1986 IEEE International Symposium on Electromagnetic Compatibility最新文献

筛选
英文 中文
Time-efficient EMI Analysis with Test Receivers 使用测试接收机进行时效EMI分析
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568202
M. Stecher
{"title":"Time-efficient EMI Analysis with Test Receivers","authors":"M. Stecher","doi":"10.1109/ISEMC.1986.7568202","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568202","url":null,"abstract":"A system is introduced consisting of two test receivers and an intelligent monitor/control­ ler which is optimized for time-efficient ana­ lysis of all types of interference. It offers a panoramic spectrum display for manual opera­ tion, fast EMI spectrum analysis of any de­ sired frequency range and the display of the test receivers' scan results. Post scan analy­ sis is possible with zooming, markers,, display lines, NB/BB identification and CISPR-QPweighting where necessary. Moreover test receivers have the necessary overload capability for the measurement of impulsive interferenceL2D,L3D the sensitivity required to measure interfe­ rence according to national and internatio­ nal standards the required accuracy due to built-in cali­ brators (tracking and/or pulse generators) the necessary well-defined resolution band­ widths","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125890194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Human ESD: the Phenomena, Their Reproduction and Some Associated Problems 人类ESD:现象、再生产及相关问题
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568287
M. Lutz, O. Frey, Warren Taylor
{"title":"Human ESD: the Phenomena, Their Reproduction and Some Associated Problems","authors":"M. Lutz, O. Frey, Warren Taylor","doi":"10.1109/ISEMC.1986.7568287","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568287","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"1998 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125709903","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Modeling of a Bulk Current Injection Setup for Susceptibility Threshold Measurements 磁化率阈值测量的大电流注入装置建模
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568237
M. F. Sultan
{"title":"Modeling of a Bulk Current Injection Setup for Susceptibility Threshold Measurements","authors":"M. F. Sultan","doi":"10.1109/ISEMC.1986.7568237","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568237","url":null,"abstract":"A mathematical model is formulated for a Bulk Current Injection (BCI) setup to evaluate the susceptibility of electronic components to electro­ magnetic interference. A comparison of calculated and measured data shows that the model predicts current distributions with reasonable accuracy. The sensitiv­ ity of standing wave patterns to a number of parameters has been investigated. This information can be used to reduce measurement variability and increase the correlatability of BCI results with measurements from other techniques.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"19 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132285656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 46
Cross-Polarization Components in Inter-Antenna Coupling Calculations 天线间耦合计算中的交叉极化分量
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568236
A. Bhattacharyya, S. Kubina
{"title":"Cross-Polarization Components in Inter-Antenna Coupling Calculations","authors":"A. Bhattacharyya, S. Kubina","doi":"10.1109/ISEMC.1986.7568236","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568236","url":null,"abstract":"This paper examines the coand cross-polar char­ acteristics of antennas on the surface of a cylinder when the transmitting antenna and the observer are arbitrarily positioned. The theory is based on the analytical approach used by Pathak and Wang for the fields of a source radiating on a convex surface. It takes care of torsion. There is a different cross-polarization effect when both the transmitting and the receiving antennas are in the equatorial planes. The cross-polarized components E and E z f p p f z are not zeros even in the equatorial planes. The cross-polarized ratios have been computed and their variations with different parameters are presented. Introduction In EMC problems of antennas on complex structures, existing inter-antenna coupling programs such as IEMCAP [1] and AAPG [2] do not calculate the cross­ polarized components. In intra-system problems in­ volving high power levels for emitters and highly sensitive receivers, these components become important to consider. It has been found that not only is the actual coupling path of importance, but also its conse­ quence in the generation of cross-polarized field components along its trajectory. A close examination of the analytical approach of Pathak and Wang [3] is made for the case of antennas on cylindrical structures. Although this theory can predict the coand crosspolar components, some inconsistencies in the results are noted which deserve closer examination. Theory The surface electric and magnetic fields dfl̂ and dE due to a magnetic dipole moment dpm on a convex surface whose one radius of curvature is large compared to the other are given by [3], dHm (Q/Q') = ^ d p m (Q'){2Y0 (b'b[(l 4 ) V.CQ +D2 ( i ) 2(As U K ) + Ac V(?) + ^ T 02 (UK) VK))] + t’t[D2 + jL U K ) 2 (i-)2 (ASU K ) + Ac VK))] + (t'b + b't)[^-T0 (UK) VK))]} • D Gg(kt) and (1) dEJQ/Q’) = ^ d p m (Q'){2(b'n[(ljL) V(C) + v & ' ^ c? ))] + [T0 i t \" V (C )D } • D G0 (kt) (2) Similarity, the surface fields dHg and dEe on an arbitrary convex surface are given by dEe (Q/Q!) = ^ d p e (Q,){2Z0n ,n [ V © jL V(?) + 4 ) 2 (As V K ) + AC -UK)) + T02 i (UK) VK)]}D Gg (kt) and (3) dHe (Q/Q’) = tie(.Q'){2(n'b[(l i ) V K ) + Tq2 4 (UK) VK))] + n't [T0 £ (UK) VK))]} • D GQ(kt) (4) where Yg is the intrinsic impedance of the medium in which the structure is immersed; t = /az (cf>2-(l>2.)2+ (z2_zl)2 ’ the torsion factor T„ = Cot 6, where 6 is the angle of entry with the 1/3 cylinder axis; m = (k pg/2) ; £ = mt/pg ; Pg = a/Sin2 5; Ac is a blending function equal to unity for a cylinder. Expression for the Case of a Cylinder For the case of the cylinder with arbitrary posi­ tions of transmitting and receiving antennas, let (a,<f>' ,z') and (a,<f>,z) be the coordinates of transmit­ ting and receiving points. Then t and £ are given by t =v42 (<)>2 \"<l>j ) 2 + Cz 2 \"z l } 2 ? =>/a2 (<J>2 _<f>1 ) 2 + (z 2 \"zl ^ 2 * the angle of entry 6 with cylinder axis is given by tan 6 = a(d>2_<t>1)/(z2_zi^ and the torsion factor Tg = Cot o . With a","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"31 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134006015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Improved Technique for Measuring Induced Bridgewire Current 感应桥丝电流测量的改进技术
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568206
M. W. Shores
{"title":"Improved Technique for Measuring Induced Bridgewire Current","authors":"M. W. Shores","doi":"10.1109/ISEMC.1986.7568206","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568206","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134535589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Using the EMCAB to Your Advantage 利用EMCAB的优势
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568282
J. E. Fos, T. Stelma
{"title":"Using the EMCAB to Your Advantage","authors":"J. E. Fos, T. Stelma","doi":"10.1109/ISEMC.1986.7568282","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568282","url":null,"abstract":"Electromagnetic Compatibility Advisory Board (EMCAB) identified. Electromagnetic Compatibility Program Plan (EMCPP) identified. Authorization for EMCAB and responsibilities toward EMC discipline through EMCAB charter. Establishing control of the EMCAB through the co-chairmen. EMCAB members identified. Coordinated exchange of technical EMI/EMC problem resolution. Duties and responsibilities pf EMCAB coordinator and members. Technical advisors and guest speakers Identified. Conducting an EMCAB. The Electromagnetic Compatibility Advisory Board (EMCAB) is a powerful tool for the EMC/TEMPEST engineer and it's value should not be underestimated or overlooked. Used properly, it can shorten your work load, open an avenue of information to you and give you access to a wealth of technical expertise not normally available to you as an individual. The EMCAB is an organized body within a government program dedicated to formulate controls and resolve problems of an electromagnetic nature in an orderly and timely fashion. It is the interface between the administrative and technical sides of a program where recommendations are made and action is initiated toward the resolution of electromagnetic anomalies. There are military specifications directing the establishment and formatting of the electromagnetic controls within a military program. Among these military specifica­ tions of note are MIL-E-6051D, ELECTROMAGNETIC COMPATIBILITY REQUIREMENTS, SYSTEMS, and MIL-HDBK237, ELECTROMAGNETIC COMPATIBILITY MANAGEMENT GUIDE FOR PLATFORMS, SYSTEMS AND EQUIPMENT. Taking a note from MIL-HDBK-237 we see that \"An EMC advisory board, hereafter called the EMCAB, can be established by the program manager as a major resource for review, advice and technical consultation on all EM (electromagnetic) aspects of the program. Experience has shown that a board should be established for all new platforms, platform modernizations and major complex systems.\" This authorizes the establishment of the EMCAB in accordance with the provisions of MIL-HDBK237 while MIL-E-6051D states that the EMCAB will provide means of expediting solution of problems, and establish high level channels of coordination. The details of operation and proposed charter for the board shall be included in the system electromagnetic compatibility plan. The military specification goes on further to say that members of the board will typically be the integration contractor, other invited subcontractors, and the government project offices that are involved. In addition, the board shall ensure that each participating associate, or subcontractor, and vendor establishes an individual effort in conso­ nance with the overall program EMC objectives; (a) Effective methods of monitoring EMC efforts and progress are established and followed, (b) Periodic EMC program design reviews are scheduled, and (c) All deficiencies noted are properly corrected. Recognizing the fact thaty these military specifications encourage and advise you ","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134355190","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Case for Identifying Contact Impedance as the Major Electromagnetic Hardness Degradation Factor 确定接触阻抗为主要电磁硬度退化因素的案例
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568277
L. Hoeft
{"title":"The Case for Identifying Contact Impedance as the Major Electromagnetic Hardness Degradation Factor","authors":"L. Hoeft","doi":"10.1109/ISEMC.1986.7568277","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568277","url":null,"abstract":"An examination of a wide range of experimental data shows that contact impedance rather than enlargement of apertures or changes in material con­ ductivity is the major electromagnetic hardness degradation factor. It is also the least understood.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132751592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Analysis of N-Conductor Transmission Line Systems with Non-Linear Loads with Application to CAD Design of Digital Circuits n导体传输线系统非线性负载分析及其在数字电路CAD设计中的应用
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568234
S. Castillo, C. Chan, R. Mittra
{"title":"Analysis of N-Conductor Transmission Line Systems with Non-Linear Loads with Application to CAD Design of Digital Circuits","authors":"S. Castillo, C. Chan, R. Mittra","doi":"10.1109/ISEMC.1986.7568234","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568234","url":null,"abstract":"A computer model has been developed f or sim ulating N-conductor transm ission lines term inated w ith non­ linear complex loads. A modal analysis is used to describe incident and reflected waves on the transm ission lines. The loads are modeled as parallel R-C netw orks w ith a vol­ tage dependent resistance and source. For each load a m atrix differential equation is w ritten for the unknown load voltage due to some incident voltage. The m atrix equation is solved num erically using a first order finite difference approximation. The problem o f calculating crosstalk and pulse distortion in digital printed circuits has largely been ignored in the past due to the relatively low effective frequencies at w hich these circuits operate. However, in the past five years, the bandwidth o f digital devices has increased dram atically w ith the result that pulse risetim es and falltim es have decreased. At the same tim e, the density of digital devices on printed circuit cards has risen. The net result has been increasing problems due to crosstalk and pulse distortion in these circuits. The crosstalk and pulse dis­ tortion can cause false triggering o f level sen­ sitive devices w ith the result being a mal­ functioning circuit. Therefore, the need for a Computer Aided Design (CAD) package for analyzing coupling and pulse distortion in digital circuits has become evident. In th is paper, th e m icrostrip (Fig. l ) or buried m icrostrip lines are analyzed using a quasi-static model. The follow ing superposi­ tion integral is solved for the unknown charge distribution p (x ) in a given m ulti­ conductor printed circuit configuration using iterative techniques [ l l V ( x ) = f G (xr,x' ) p(x' )dx' CH2294-7/86/000-0174 $01,00(c )l986 IEEE 174 w here G (x ,x' ) = Green's function for the structure. The resulting charge distribution is used to solve for the per unit length capacitance and inductance m atrices o f the transmission lin e system .","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114230445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
EMV the Nemesis of C3I EMV是C3I的克星
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568260
W. Duff, Charles B. Sykes, J. Edwards
{"title":"EMV the Nemesis of C3I","authors":"W. Duff, Charles B. Sykes, J. Edwards","doi":"10.1109/ISEMC.1986.7568260","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568260","url":null,"abstract":"","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117271847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Classification of ESD Hand/Metal Current Waves Versus Approach Speed, Voltage, Electrode Geometry and Humidity 静电放电手/金属电流波与接近速度,电压,电极几何形状和湿度的分类
1986 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1986-09-01 DOI: 10.1109/ISEMC.1986.7568286
P. Richman
{"title":"Classification of ESD Hand/Metal Current Waves Versus Approach Speed, Voltage, Electrode Geometry and Humidity","authors":"P. Richman","doi":"10.1109/ISEMC.1986.7568286","DOIUrl":"https://doi.org/10.1109/ISEMC.1986.7568286","url":null,"abstract":"ESD current waves for both real and simulated discharges are actually quite repeatable, at any given voltage and with specific electrode geometries. With these two variables fixed, discharge current waves are typically dis­ tributed among just two or three distinctive wave types. The controlling variable in this situation is approach speed of the charged, intruding mass with respect to the electronic victim. Waves are given as a function of all three variables. The waves are shown to be almost independent of relative humidity, for the specific test conditions of the Investi­ gation.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"760 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116124428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 29
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信