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2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.最新文献

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Lightning current and overvoltage withstand capacity test of low voltage systems facility wiring 低压系统设施布线耐雷击电流和过电压能力试验
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-06-01 DOI: 10.1109/ICPADM.2003.1218366
W. Jianguo, Dong Wansheng, Chen Cixuan, Zhu Wenbin, Huang Ling
{"title":"Lightning current and overvoltage withstand capacity test of low voltage systems facility wiring","authors":"W. Jianguo, Dong Wansheng, Chen Cixuan, Zhu Wenbin, Huang Ling","doi":"10.1109/ICPADM.2003.1218366","DOIUrl":"https://doi.org/10.1109/ICPADM.2003.1218366","url":null,"abstract":"Withstand capacity test under lightning current, lightning impulse voltage, 50Hz AC voltage and DC voltage of many kinds of low voltage systems facility wiring have been conducted in laboratory. The result is very useful for insulation cooperation and lightning protection design of low voltage systems facility","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126599990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Prediction of the field radiated at one meter from PCB's and microprocessors from near EM field cartography 利用PCB和微处理器对近电磁场地图进行一米辐射场的预测
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428296
F. de Daran, J. Chollet-Ricard, F. Lafon, O. Maurice
{"title":"Prediction of the field radiated at one meter from PCB's and microprocessors from near EM field cartography","authors":"F. de Daran, J. Chollet-Ricard, F. Lafon, O. Maurice","doi":"10.1109/ICSMC2.2003.1428296","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428296","url":null,"abstract":"The paper shows a near field scanning method to characterize chips that leads to the prediction of the coupling phenomena on the electronic board and to the evaluation of the radiated emission at one meter. A theoretical model is first given for simple circuits. An estimation of the scalar and vector potentials is found with the EM scan. Using these results, we calculate the near and far emissions. Comparisons with experimental results are given. As a conclusion, we propose a simple model describing chip radiated emission and we show a real case use","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127528660","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 32
IEEE Transactions on electromagnetic compatibility: An overview IEEE电磁兼容性汇刊:综述
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428178
M. D'amore
{"title":"IEEE Transactions on electromagnetic compatibility: An overview","authors":"M. D'amore","doi":"10.1109/ICSMC2.2003.1428178","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428178","url":null,"abstract":"The technical-scientific contents of the Transactions on EMC (EMC-T) are inspired to the main objectives of the EMC Society: \"The IEEE EMC Society strives for the enhancement of electromagnetic compatibility through the generation of engineering standards, measurement techniques and test procedures, measuring instruments, equipment and systems characteristics, improved techniques and components, education in EMC and studies of the origins of interference.\" The elements on which the development of EMC-T should be founded are described in the paper. The topics focus primarily on the electromagnetic fields, the circuits and the measurements; the methodologies can be analytical, numerical, and experimental; and the applications concern numerous different industrial sectors","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124900356","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Non-linear performance in power amplifiers and LNA at 900 MHz and 1900 MHz by using low-level voltage supply 在900 MHz和1900 MHz使用低电压电源的功率放大器和LNA的非线性性能
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428315
H. Jardón-Aguilar, J. A. Tirado‐Méndez, F. Iturbide-Sanchez, O. Golovin
{"title":"Non-linear performance in power amplifiers and LNA at 900 MHz and 1900 MHz by using low-level voltage supply","authors":"H. Jardón-Aguilar, J. A. Tirado‐Méndez, F. Iturbide-Sanchez, O. Golovin","doi":"10.1109/ICSMC2.2003.1428315","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428315","url":null,"abstract":"This paper is related to different high-linear low noise amplifiers (LNA) and high-efficiency power amplifiers (PA) performance at 1900 MHz and 900 MHz, respectively, concerning electromagnetic compatibility for being used in personal communication systems. A class A and E PAs and a common-emitter degenerated by inductance (CEDI) and an active feedback common-emitter (AFCE) LNAs were designed, simulated and compared in relation to their intermodulation product performance. The nonlinear and efficiency characteristics of a low-voltage supplied high-efficient class E PA for ISM band systems are reported. Concerning low-level voltage supplied LNAs, a very low nonlinear behavior was obtained, considering the 1 dB compression point, the intermodulation products and the third-order interception point in a wide frequency range. Such structures were polarized with 2.4 V and by using SiGe HBT as active elements","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123470521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Numerical approaches for EMI reduction of ICs and PCBs inside metallic enclosures 金属外壳内集成电路和pcb减少电磁干扰的数值方法
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428305
S. Goudos, T. Samaras, E. Vafiadis, J. Sahalos
{"title":"Numerical approaches for EMI reduction of ICs and PCBs inside metallic enclosures","authors":"S. Goudos, T. Samaras, E. Vafiadis, J. Sahalos","doi":"10.1109/ICSMC2.2003.1428305","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428305","url":null,"abstract":"This work presents a numerical approach to the reduction of electromagnetic interference (EMI) from the emissions of ICs and PCBs inside rectangular metallic enclosures The ICs are modeled as small magnetic dipoles. Their interaction with the enclosures is studied with the dyadic Green's functions. The Monte Carlo procedure in conjunction with optimization techniques is used in order to achieve optimal placement configurations for the ICs, by minimizing the electric current density on the metallic walls. The applications of the above approach in PCB design are discussed","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129250126","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
MST measurement technique for EMC calibrations and exposure hazard evaluation 电磁兼容校准和暴露危害评估的MST测量技术
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428192
R. Azaro, S. Caorsi
{"title":"MST measurement technique for EMC calibrations and exposure hazard evaluation","authors":"R. Azaro, S. Caorsi","doi":"10.1109/ICSMC2.2003.1428192","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428192","url":null,"abstract":"The modulated scattering technique (MST) is a perturbative measurement technique that in the past has been employed to measure electromagnetic field, in order to minimize the perturbations introduced by conventional techniques. In this paper we describe the application of MST in some EMC calibration activities and in the evaluation of human exposure to high frequency electromagnetic fields. In particular in EMC area we consider the application of MST to field uniformity verification in a semi-anechoic chamber and in a TEM cell, while the same measurement technique is extended to a system able to evaluate the exposure to electromagnetic field in a vertical section of the human body","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114020845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of indoor PLC radiation resulting from conducted emission limits 传导辐射限值对室内PLC辐射影响的评价
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428220
E. Marthe, F. Rachidi, M. Ianoz
{"title":"Evaluation of indoor PLC radiation resulting from conducted emission limits","authors":"E. Marthe, F. Rachidi, M. Ianoz","doi":"10.1109/ICSMC2.2003.1428220","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428220","url":null,"abstract":"We present in this paper an analysis of the electromagnetic emission associated with power line communications (PLC) systems. Using coupling factors obtained experimentally for different typical indoor configurations, we calculate radiated fields associated with signals having a magnitude given by the EN550022/CISPR22 limits. We show that the resulting fields exceed, for a wide range of frequency, some of the current emission limits such as the German NB30, the BBC, the Norway and the UK MPT 1570 proposals. On the other hand, the fields remain within the limits of the extrapolated EN 55022 Class B and FCC Part 15","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"26 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124309999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Antenna field calibration laboratory for RF electromagnetic field meters 天线现场校准实验室射频电磁场仪表
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428207
A. Marinescu, A. Scornea, I. Dumbravă, G. Mihai, J. Glimm, K. Munter, R. Pape
{"title":"Antenna field calibration laboratory for RF electromagnetic field meters","authors":"A. Marinescu, A. Scornea, I. Dumbravă, G. Mihai, J. Glimm, K. Munter, R. Pape","doi":"10.1109/ICSMC2.2003.1428207","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428207","url":null,"abstract":"During recent years, the pronounced electromagnetic pollution of the environment makes it ever more necessary to increase the number of calibrated field strength meters aiming at a better protection of the people and equipment against the electromagnetic radiations. The paper presents the calibration procedure and necessary equipment of RF electromagnetic field meters in the antenna field inside the semi-anechoic chamber (SAC) of ICMET. The whole calibration process is automatically controlled by a computer. Some experimental results necessary to certify the calibration system such as field uniformity, antenna conversion factor and measurement uncertainty are also presented","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127608868","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
An analysis of the wave propagation and the scattering from terrain profiles using iterative techniques 用迭代技术分析地形剖面的波传播和散射
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428342
B. Babaoglu, A. Altintas, V. Erturk
{"title":"An analysis of the wave propagation and the scattering from terrain profiles using iterative techniques","authors":"B. Babaoglu, A. Altintas, V. Erturk","doi":"10.1109/ICSMC2.2003.1428342","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428342","url":null,"abstract":"Using the method of moments (MoM) for computation of radiation/scattering from large scale surfaces is a very popular approach since the obtained results are accurate and reliable. But the memory requirements in MoM to solve integral equations and the long computational time make the method less favorable. This problem is achieved by using iterative techniques in conjunction with a spectral acceleration method (J. T. Johnson and H. Chou, 1998). The operation count is reduced to O(N) where N refers to the number of unknowns. The process mentioned in this paper focuses on the terrain profiles in rural areas. The aim is to reach large distances at UHF/VHF frequencies","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125711984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Microwave drying of cylindrical products 微波干燥圆柱形产品
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428255
M. Saber
{"title":"Microwave drying of cylindrical products","authors":"M. Saber","doi":"10.1109/ICSMC2.2003.1428255","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428255","url":null,"abstract":"Application of microwave power for drying of products in cylinderic form is presented. Numerical analysis of mass and heat transfer of the processed material using microwave energy and hot air is carried out. The system is nonlinear one. Three dimensional finite difference using the polar coordinate system (curved boundaries) is the cornerstone of the solution of the system. To avoid physical and chemical or biological changes during manipulation, such technique possess implicit energy balance and control","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131377370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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