2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.

Lightning current and overvoltage withstand capacity test of low voltage systems facility wiring

Pub Date : 2003-06-01 DOI: 10.1109/ICPADM.2003.1218366 W. Jianguo, Dong Wansheng, Chen Cixuan, Zhu Wenbin, Huang Ling

Prediction of the field radiated at one meter from PCB's and microprocessors from near EM field cartography

Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428296 F. de Daran, J. Chollet-Ricard, F. Lafon, O. Maurice

IEEE Transactions on electromagnetic compatibility: An overview

Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428178 M. D'amore