64th ARFTG Microwave Measurements Conference, Fall 2004.最新文献_第2页

Practical modeling and de-embedding procedure for matching circuit of triple band front-end module used for EGSM/DCS/PCS cellular phone system EGSM/DCS/PCS蜂窝电话系统三波段前端模块匹配电路的实用建模与去嵌入程序

64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427583

N. Shibagaki, K. Sakiyama, M. Hikkita

{"title":"Practical modeling and de-embedding procedure for matching circuit of triple band front-end module used for EGSM/DCS/PCS cellular phone system","authors":"N. Shibagaki, K. Sakiyama, M. Hikkita","doi":"10.1109/ARFTGF.2004.1427583","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427583","url":null,"abstract":"Integration of the antenna front-end module is improved using balanced SAW technology and LTCC technology with sophisticated 3D electromagnetic simulation techniques. New SAW front-end modules for use in EGSM/DCS/PCS triple-band cellular phones have been developed. Conventional RF section designs utilize matching circuits between the front-end module and the RF-IC, which has a complex load impedance. Our new concept front-end module includes the matching circuit for size reduction. Due to the internal matching circuit, the front-end modules are no longer standard 50 ohm system devices. We have demonstrated a practical modeling and de-embedding procedure for the internal RF-IC matching circuit. With this technique, we can evaluate SAW filter characteristics, such as insertion loss, VSWR and amplitude/phase balance, in the nominal output impedance of the SAW filter (e.g.,150 ohm balance) in spite of complex output impedance values for the front-end modules. This modeling technique is useful, not only for inspection of SAW filters for front-end modules, but also for investigating yield problems due to component variations in matching circuits. We believe this technique is useful for developing new concept front-end modules that include matching circuits for the RF-IC.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129885624","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Functional tests for peak power sensor and meter 峰值功率传感器和仪表的功能测试

64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427598

Y.S.B. Lee

引用次数: 1

Large signal network analyzer with trigger for baseband & RF system characterization with application to K-modeling & output baseband modulation linearization 具有基带和射频系统特性触发器的大信号网络分析仪，应用于k建模和输出基带调制线性化

64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427596

S. Myoung, X. Cui, D. Chaillot, P. Roblin, F. Verbeyst, M. Bossche, S. Doo, W. Dai

{"title":"Large signal network analyzer with trigger for baseband & RF system characterization with application to K-modeling & output baseband modulation linearization","authors":"S. Myoung, X. Cui, D. Chaillot, P. Roblin, F. Verbeyst, M. Bossche, S. Doo, W. Dai","doi":"10.1109/ARFTGF.2004.1427596","DOIUrl":"https://doi.org/10.1109/ARFTGF.2004.1427596","url":null,"abstract":"The modeling and balancing of IQ modulators and the development of linearization techniques for power amplifiers (PA) such as output baseband modulation (OBM) benefit from the availability of linear and nonlinear MIMO Volterra system parameters involving both baseband and RF signals. A triggered LSNA system is reported for this purpose. By synchronizing the LSNA measurements with the generation of the baseband modulation, RF signals with a stable envelope can be acquired. Applied to an IQ modulator the triggered LSNA facilitates the measurement of the correlation between the I and Q signals at baseband and RF, effectively yielding the modulator K-model. Inverting the K-model of the IQ modulator, an IQ balancing of about 43 dBc and 46 dBc for the lower and upper side-bands, respectively, was achieved using 14 bit signed DACs. Finally the triggered LSNA finds applications in the linearization of RF PAs with input (IBM) or output (OBM) baseband modulation by facilitating the extraction of the Y/sub md-/ and Y/sub md+/ Volterra nonlinear parameters.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125438544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 12

On-chip microwave test circuits for production IC measurements 用于生产集成电路测量的片上微波测试电路

64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427602

W. Eisenstadt, R. Fox, Qizhang Yin, Jangsup Yoon, Tao Zhang

引用次数: 3

The resonant method: an approximate method for extracting the effective parasitic capacitance of a large signal transistor 谐振法:一种提取大信号晶体管有效寄生电容的近似方法

64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427578

B. Noori, L. Giffin

引用次数: 3

A generalised approach to the propagation of uncertainty in complex S-parameter measurements 复杂s参数测量中不确定性传播的一种广义方法

64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427564

N. Ridler, M. Salter

引用次数: 32

The normalized difference unit as a metric for comparing IV curves 作为比较IV曲线的度量标准的归一化差单位

64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427577

C. Baylis, L. Dunleavy, A. Snider

引用次数: 6

Identifying the main nonlinear contributions: use of multisine excitations during circuit design 识别主要的非线性贡献:在电路设计中使用多重激励

64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427574

L. De Locht, G. Vandersteen, P. Wambacq, Y. Rolain, R. Pintelon, J. Schoukens, S. Donnay

引用次数: 17

Multimode TRL and LRL calibrated measurements of differential devices 差分器件的多模TRL和LRL校准测量

64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427590

T. Buber, A. Rodriguez, A. Jenkins, J. Mahon, C. Liss, J. Lanteri, N. Kınayman, R. Wohlert, I. Gresham, A. Khalil, J. Bennett, L. Dunleavy

引用次数: 12

Design of on chip coplanar waveguide matching circuit for BI-CMOS RF amplifier 双cmos射频放大器片上共面波导匹配电路的设计

64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI: 10.1109/ARFTGF.2004.1427580

H. Kanaya, T. Nakamura, K. Yoshida

引用次数: 0