{"title":"Time-efficient EMI Analysis with Test Receivers","authors":"M. Stecher","doi":"10.1109/ISEMC.1986.7568202","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568202","url":null,"abstract":"A system is introduced consisting of two test receivers and an intelligent monitor/control ler which is optimized for time-efficient ana lysis of all types of interference. It offers a panoramic spectrum display for manual opera tion, fast EMI spectrum analysis of any de sired frequency range and the display of the test receivers' scan results. Post scan analy sis is possible with zooming, markers,, display lines, NB/BB identification and CISPR-QPweighting where necessary. Moreover test receivers have the necessary overload capability for the measurement of impulsive interferenceL2D,L3D the sensitivity required to measure interfe rence according to national and internatio nal standards the required accuracy due to built-in cali brators (tracking and/or pulse generators) the necessary well-defined resolution band widths","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125890194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Human ESD: the Phenomena, Their Reproduction and Some Associated Problems","authors":"M. Lutz, O. Frey, Warren Taylor","doi":"10.1109/ISEMC.1986.7568287","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568287","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"1998 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125709903","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Modeling of a Bulk Current Injection Setup for Susceptibility Threshold Measurements","authors":"M. F. Sultan","doi":"10.1109/ISEMC.1986.7568237","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568237","url":null,"abstract":"A mathematical model is formulated for a Bulk Current Injection (BCI) setup to evaluate the susceptibility of electronic components to electro magnetic interference. A comparison of calculated and measured data shows that the model predicts current distributions with reasonable accuracy. The sensitiv ity of standing wave patterns to a number of parameters has been investigated. This information can be used to reduce measurement variability and increase the correlatability of BCI results with measurements from other techniques.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"19 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132285656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Improved Technique for Measuring Induced Bridgewire Current","authors":"M. W. Shores","doi":"10.1109/ISEMC.1986.7568206","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568206","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134535589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Using the EMCAB to Your Advantage","authors":"J. E. Fos, T. Stelma","doi":"10.1109/ISEMC.1986.7568282","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568282","url":null,"abstract":"Electromagnetic Compatibility Advisory Board (EMCAB) identified. Electromagnetic Compatibility Program Plan (EMCPP) identified. Authorization for EMCAB and responsibilities toward EMC discipline through EMCAB charter. Establishing control of the EMCAB through the co-chairmen. EMCAB members identified. Coordinated exchange of technical EMI/EMC problem resolution. Duties and responsibilities pf EMCAB coordinator and members. Technical advisors and guest speakers Identified. Conducting an EMCAB. The Electromagnetic Compatibility Advisory Board (EMCAB) is a powerful tool for the EMC/TEMPEST engineer and it's value should not be underestimated or overlooked. Used properly, it can shorten your work load, open an avenue of information to you and give you access to a wealth of technical expertise not normally available to you as an individual. The EMCAB is an organized body within a government program dedicated to formulate controls and resolve problems of an electromagnetic nature in an orderly and timely fashion. It is the interface between the administrative and technical sides of a program where recommendations are made and action is initiated toward the resolution of electromagnetic anomalies. There are military specifications directing the establishment and formatting of the electromagnetic controls within a military program. Among these military specifica tions of note are MIL-E-6051D, ELECTROMAGNETIC COMPATIBILITY REQUIREMENTS, SYSTEMS, and MIL-HDBK237, ELECTROMAGNETIC COMPATIBILITY MANAGEMENT GUIDE FOR PLATFORMS, SYSTEMS AND EQUIPMENT. Taking a note from MIL-HDBK-237 we see that \"An EMC advisory board, hereafter called the EMCAB, can be established by the program manager as a major resource for review, advice and technical consultation on all EM (electromagnetic) aspects of the program. Experience has shown that a board should be established for all new platforms, platform modernizations and major complex systems.\" This authorizes the establishment of the EMCAB in accordance with the provisions of MIL-HDBK237 while MIL-E-6051D states that the EMCAB will provide means of expediting solution of problems, and establish high level channels of coordination. The details of operation and proposed charter for the board shall be included in the system electromagnetic compatibility plan. The military specification goes on further to say that members of the board will typically be the integration contractor, other invited subcontractors, and the government project offices that are involved. In addition, the board shall ensure that each participating associate, or subcontractor, and vendor establishes an individual effort in conso nance with the overall program EMC objectives; (a) Effective methods of monitoring EMC efforts and progress are established and followed, (b) Periodic EMC program design reviews are scheduled, and (c) All deficiencies noted are properly corrected. Recognizing the fact thaty these military specifications encourage and advise you ","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134355190","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Case for Identifying Contact Impedance as the Major Electromagnetic Hardness Degradation Factor","authors":"L. Hoeft","doi":"10.1109/ISEMC.1986.7568277","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568277","url":null,"abstract":"An examination of a wide range of experimental data shows that contact impedance rather than enlargement of apertures or changes in material con ductivity is the major electromagnetic hardness degradation factor. It is also the least understood.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132751592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis of N-Conductor Transmission Line Systems with Non-Linear Loads with Application to CAD Design of Digital Circuits","authors":"S. Castillo, C. Chan, R. Mittra","doi":"10.1109/ISEMC.1986.7568234","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568234","url":null,"abstract":"A computer model has been developed f or sim ulating N-conductor transm ission lines term inated w ith non linear complex loads. A modal analysis is used to describe incident and reflected waves on the transm ission lines. The loads are modeled as parallel R-C netw orks w ith a vol tage dependent resistance and source. For each load a m atrix differential equation is w ritten for the unknown load voltage due to some incident voltage. The m atrix equation is solved num erically using a first order finite difference approximation. The problem o f calculating crosstalk and pulse distortion in digital printed circuits has largely been ignored in the past due to the relatively low effective frequencies at w hich these circuits operate. However, in the past five years, the bandwidth o f digital devices has increased dram atically w ith the result that pulse risetim es and falltim es have decreased. At the same tim e, the density of digital devices on printed circuit cards has risen. The net result has been increasing problems due to crosstalk and pulse distortion in these circuits. The crosstalk and pulse dis tortion can cause false triggering o f level sen sitive devices w ith the result being a mal functioning circuit. Therefore, the need for a Computer Aided Design (CAD) package for analyzing coupling and pulse distortion in digital circuits has become evident. In th is paper, th e m icrostrip (Fig. l ) or buried m icrostrip lines are analyzed using a quasi-static model. The follow ing superposi tion integral is solved for the unknown charge distribution p (x ) in a given m ulti conductor printed circuit configuration using iterative techniques [ l l V ( x ) = f G (xr,x' ) p(x' )dx' CH2294-7/86/000-0174 $01,00(c )l986 IEEE 174 w here G (x ,x' ) = Green's function for the structure. The resulting charge distribution is used to solve for the per unit length capacitance and inductance m atrices o f the transmission lin e system .","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114230445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"EMV the Nemesis of C3I","authors":"W. Duff, Charles B. Sykes, J. Edwards","doi":"10.1109/ISEMC.1986.7568260","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568260","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117271847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Classification of ESD Hand/Metal Current Waves Versus Approach Speed, Voltage, Electrode Geometry and Humidity","authors":"P. Richman","doi":"10.1109/ISEMC.1986.7568286","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568286","url":null,"abstract":"ESD current waves for both real and simulated discharges are actually quite repeatable, at any given voltage and with specific electrode geometries. With these two variables fixed, discharge current waves are typically dis tributed among just two or three distinctive wave types. The controlling variable in this situation is approach speed of the charged, intruding mass with respect to the electronic victim. Waves are given as a function of all three variables. The waves are shown to be almost independent of relative humidity, for the specific test conditions of the Investi gation.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"760 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116124428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}