machine learning algorithm is tested against uniform sampling on a printed circuit board test structure and a buck converter. We demonstrate allocation of multiple, separated regions with predefined lateral field limits at MHz frequencies. Compared to uniform sampling, active expansion sampling identifies contours of given field limits in less than 3% of the reference measurement time.","PeriodicalId":285253,"journal":{"name":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","volume":"210 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 26th Workshop on Signal and Power Integrity (SPI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPI54345.2022.9874944","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We present a fast and accurate measurement technique for magnetic near-fields by employing an adaptive sampling method with unbounded input space. The proposed machine learning algorithm is tested against uniform sampling on a printed circuit board test structure and a buck converter. We demonstrate allocation of multiple, separated regions with predefined lateral field limits at MHz frequencies. Compared to uniform sampling, active expansion sampling identifies contours of given field limits in less than 3% of the reference measurement time.