{"title":"在非线性放大器环境下精确估计数字通信系统指标——信噪比、EVM和/spl rho/","authors":"K. Gharaibeh, K. Gard, M. Steer","doi":"10.1109/ARFTGF.2004.1427570","DOIUrl":null,"url":null,"abstract":"A nonlinear spectral analysis technique that enables digital communication system metrics; SNR, EVM and the waveform quality factor (/spl rho/) to be related to in-band distortion spectrum is presented. System metrics are estimated from the measured output power and in-band distortion power. The estimated metrics are verified by direct measurements of each metric using a vector signal analyzer (VSA) performed on a forward-link IS-95 signal. Estimated system metrics are in excellent agreement with measured values.","PeriodicalId":273791,"journal":{"name":"64th ARFTG Microwave Measurements Conference, Fall 2004.","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"79","resultStr":"{\"title\":\"Accurate estimation of digital communication system metrics - SNR, EVM and /spl rho/ in a nonlinear amplifier environment\",\"authors\":\"K. Gharaibeh, K. Gard, M. Steer\",\"doi\":\"10.1109/ARFTGF.2004.1427570\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A nonlinear spectral analysis technique that enables digital communication system metrics; SNR, EVM and the waveform quality factor (/spl rho/) to be related to in-band distortion spectrum is presented. System metrics are estimated from the measured output power and in-band distortion power. The estimated metrics are verified by direct measurements of each metric using a vector signal analyzer (VSA) performed on a forward-link IS-95 signal. Estimated system metrics are in excellent agreement with measured values.\",\"PeriodicalId\":273791,\"journal\":{\"name\":\"64th ARFTG Microwave Measurements Conference, Fall 2004.\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-12-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"79\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"64th ARFTG Microwave Measurements Conference, Fall 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTGF.2004.1427570\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"64th ARFTG Microwave Measurements Conference, Fall 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTGF.2004.1427570","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Accurate estimation of digital communication system metrics - SNR, EVM and /spl rho/ in a nonlinear amplifier environment
A nonlinear spectral analysis technique that enables digital communication system metrics; SNR, EVM and the waveform quality factor (/spl rho/) to be related to in-band distortion spectrum is presented. System metrics are estimated from the measured output power and in-band distortion power. The estimated metrics are verified by direct measurements of each metric using a vector signal analyzer (VSA) performed on a forward-link IS-95 signal. Estimated system metrics are in excellent agreement with measured values.
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