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LRL/LRM modifications for sinlified high frequency multiport/differential measurements 用于简化高频多端口/差分测量的LRL/LRM修改
64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427589
J. Martens, D. Judge, J. Bigelow
{"title":"LRL/LRM modifications for sinlified high frequency multiport/differential measurements","authors":"J. Martens, D. Judge, J. Bigelow","doi":"10.1109/ARFTGF.2004.1427589","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427589","url":null,"abstract":"","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114676292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Network analyzer functionality simulator 网络分析器功能模拟器
64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427593
P. Malmlof
{"title":"Network analyzer functionality simulator","authors":"P. Malmlof","doi":"10.1109/ARFTGF.2004.1427593","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427593","url":null,"abstract":"In this paper, a method is described that provides vector network analyzer (VNA) functionality without the introduction of a VNA to the test system. In many cases, the amount of testing that requires a VNA is very limited, and most of the testing requires other instruments. In some cases, the required measurements have been performed with a setup consisting of a signal generator, directional couplers and a power meter. This method usually results in extremely poor accuracy. We have to have a signal source that can provide the required modulated signals for testing, and we have to have a vector signal analyzer (VSA) that can perform spectral measurements as well as vector error measurements etc. By utilizing the capabilities of these instruments we can achieve the wanted VNA functionality, with good enough accuracy for several of our applications.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128187699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Impact of ground line position on CMOS interconnect behavior 地线位置对CMOS互连性能的影响
64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427600
M.F. Ktata, U. Arz, H. Grabinski, H. Fischer
{"title":"Impact of ground line position on CMOS interconnect behavior","authors":"M.F. Ktata, U. Arz, H. Grabinski, H. Fischer","doi":"10.1109/ARFTGF.2004.1427600","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427600","url":null,"abstract":"We investigate the impact of ground line position as well as the effects of conductive substrates with different conductivities of 10 S/m (low), 100 S/m (medium) and 10.000 S/m (high) on on-chip interconnects. Characteristic line parameters obtained from field calculations are validated with two-port network analyzer measurements of specially designed test structures in a frequency range up to 50 GHz.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117338137","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
New measurement results and models for non-linear differential amplifier characterization 非线性差分放大器特性的新测量结果和模型
64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427588
J. Dunsmore
{"title":"New measurement results and models for non-linear differential amplifier characterization","authors":"J. Dunsmore","doi":"10.1109/ARFTGF.2004.1427588","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427588","url":null,"abstract":"Previously, the author described a system that provides true differential and common-mode stimulus for CW and modulated RF signals, and presented results of non-linear operation of devices driven with such signals; they were compared with results for the same devices driven at the equivalent drive levels using a single-ended drive and calculating the differential response. Those devices showed no difference, in differential gain terms, whether measured with true-mode or single ended measurements. New results on limiting amplifiers demonstrate a substantial change in the differential gain compression when measured using a true differential mode drive. A theoretical model is developed which considers circuit topology differences and predicts which devices will have non-linear characteristics that change depending upon the test methods. Finally, some difficulties with error correction as applied to differential, non-linear circuits are discussed.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116585433","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Uncertainty analysis of the weighted least squares VNA calibration 加权最小二乘VNA标定的不确定度分析
64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427566
K. Wong
{"title":"Uncertainty analysis of the weighted least squares VNA calibration","authors":"K. Wong","doi":"10.1109/ARFTGF.2004.1427566","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427566","url":null,"abstract":"Vector network analyzer, VNA, measurement accuracy depends largely on the accuracy of the calibration standards and the calibration method employed. With the quality and accuracy of calibration standards now reaching a technological limit, advances made in calibration methodology has pushed VNA measurement uncertainty lower. One of the new advances is the weighted least squares method. This paper presents a detailed analysis of this method and shows how the uncertainties of this calibration method compare with the more traditional calibration methods. Also, results of different uncertainty analysis approaches are examined.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122069381","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 29
A high isolation dual signal probe technology 一种高隔离双信号探头技术
64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427591
T. Lesher, L. Hayden
{"title":"A high isolation dual signal probe technology","authors":"T. Lesher, L. Hayden","doi":"10.1109/ARFTGF.2004.1427591","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427591","url":null,"abstract":"In this paper, we describe a new dual signal probe, and vector network analyzer (VNA) calibration standards providing high isolation between signals. Previously existing probes and standards may exhibit high coupling, making them unsuitable for use with conventional VNAs. The new design significantly reduces the signal-to-signal coupling of the probes and standards, enabling improved calibration and measurement to beyond 40 GHz.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127720030","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Accurate estimation of digital communication system metrics - SNR, EVM and /spl rho/ in a nonlinear amplifier environment 在非线性放大器环境下精确估计数字通信系统指标——信噪比、EVM和/spl rho/
64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427570
K. Gharaibeh, K. Gard, M. Steer
{"title":"Accurate estimation of digital communication system metrics - SNR, EVM and /spl rho/ in a nonlinear amplifier environment","authors":"K. Gharaibeh, K. Gard, M. Steer","doi":"10.1109/ARFTGF.2004.1427570","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427570","url":null,"abstract":"A nonlinear spectral analysis technique that enables digital communication system metrics; SNR, EVM and the waveform quality factor (/spl rho/) to be related to in-band distortion spectrum is presented. System metrics are estimated from the measured output power and in-band distortion power. The estimated metrics are verified by direct measurements of each metric using a vector signal analyzer (VSA) performed on a forward-link IS-95 signal. Estimated system metrics are in excellent agreement with measured values.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133163407","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 79
Calculations of measurement uncertainty in complex-valued quantities involving 'uncertainty in the uncertainty' 涉及“不确定度中的不确定度”的复值量测量不确定度的计算
64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427565
B. Hall
{"title":"Calculations of measurement uncertainty in complex-valued quantities involving 'uncertainty in the uncertainty'","authors":"B. Hall","doi":"10.1109/ARFTGF.2004.1427565","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427565","url":null,"abstract":"In some measurement uncertainty calculations there is uncertainty in the scale factor of a range of values that may be attributed to a quantity. This poses special problems. For real-valued calculations, international guidelines indicate two possible approaches, one loosely based on classical statistics, the other on Bayesian statistics. Complex-valued extensions of both approaches have been suggested that may be suitable for RF and microwave measurements. This paper presents algorithms for the complex-valued techniques and evaluates them with simulated data sets. We find that there are significant differences between results obtained by the two approaches. This suggests that an objective measure is needed for the performance of an algorithm for calculating measurement uncertainty in a complex-valued quantity.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121088155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
First results of microwave measurement of broadband radio interference filters 宽带无线电干扰滤波器微波测量的第一个结果
64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427587
K. Hoffmann, Z. Škvor
{"title":"First results of microwave measurement of broadband radio interference filters","authors":"K. Hoffmann, Z. Škvor","doi":"10.1109/ARFTGF.2004.1427587","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427587","url":null,"abstract":"A vector measurement method for testing multiport interference filters for shielded chambers has been used. Measured data up to 3 GHz are presented. The authors believe that this is the first time such results have been published.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"95 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128884147","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Volterra characterization and predistortion linearization of multi-carrier power ampliflers 多载波功率放大器的Volterra特性和预失真线性化
64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427572
S. Myoung, D. Chaillot, P. Roblin, Wenhua Dai, S. Doo
{"title":"Volterra characterization and predistortion linearization of multi-carrier power ampliflers","authors":"S. Myoung, D. Chaillot, P. Roblin, Wenhua Dai, S. Doo","doi":"10.1109/ARFTGF.2004.1427572","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427572","url":null,"abstract":"The linearization of RF power amplifiers (PA) can benefit from the availability of the generalized Volterra coeflicients characterizing its non-linear response. In this work a large-signal network analyzer is used to acquire the amplitude and phase of the 3rd intermodulation terms Ym3- and Ym3+ of an LDMOSFET PA. The frequency dependence and difference between Ym3- and Ym3+ reveals the memory effects of the RF amplifier. A new vectorial digital predistortion linearization with 3rd and 5th order corrections is implemented to account for the difference in memory effits in the lower and upper side bands. The two band predistortion . linearization can linearize independently each band of a 2-carrier WCDMA in a LDMOSFET RF amplifier providing up to 40 dBc ACPR. The extension from 2-carrier to multi-carrier power amplifiers could proceed by further dividing the bandwidth in additional bands.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115077629","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
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