Modeling of a Bulk Current Injection Setup for Susceptibility Threshold Measurements

Abstract

A mathematical model is formulated for a Bulk Current Injection (BCI) setup to evaluate the susceptibility of electronic components to electro­ magnetic interference. A comparison of calculated and measured data shows that the model predicts current distributions with reasonable accuracy. The sensitiv­ ity of standing wave patterns to a number of parameters has been investigated. This information can be used to reduce measurement variability and increase the correlatability of BCI results with measurements from other techniques.