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2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.最新文献

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An EMC design risk assessment technique to retest or not to retest? EMC设计风险评估技术复测还是不复测?
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428210
M. O'hara
{"title":"An EMC design risk assessment technique to retest or not to retest?","authors":"M. O'hara","doi":"10.1109/ICSMC2.2003.1428210","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428210","url":null,"abstract":"A technique is presented that provides for a qualitative and quantitative assessment of the risk of failing to achieve EMC compliance when making minor hardware design changes (component or PCB layout) on a product that has already had a successful compliance test performed. The EMC design risk assessment (EDRA) technique uses a simple summation of risk scheme to allow design changes to be gauged and the requirement for re-testing to be implied from the total risk value. The technique allows a product supplier to make a quantified technical assessment of the impact of design changes on the compliance status and hence decide if a retest is required or can be avoided. The supplier may make the decision to not implement all of the suggested design changes in order to avoid retest costs and the EDRA may be used to determine which changes are not economically feasible","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117274466","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
EMC measurements in Buenos Aires metro system 布宜诺斯艾利斯地铁系统电磁兼容测量
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428187
V. Pintos, B. A. Ovide, C. Munoz, R. Saint-Nom
{"title":"EMC measurements in Buenos Aires metro system","authors":"V. Pintos, B. A. Ovide, C. Munoz, R. Saint-Nom","doi":"10.1109/ICSMC2.2003.1428187","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428187","url":null,"abstract":"Extensive references about electromagnetic field strength measurements of mobile phone base stations may be found in specialized literature. But those underground emissions, to serve passengers of public transportation, are almost unknown. This paper deals with EMC measurements along a Metro System, showing statistically based results, and comparing them to actual local standards of maximum allowed power density levels. Discussion of further analysis is also proposed. Conclusions take into account reliability, measuring methods and the way reports should be addressed to society","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131835451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Myths of EMC globalization EMC全球化的神话
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428311
E. Gazal
{"title":"Myths of EMC globalization","authors":"E. Gazal","doi":"10.1109/ICSMC2.2003.1428311","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428311","url":null,"abstract":"In a world where every product has to be tested against several standards for different regions, manufacturers face mass expenses to fulfill marketing requirements. As these requirements are based on standards and laws, one should ask himself: why doesn't anyone try to \"standardize all standards\"? Why should a single product face the same test several times using different methods defining different limits? We would like to emphasize the need for standards globalization - we believe that standardization bodies should try to ease standardization processes in order to achieve better marketing relations between nations, manufacturers and customers and in order to create a financially and technically healthier environment. Radio, telecommunications, home appliances, security devises, medical equipment, military equipment, automotive equipment etc. - they all use not only different standards but also different test methods as well as equipment with different specifications (e.g. ESD generator for commercial and military applications). Surely, all of them have different environmental conditions, but these conditions lead to mismatched testing methods as well as different standards to be used. Probably, nobody ever tried to avoid this","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"224 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134017778","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Standardisation problems related to conducted limits for power line communication equipment 电力线通信设备传导限值的标准化问题
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428223
M. Ianoz
{"title":"Standardisation problems related to conducted limits for power line communication equipment","authors":"M. Ianoz","doi":"10.1109/ICSMC2.2003.1428223","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428223","url":null,"abstract":"Feasibility studies performed in the last years have shown that the low voltage distribution network can be used for data transmission. The main problem is the possible radiation of electromagnetic field representing a the disturbance which can affect radio transmission in the 1 to 30 MHz frequency band. In parallel to the search for new field measurement methods, attention is today directed to the assessment of the equipment based on conducted limits which requires an amendment of CISPR 22 used until now for equipment connected to a telecommunication network. The paper presents the problems related to the introduction of this amendment of CISPR 22 and discusses the possibility to use conducted measurements in order to estimate radiated fields","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130975035","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
The influence of slot position on the shielding degradation of metallic enclosures 槽位对金属外壳屏蔽性能退化的影响
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428338
F. Schlagenhaufer, J. He, K. Fynn
{"title":"The influence of slot position on the shielding degradation of metallic enclosures","authors":"F. Schlagenhaufer, J. He, K. Fynn","doi":"10.1109/ICSMC2.2003.1428338","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428338","url":null,"abstract":"The shielding performance of metallic enclosures at high frequencies is dominated by coupling through openings, especially long slots. In cases, where the size and shape of slots cannot be modified due to functional criteria, it may be possible to influence their position and orientation and the location of critical components inside the enclosure, and so to minimise the shielding degradation. In this paper, the influence of the slot position and source location, on the shielding performance of a metallic enclosure is investigated by means of numerical simulations. From the analysis results, general design guidelines are then developed","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132933150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An analog fiber optic link for ESD detection 用于ESD检测的模拟光纤链路
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428272
F. Sanchez, P. Riu, F. Silva
{"title":"An analog fiber optic link for ESD detection","authors":"F. Sanchez, P. Riu, F. Silva","doi":"10.1109/ICSMC2.2003.1428272","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428272","url":null,"abstract":"The performance of an E-field probe developed around a low-cost battery-powered wide-bandwidth analog fiber optic link for measuring transients is described. The link is based in a VCSEL laser operating at the wavelength of 850 nm and includes a voltage amplifier at the transmitter and a transimpedance amplifier at the receiver to permit the transmission of low-level analog signals up to 1 GHz. The E-field sensor is applied for monitoring radiated electromagnetic fields produced by high-voltage spark discharges simulating the electrostatic discharges (ESD). A numerical electromagnetic field simulator based on the FDTD method, is used as a tool to study the signals beforehand the experimental measurements. The effects of the discharges over the transmission lines connecting passive probes and instruments have shown the feasibility of the fiber optic E-field probe","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130874022","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Time-domain treatment of multi-layer soil in transient analysis of aerial multi-conductor transmission lines 架空多导体输电线路暂态分析中多层土的时域处理
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428214
T. Lu, Lei Qi, X. Cui
{"title":"Time-domain treatment of multi-layer soil in transient analysis of aerial multi-conductor transmission lines","authors":"T. Lu, Lei Qi, X. Cui","doi":"10.1109/ICSMC2.2003.1428214","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428214","url":null,"abstract":"Based on the complex ground return plane method and Maxwell's equations, the ground return impedance of aerial multi-conductor transmission lines (MTLs) above multi-layer soil is researched in frequency domain, and its time-domain expression is obtained by using the vector fitting method and inverse Laplace transform. After the validity of the method above is tested, the effect of the multi-layer soil is included in the FDTD method based on recursive convolution in order to research the wave process of aerial MTLs. The method proposed is demonstrated to give the same results as the famous software EMTP, and to have a little difference from the results of method of moment (MoM). Finally, two examples are analyzed","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114255049","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A new radiated immunity test method using rotating AM-EM fields and its application 利用旋转调幅电磁场进行辐射抗扰度测试的新方法及其应用
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428242
K. Murano, Y. Kami
{"title":"A new radiated immunity test method using rotating AM-EM fields and its application","authors":"K. Murano, Y. Kami","doi":"10.1109/ICSMC2.2003.1428242","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428242","url":null,"abstract":"3D radiated immunity characteristics can be obtained using a turntable together with our previously proposed radio-frequency radiated-immunity test method which uses slowly rotating electromagnetic fields. This paper clarifies how to generate the rotating amplitude-modulated electromagnetic fields and presents experimentally measured immunity characteristics of an audio amplifier, which show the effectiveness of this method","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125133778","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A factorial designed experiment for evaluation of mode-stirrers in reverberation chambers 混响室中模态搅拌器的析因设计试验
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428292
O. Lundén, M. Backstrom
{"title":"A factorial designed experiment for evaluation of mode-stirrers in reverberation chambers","authors":"O. Lundén, M. Backstrom","doi":"10.1109/ICSMC2.2003.1428292","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428292","url":null,"abstract":"A factorial designed experiment at two levels was applied to investigate the performance of stirrers in reverberation chambers. The goal has been to quantify the sensitivity of the design parameters for the mode-stirrer. The focus has been to investigate single rotational stirrers. The experiment shows that the effect of changing the diameter of the stirrer is much greater than changing the height, and that the effect of changing the chamber volume is small","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116776486","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Automotive equipments EMC modeling for electrical network disturbances prediction 面向电网干扰预测的汽车设备电磁兼容建模
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI: 10.1109/ICSMC2.2003.1428279
J. Poinsignon, P. Matossian, B. Mazari, F. Duval
{"title":"Automotive equipments EMC modeling for electrical network disturbances prediction","authors":"J. Poinsignon, P. Matossian, B. Mazari, F. Duval","doi":"10.1109/ICSMC2.2003.1428279","DOIUrl":"https://doi.org/10.1109/ICSMC2.2003.1428279","url":null,"abstract":"For some years, the number of electronic devices in the car body increases consequently. Their huge integration number raise EMC unknown interferences that can disturb safety, comfort or functional devices on the electrical network. To guarantee the worst case network functioning, and assess equipments immunity to unwanted electrical phenomena, the accurate knowledge of network components (loads, sources, interconnections, spatial arrangement) is imperative. In order to predict disturbances and subsequently optimize the electrical network structure, this paper proposes an equipments input characterization method (loads, sources) based on a Thevenin approach. A simulation of a DC Motor electrical transient in switching state has been implemented","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130945541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
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