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2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.最新文献

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Electromagnetic characteristics of high voltage dc corona 高压直流电晕的电磁特性
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428297
A. Akses, O. Kalenderli
{"title":"Electromagnetic characteristics of high voltage dc corona","authors":"A. Akses, O. Kalenderli","doi":"10.1109/ICSMC2.2003.1428297","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428297","url":null,"abstract":"This study gives the evaluation of the high voltage dc corona. For this purpose, electromagnetic characteristics of the dc corona discharge are observed. Both the positive and the negative corona for dc voltages are taken into account. The main concern is the electromagnetic interference caused by the corona. The level of noise is evaluated by the tests performed in semi-anechoic chamber, with different electrodes","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"60 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121891581","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A new approach to derive emission requirements on APD in order to protect digital communication systems 为保护数字通信系统，提出了一种导出APD发射要求的新方法
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428238
K. Wiklundh
{"title":"A new approach to derive emission requirements on APD in order to protect digital communication systems","authors":"K. Wiklundh","doi":"10.1109/ICSMC2.2003.1428238","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428238","url":null,"abstract":"Amplitude probability distribution (APD) has been proposed within CISPR as a measure of the emitted electromagnetic energy from electrical equipment. APD describes the envelope statistics of a disturbance from the IF filter of the measurement receiver and is in many ways a suitable model of nonGaussian noise, when determining its impact on a digital communication system. In an earlier paper, the connection between the APD of a disturbance and its effect on a digital receiver was presented. However, to derive a maximum allowed APD out of a maximum allowed bit error probability is a non-trivial problem. Unfortunately, this is exactly the issue when emission requirements should be related to the APD. This paper presents a possible way to put requirements on the APD in order to protect digital communication systems. By letting a measured APD of a disturbance lay below the requirements, the impact on a variety of receivers are guaranteed to not exceed the maximum bit error probability","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"248 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131679437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Oscilloscope influence on the calibration uncertainty of the pulse rise time of ESD simulators 示波器对ESD模拟器脉冲上升时间校准不确定度的影响
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428270
J. Sroka
{"title":"Oscilloscope influence on the calibration uncertainty of the pulse rise time of ESD simulators","authors":"J. Sroka","doi":"10.1109/ICSMC2.2003.1428270","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428270","url":null,"abstract":"In the paper an approach to contribution of the oscilloscope in uncertainty estimation of the rise time by measurement of the ESD discharge current is performed. Correlation between input signal and the displayed voltage at the oscilloscope called here transmittance is measured and approximated with the second order low pass filter along with the Gauss filters. Voltage at the oscilloscope input is calculated as the product of the analytically expressed current and measured input impedance of the oscilloscope. Moreover measurement uncertainty of input impedance and oscilloscope transmittance are built in the uncertainty estimation. The approach is compared with the two rules concerning conservative estimation of the rise time of oscilloscopes as stated in C. Mittermayer and A. Steiniger (for original article see IEEE Trans. on instrumentation and measurement Vol. 48, No. 6, p. 1103-7, December 1999). Presented calculations of the uncertainty of the rise time for pulses with different rise time shows advantages and better suitability of the novel method by measurement of the ESD discharge current","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131729207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Analysis of the CISPR 25 component test setup CISPR 25元件测试装置分析
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428236
A. Kriz, W. Milliner
{"title":"Analysis of the CISPR 25 component test setup","authors":"A. Kriz, W. Milliner","doi":"10.1109/ICSMC2.2003.1428236","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428236","url":null,"abstract":"We analyze the wave propagation characteristic of the CISPR 25 radiated emission test setup with numerical simulations. Bad repeatability of the standardized ALSE validation procedure urged us to develop a new, more stable procedure. Our new validation procedure uses a small conical, dipole antenna instead of the test harness which improves the repeatability and avoids impedance problems of the artificial network and the noise source. Furthermore it allows precise measurements to investigate the influence of test bench dimensions and grounding. Results of these investigations are shown","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122332733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Reduction of ambient reflection using the matrix pencil method in the measurement of the complex antenna factor 用矩阵铅笔法测量复天线系数时环境反射的减少
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428198
L. Hamada, Y. Kodama, T. Iwasaki
{"title":"Reduction of ambient reflection using the matrix pencil method in the measurement of the complex antenna factor","authors":"L. Hamada, Y. Kodama, T. Iwasaki","doi":"10.1109/ICSMC2.2003.1428198","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428198","url":null,"abstract":"A method of measuring the complex antenna factor (CAF) using the matrix pencil method is presented. The transmission coefficient measured between two antennas placed in an anechoic chamber is processed using the matrix pencil method to reduce the reflected wave component. As a result, the process using the complex antenna method is more effective than that using the gating in the time domain for reduction of ambient reflection in the measurement of the CAF","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"252 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120941316","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The past, present and future challenges of aircraft EMC 飞机电磁兼容的过去、现在和未来挑战
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/MEMC.2012.6244953
N. Carter
{"title":"The past, present and future challenges of aircraft EMC","authors":"N. Carter","doi":"10.1109/MEMC.2012.6244953","DOIUrl":"https://doi.org/10.1109/MEMC.2012.6244953","url":null,"abstract":"This paper discusses the development of aircraft EMC from its beginning finishing with a discussion of the challenges currently facing the various standardisation committees. Aircraft EMC requirements have undergone a process of continuous change driven by the ever increasing electromagnetic (EM) environment, both in terms of amplitude and frequency range, and the increasing use of electronics in the critical functions of aircraft systems","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"150 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133889559","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Magnetic field distributions in high voltage test hall when impulse voltage generator discharges 冲击电压发生器放电时高压试验大厅内的磁场分布
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428302
W. Jianguo, Huang Ling, Dong Wansheng, Chen Cixuan
{"title":"Magnetic field distributions in high voltage test hall when impulse voltage generator discharges","authors":"W. Jianguo, Huang Ling, Dong Wansheng, Chen Cixuan","doi":"10.1109/ICSMC2.2003.1428302","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428302","url":null,"abstract":"To protect equipment and personnel in high voltage test hall effectively, it is necessary to know the distributions of space electromagnetic field and frequency spectrum characteristics. A set of transient magnetic field waveform measurements and digital reconstruction method was used in discharge and withstand test of impulse voltage generator. Distributions of magnetic field and waveform characteristics have been measured. The results show that magnetic field of discharge test is larger than that of withstand test either in lightning impulse voltage test or in switching impulse voltage test. The magnetic field of many points have exceeded the level of computer misoperation and the rise time of waveform is also very short, so necessary protection and an EMC test to the equipment working in high voltage test hall are very necessary","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133368041","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Electric field measurements of different mobile handsets in near zone 近区域内不同手机的电场测量
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428278
S. Seker, G. Apaydin, C. Çelik
{"title":"Electric field measurements of different mobile handsets in near zone","authors":"S. Seker, G. Apaydin, C. Çelik","doi":"10.1109/ICSMC2.2003.1428278","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428278","url":null,"abstract":"In this work, electric field measurements are made in three categories. These are the near field measurements very close to the GSM phone for different phases (ringing, dialing, speaking) at the front, back, right and left sides of the phone, the electric field measurements at between 0-5 cm (1 cm intervals) away from the face and back of the GSM phone and the electric field measurements between 0-10 cm (1 cm intervals) away from the helix antenna which is fed by a 900MHz RF signal generator. These measurements were made by FP5000 isotropic probe that has frequency range between 10kHz-1GHz, dynamic range 1-300V/m. Fully charged mobile phone, which is under test, was fixed vertically on wooden platform and maximum electric field values were recorded. Only the position of probe was changed. During outgoing call phase, it's observed that the electric field at very close to mobile phone is much higher than limits specified by ICNIRP","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132170751","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Effective base stations location and frequency assignment in mobile radio networks 移动无线网络中有效的基站定位和频率分配
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428343
R.C. Santiago, V. Lyandres, A. Raymond, V. Kontorovitch
{"title":"Effective base stations location and frequency assignment in mobile radio networks","authors":"R.C. Santiago, V. Lyandres, A. Raymond, V. Kontorovitch","doi":"10.1109/ICSMC2.2003.1428343","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428343","url":null,"abstract":"Most of mobile radio networks that operate nowadays have been designed based on the classical cellular concept. However, during the last decade, an interest to find alternate design strategies has raised for several reasons. In general, the traffic density cannot be assumed constant throughout, making necessary the relocation of base stations inside the traffic hot spots. If traffic is characterized in a discrete manner, the optimal base stations location problem can be treated as a well-known problem in signal processing called vector quantization. We found that applying such a design strategy, better frequency assignments for a network can be accomplished","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"66 7","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132400220","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Effects of the loads and wiring size on PLC electromagnetic pollution 负载和接线尺寸对PLC电磁污染的影响
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428222
R. Razafferson, L. Koné, B. Démoulin, A. Zeddam, F. Gauthier
{"title":"Effects of the loads and wiring size on PLC electromagnetic pollution","authors":"R. Razafferson, L. Koné, B. Démoulin, A. Zeddam, F. Gauthier","doi":"10.1109/ICSMC2.2003.1428222","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428222","url":null,"abstract":"The paper deals with the contribution of few parameters governing the PLC emission phenomena. From experiments injecting high frequency current by means of a balun some interesting data will be selected. Especially it is shown that above a distance of 20 centimetres from the line its emission is mainly due to the common mode current merging from the balun. Measurements extended to indoor room configuration show that radiation is characterized by a specific frequency depending of the quarter wavelength resonance of the line under test. Some other results about the coupling effects bounded by this frequency will be presented. To conclude these experiments will be extended to indoor PLC powered with 220V 50 Hz in order to determine the effects provided by the loads connected on the line and to known change of coupling phenomena introduced by the building long tree shaped line","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132590142","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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