{"title":"The Case for Identifying Contact Impedance as the Major Electromagnetic Hardness Degradation Factor","authors":"L. Hoeft","doi":"10.1109/ISEMC.1986.7568277","DOIUrl":null,"url":null,"abstract":"An examination of a wide range of experimental data shows that contact impedance rather than enlargement of apertures or changes in material con ductivity is the major electromagnetic hardness degradation factor. It is also the least understood.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1986.7568277","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
An examination of a wide range of experimental data shows that contact impedance rather than enlargement of apertures or changes in material con ductivity is the major electromagnetic hardness degradation factor. It is also the least understood.