用于生产集成电路测量的片上微波测试电路

64th ARFTG Microwave Measurements Conference, Fall 2004. Pub Date : 2004-12-02 DOI:10.1109/ARFTGF.2004.1427602

W. Eisenstadt, R. Fox, Qizhang Yin, Jangsup Yoon, Tao Zhang

{"title":"用于生产集成电路测量的片上微波测试电路","authors":"W. Eisenstadt, R. Fox, Qizhang Yin, Jangsup Yoon, Tao Zhang","doi":"10.1109/ARFTGF.2004.1427602","DOIUrl":null,"url":null,"abstract":"The paper presents recent progress in the development of embedded test for RF/microwave circuits. This work includes compact on-chip circuits designed for (1) microwave signal sampling (5 GHz couplers, baluns, and combiners), and (2) microwave/RF signal detection circuits (5 GHz peak detector and 1 GHz RMS detector).","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"On-chip microwave test circuits for production IC measurements\",\"authors\":\"W. Eisenstadt, R. Fox, Qizhang Yin, Jangsup Yoon, Tao Zhang\",\"doi\":\"10.1109/ARFTGF.2004.1427602\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents recent progress in the development of embedded test for RF/microwave circuits. This work includes compact on-chip circuits designed for (1) microwave signal sampling (5 GHz couplers, baluns, and combiners), and (2) microwave/RF signal detection circuits (5 GHz peak detector and 1 GHz RMS detector).\",\"PeriodicalId\":273791,\"journal\":{\"name\":\"64th ARFTG Microwave Measurements Conference, Fall 2004.\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-12-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"64th ARFTG Microwave Measurements Conference, Fall 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTGF.2004.1427602\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"64th ARFTG Microwave Measurements Conference, Fall 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTGF.2004.1427602","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

本文介绍了射频/微波电路嵌入式测试技术的最新进展。这项工作包括设计用于(1)微波信号采样(5ghz耦合器、平衡器和组合器)和(2)微波/射频信号检测电路(5ghz峰值检测器和1ghz RMS检测器)的紧凑型片上电路。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

On-chip microwave test circuits for production IC measurements

The paper presents recent progress in the development of embedded test for RF/microwave circuits. This work includes compact on-chip circuits designed for (1) microwave signal sampling (5 GHz couplers, baluns, and combiners), and (2) microwave/RF signal detection circuits (5 GHz peak detector and 1 GHz RMS detector).

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

64th ARFTG Microwave Measurements Conference, Fall 2004.

自引率

0.00%

发文量