Proceedings of 1994 IEEE International Reliability Physics Symposium最新文献_第7页

Voltage overshoots and n-MOSFET hot carrier robustness in VLSI circuits VLSI电路中的电压超调与n-MOSFET热载流子稳健性

Proceedings of 1994 IEEE International Reliability Physics Symposium Pub Date : 1994-04-11 DOI: 10.1109/RELPHY.1994.307855

L.R. Mistry, R. Hokinson, B. Gieseke, T. F. Fox, R. Preston, B. Doyle

引用次数: 14

Accurate simulation of EPROM hot-carrier induced degradation using physics based interface and oxide charge generation models 利用基于物理的界面和氧化物电荷生成模型精确模拟EPROM热载子诱导降解

Proceedings of 1994 IEEE International Reliability Physics Symposium Pub Date : 1994-04-11 DOI: 10.1109/RELPHY.1994.307843

J. Peng, Qi Lin, P. Fang, M. Kwan, S. Longcor, J. Lien

引用次数: 6

Novel methods for the reliability testing of ferroelectric DRAM storage capacitors 铁电DRAM存储电容器可靠性测试的新方法

Proceedings of 1994 IEEE International Reliability Physics Symposium Pub Date : 1994-04-11 DOI: 10.1109/RELPHY.1994.307831

C. Sudhama, R. Khamankaar, Jiyoung Kim, B. Jiang, J. Lee, P. Maniar, Robert E. Jones, C. Mogab

引用次数: 1

Hot-carrier-induced degradation in ultra-thin, fully-depleted, deep-submicron nMOS and pMOS SOI transistors 超薄、完全耗尽、深亚微米nMOS和pMOS SOI晶体管的热载流子诱导退化

Proceedings of 1994 IEEE International Reliability Physics Symposium Pub Date : 1994-04-11 DOI: 10.1109/RELPHY.1994.307856

T. Tsuchiya, T. Ohno, Y. Kado, J. Kai

引用次数: 4

Reliability of laser diode modules in temperature-uncontrolled environment 温度控制环境下激光二极管模块的可靠性

Proceedings of 1994 IEEE International Reliability Physics Symposium Pub Date : 1994-04-11 DOI: 10.1109/RELPHY.1994.307798

M. Ciappa, P. Malberti

引用次数: 5

Wafer-level pulsed-DC electromigration response at very high frequencies 晶圆级脉冲直流电迁移响应在非常高的频率

Proceedings of 1994 IEEE International Reliability Physics Symposium Pub Date : 1994-03-01 DOI: 10.1109/RELPHY.1994.307836

D. Pierce, E. Snyder, S. Swanson, L. W. Irwin

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引用次数: 15

The advent of failure analysis software technology 故障分析软件技术的出现

Proceedings of 1994 IEEE International Reliability Physics Symposium Pub Date : 1994-02-01 DOI: 10.1109/RELPHY.1994.307817

C. Henderson, R. Barnard

引用次数: 5

CMOS-SRAM soft-error simulation system CMOS-SRAM软误差仿真系统

Proceedings of 1994 IEEE International Reliability Physics Symposium Pub Date : 1900-01-01 DOI: 10.1109/RELPHY.1994.307815

S. Satoh, R. Sude, H. Tashiro, N. Higaki, N. Nakayama

引用次数: 3