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IEEE 1991 International Symposium on Electromagnetic Compatibility最新文献

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RFI effects analysis of an airport-installed HF transmitter on aircraft COMM/NAV receivers 机场安装的高频发射机对飞机COMM/NAV接收机的RFI影响分析
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148218
E. Joffe, J. Gavan
{"title":"RFI effects analysis of an airport-installed HF transmitter on aircraft COMM/NAV receivers","authors":"E. Joffe, J. Gavan","doi":"10.1109/ISEMC.1991.148218","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148218","url":null,"abstract":"Modern commercial aircraft increasingly depend on radio communication and navigation (COMM/NAV) aids in flight, and particularly when performing instrument landings. A medium-power high-frequency (HF) transmitter, installed in the Ben-Gurion (Tel-Aviv) International Airport was a source of concern, due to the possible radio frequency interference effects to essential airborne COMM/NAV systems, when most needed. An analysis based on a realistic scenario is presented, indicating that although the receivers' performance will be somewhat degraded, they will operate satisfactorily and provide a reliable COMM/NAV performance in flight and for landing. These results have been substantiated by actual measurements of COMM/NAV airborne receivers.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125986362","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Using the single point excitation technique to measure aperture impedance over a broad frequency range 利用单点激励技术在宽频率范围内测量孔径阻抗
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148258
L. Hoeft, J. Hofstra, W. Prather
{"title":"Using the single point excitation technique to measure aperture impedance over a broad frequency range","authors":"L. Hoeft, J. Hofstra, W. Prather","doi":"10.1109/ISEMC.1991.148258","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148258","url":null,"abstract":"Single point excitation for hardness surveillance (SPEHS) techniques have been used to produce surface fields over a broad frequency range (essentially 1 to 100 MHz). These fields were used to measure the aperture impedance of hardened and degraded windows and doors of the electromagnetic pulse (EMP) testbed aircraft (EMPTAC). Measurements were made using wing root (normal SPEHS) as well as antenna excitation. Above 1 MHz. aperture impedance is dominated by the aperture's transfer inductance. Values of aperture impedance were comparable to, but did not exactly match, those measured using the aperture tester technique. The SPEHS technique has great potential because it facilitates shielding and conductive penetration measurements when the aircraft is pressurized and/or in flight.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124455484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The influences of ICs' no-connection pins on noise immunity 集成电路非连接引脚对抗噪性的影响
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148263
H. Hsu, S. Nitta
{"title":"The influences of ICs' no-connection pins on noise immunity","authors":"H. Hsu, S. Nitta","doi":"10.1109/ISEMC.1991.148263","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148263","url":null,"abstract":"Experimental results that the existence of no-connection pins (open pins) of integrated circuits (ICs) degrades noise immunity and influences the oscillation phenomena occurring near threshold level are described. To evaluate the susceptibility of the ICs with open pins, the ratio of the output voltage of ICs with pins clamped through a series resistor to a power supply (no open pins) to the output voltage of ICs with open pins is proposed as an index, in the case that pulsive noise is applied to input line assigned to signal input. The influence of the open pins and these pins clamped through resistors to power supply on the noise immunity is quantitatively clarified. The cause of noise immunity degradation due to the existence of open pins and the cause of weakness of the clamping effect are detailed. The optimum method for clamping open pins is proposed.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121689465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
HDL vertically polarized CW instrumentation system calibration HDL垂直极化连续波仪器系统校准
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148273
J. Brackett, Y. Rosenberg, D. McDonald
{"title":"HDL vertically polarized CW instrumentation system calibration","authors":"J. Brackett, Y. Rosenberg, D. McDonald","doi":"10.1109/ISEMC.1991.148273","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148273","url":null,"abstract":"The HDL CW instrumentation system (CWIS) was developed to investigate electromagnetic pulse (EMP) coupling effects to transportable systems. The CWIS was fully calibrated by performing field mapping measurements, in both horizontal and vertical polarizations, of two test volumes. The vertical polarization calibration of the system is emphasized. A brief overview of the system is provided. Field mapping data is presented and analyzed. Measurements on simple electromagnetic shapes are presented and compared to theoretical computations.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122320743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Prediction of crosstalk due to showering arcs at switch contacts 开关触点阵雨弧串扰预测
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148256
S. W. Hall, C. R. Paul, K. Hardin, A.D. Nielsen
{"title":"Prediction of crosstalk due to showering arcs at switch contacts","authors":"S. W. Hall, C. R. Paul, K. Hardin, A.D. Nielsen","doi":"10.1109/ISEMC.1991.148256","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148256","url":null,"abstract":"The modeling and prediction of crosstalk in automotive wiring harnesses that is due to arcing at the contacts of mechanical switches are addressed. A model of the showering arc phenomenon at a switch contact is developed. This model is suitable for implementation in CAD codes such as SPICE, PSPICE, and PRECISE. The crosstalk is modeled using lumped-parameter circuits (lumped-pi). Experimental results are shown which validate the model and also indicate the severe crosstalk that can be produced by this showering arc.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116490485","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
The measurement of solar array discharges in a simulated space environment 模拟空间环境中太阳能电池阵放电的测量
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148227
T. Sterner, J. E. Mulholland
{"title":"The measurement of solar array discharges in a simulated space environment","authors":"T. Sterner, J. E. Mulholland","doi":"10.1109/ISEMC.1991.148227","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148227","url":null,"abstract":"A technique has been developed to monitor the radiated E-field of materials discharging in an electron environment, with chambers available for measuring the material discharges which are made of highly reflective materials. These chambers distort the radiated E-field due to their limited measurement area. The technique developed defines a method for correcting the distortion effects caused by the measurement facilities. This measurement technique is necessary when estimating the frequency content and signal strength of the radiated discharge. This technique allows for the prediction of the E-field coupling into receiver antennas onboard satellites.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130303894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Surge current distribution in building during a direct lightning stroke 直击雷击时建筑物内的浪涌电流分布
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148193
A. Sowa
{"title":"Surge current distribution in building during a direct lightning stroke","authors":"A. Sowa","doi":"10.1109/ISEMC.1991.148193","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148193","url":null,"abstract":"A direct lightning strike to a building may cause damage or interference in the operation of electronic equipment inside the structure and may even be dangerous to the people in the more critical case. In order to decide on an efficient lightning protection system, it is important to determine the lightning current distribution in the building. Knowledge of the current distribution is obtained from model measurements and from theoretical calculations. The strike points are assumed in different places on the building's roof. The results concerning the lightning current distribution in high and low buildings are presented and discussed.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132825415","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 32
Lightning overvoltages in wires within the buildings 建筑物内电线的雷电过电压
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148192
A. Sowa
{"title":"Lightning overvoltages in wires within the buildings","authors":"A. Sowa","doi":"10.1109/ISEMC.1991.148192","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148192","url":null,"abstract":"Electromagnetic fields generated by lightning currents may cause damage or interference in the operation of electronic and electric systems. Particularly hazardous to equipment operating within a building is a direct lightning strike to the building or its vicinity. For this reason, a theoretical determination of currents and voltages induced by lightning electromagnetic pulses in simple arrangements of unshielded cables is presented. These calculations are carried out with the help of a mathematical function which exactly describes the shape of the lightning current. The values of induced voltages are evaluated during simulation tests under natural conditions.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131346052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Software as a tool for controlling EMI/EMC 软件作为控制EMI/EMC的工具
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148213
T. Boone
{"title":"Software as a tool for controlling EMI/EMC","authors":"T. Boone","doi":"10.1109/ISEMC.1991.148213","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148213","url":null,"abstract":"Traditional methods of controlling electromagnetic interference (EMI) typically deal with hardware-based solutions such as grounding, bonding, shielding, filtering, and equipment placement. With the evolution of microprocessor- and computer-controlled systems, system flexibility and effectiveness increase up to a point where ambiguities reduce effectiveness and introduce the potential for a new form of EMI. Software, however, can become a tool for system designers, and E/sup 3/ and software engineers to use in controlling EMI and managing system electromagnetic compatibility (EMC).<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116032788","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A method of generating 200-990 MHz electric fields for electromagnetic susceptibility testing 一种产生200- 990mhz电磁场用于电磁敏感性测试的方法
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148207
C. A. Pratt
{"title":"A method of generating 200-990 MHz electric fields for electromagnetic susceptibility testing","authors":"C. A. Pratt","doi":"10.1109/ISEMC.1991.148207","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148207","url":null,"abstract":"A method for generating constant-amplitude electric fields used for swept-frequency electromagnetic susceptibility (EMS) testing in the frequency range 200-990 MHz is developed. The test equipment used to generate the fields has parameters which vary as a function of frequency, such as antenna factors, cable loss, reflection coefficient of the measurement site, amplifier gain, etc. The output voltage of the signal generator is increased or decreased as the frequency is swept to compensate for these parameters and produce a constant-amplitude electric field. The method is implemented using a programmable spectrum analyzer, in which the voltage corresponding to the electric field measured in a characterization run is stored in a data file. Another program compares this voltage with that corresponding to the desired field strength, and stores the difference in a second data file. Using a third computer program, this voltage difference is used to control the input to a programmable signal generator to generate a constant-amplitude electric field.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"137 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134217275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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