{"title":"磁化率阈值测量的大电流注入装置建模","authors":"M. F. Sultan","doi":"10.1109/ISEMC.1986.7568237","DOIUrl":null,"url":null,"abstract":"A mathematical model is formulated for a Bulk Current Injection (BCI) setup to evaluate the susceptibility of electronic components to electro magnetic interference. A comparison of calculated and measured data shows that the model predicts current distributions with reasonable accuracy. The sensitiv ity of standing wave patterns to a number of parameters has been investigated. This information can be used to reduce measurement variability and increase the correlatability of BCI results with measurements from other techniques.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"19 6","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"46","resultStr":"{\"title\":\"Modeling of a Bulk Current Injection Setup for Susceptibility Threshold Measurements\",\"authors\":\"M. F. Sultan\",\"doi\":\"10.1109/ISEMC.1986.7568237\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A mathematical model is formulated for a Bulk Current Injection (BCI) setup to evaluate the susceptibility of electronic components to electro magnetic interference. A comparison of calculated and measured data shows that the model predicts current distributions with reasonable accuracy. The sensitiv ity of standing wave patterns to a number of parameters has been investigated. This information can be used to reduce measurement variability and increase the correlatability of BCI results with measurements from other techniques.\",\"PeriodicalId\":244612,\"journal\":{\"name\":\"1986 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"19 6\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1986-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"46\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1986 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1986.7568237\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1986.7568237","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling of a Bulk Current Injection Setup for Susceptibility Threshold Measurements
A mathematical model is formulated for a Bulk Current Injection (BCI) setup to evaluate the susceptibility of electronic components to electro magnetic interference. A comparison of calculated and measured data shows that the model predicts current distributions with reasonable accuracy. The sensitiv ity of standing wave patterns to a number of parameters has been investigated. This information can be used to reduce measurement variability and increase the correlatability of BCI results with measurements from other techniques.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
