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IEEE 1991 International Symposium on Electromagnetic Compatibility最新文献

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Transient analysis for electromagnetic exciting to a wire through a slot in a conducting screen 通过导电屏槽对导线进行电磁激励的瞬态分析
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148180
Y. Yao, L. Jen
{"title":"Transient analysis for electromagnetic exciting to a wire through a slot in a conducting screen","authors":"Y. Yao, L. Jen","doi":"10.1109/ISEMC.1991.148180","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148180","url":null,"abstract":"A method of solution and some results for the electromagnetic transient current response of a finite-length wire due to a transient planar wave excitation through a slot aperture are obtained using the singularity expansion method (SEM). The pertinent SEM parameters are calculated. The equivalent transient magnetic currents in the slot region and the transient electric currents on the wire are found as functions of time for a step electromagnetic excitation.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"354 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124476447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Study on increasing the surge capability of a lightning surge protection semiconductor device 提高雷电浪涌保护半导体器件浪涌能力的研究
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148278
H. Satoh
{"title":"Study on increasing the surge capability of a lightning surge protection semiconductor device","authors":"H. Satoh","doi":"10.1109/ISEMC.1991.148278","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148278","url":null,"abstract":"Design techniques for increasing the surge capability of a bidirectional SCR (silicon controlled rectifier) lightning surge protection device for communications equipment are described. The relationships between surge capability and doping profiles with different p-base widths and n-base impurity concentrations are studied by analyzing failure modes and surge response characteristics. A narrow p-base width is effective for increasing surge capability because it can reduce turn-on energy dissipation that leads to hot-spot failure. Furthermore, reducing the on-state energy dissipation can increase surge capability without increasing device size.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124690101","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
ESD multiple discharges ESD多次放电
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148229
R. C. Pepe
{"title":"ESD multiple discharges","authors":"R. C. Pepe","doi":"10.1109/ISEMC.1991.148229","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148229","url":null,"abstract":"The electrostatic discharge (ESD) multiple discharge phenomenon is explored. In an effort to present a concise argument, the discussion is presented in terms of equipment testing engaging the body metallic model. For clarity, a brief introduction to the topic of ESD multiple discharge is provided. This includes an abridged discussion of the body metallic model, and air and contact discharge. A thorough investigation of the actual ESD multiple discharge is conducted. The ESD multiple discharge discussion consists of a description of the event and theories attempting to explain its existence. Experimental analysis with oscilloscope traces is used to support the contentions.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115957550","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A new measurement technique for the control of the integrity of shielded rooms 一种控制屏蔽室完整性的新型测量技术
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148194
F. Broydé, E. Clavelier
{"title":"A new measurement technique for the control of the integrity of shielded rooms","authors":"F. Broydé, E. Clavelier","doi":"10.1109/ISEMC.1991.148194","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148194","url":null,"abstract":"An innovative electronic system for measuring and controlling the shielding effectiveness of a screened room is presented. It has the advantage of making continuous measurements possible. The basic property of the system described is that it allows the use of very narrow receiver bandwidth without major cost increase. The two most obvious uses of this narrow bandwidth are an increased sensitivity or an improved immunity.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122221529","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Unspecified LISN parameters can cause emissions to appear greater than 10 dB high 未指定的LISN参数可能导致排放物看起来大于10db高
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148279
K. Hall
{"title":"Unspecified LISN parameters can cause emissions to appear greater than 10 dB high","authors":"K. Hall","doi":"10.1109/ISEMC.1991.148279","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148279","url":null,"abstract":"Experimental findings of the testing of two different products using FCC/VDE LISNs from several manufacturers are summarized. The initial problem, inconsistent measurement of emissions, was noted on one UUT; while measurement of emissions on another UUT were consistent. Modifying the grounding of LISN VA Hash 2 allowed more reproducible measurements compared to LISNs VC or VD which meet the impedance specifications and had a low internal ground impedance.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131999648","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Electromagnetic wave scattering by buildings and objects in radio and mobile communication 无线电和移动通信中建筑物和物体的电磁波散射
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148223
Y. Miyazaki, W. Asano
{"title":"Electromagnetic wave scattering by buildings and objects in radio and mobile communication","authors":"Y. Miyazaki, W. Asano","doi":"10.1109/ISEMC.1991.148223","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148223","url":null,"abstract":"The scattering and diffraction characteristics of several basic objects with respect to electromagnetic (EM)-wave propagation in radio communication are shown using the finite element method (FEM) and the boundary element method (BEM). These basic problems are needed to evaluate scattering and diffraction by complex-shaped objects. The properties related to near fields and induced currents are clarified.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125623506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Resistively-tapered-dipole electric-field probes up to 40 GHz 电阻锥形偶极电场探头高达40 GHz
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148233
J. Randa, M. Kanda, R. Orr
{"title":"Resistively-tapered-dipole electric-field probes up to 40 GHz","authors":"J. Randa, M. Kanda, R. Orr","doi":"10.1109/ISEMC.1991.148233","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148233","url":null,"abstract":"An electric-field probe for use as a transfer standard at frequencies up to 40 GHz is developed. The lower frequency cutoff is below 1 MHz. The design is based on the resistively tapered dipole (RTD) probes developed for frequencies up to 18 GHz. Those probes used 8-mm tapered dipoles. In this study, 6-mm, 4-mm, and 2-mm dipoles are used to extend the frequency range. Because the probes are isotropic, have relatively flat frequency response, and have a response which drops off outside their operating frequency range, they could also be used as hazard meters.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124194565","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Implications of the high-power microwave weapon threat in electronic system design 高功率微波武器威胁对电子系统设计的启示
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148257
E. Van Keuren, J. Knighten
{"title":"Implications of the high-power microwave weapon threat in electronic system design","authors":"E. Van Keuren, J. Knighten","doi":"10.1109/ISEMC.1991.148257","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148257","url":null,"abstract":"High-power microwave (HPM) sources have been under investigation for several years as potential weapons for a variety of combat, sabotage, and terrorist applications. Due to classification restrictions, details of this work are relatively unknown outside of the military community and its contractors. A brief, unclassified overview is provided, and introduction to HPM concepts is given. The key point to recognize is the insidious nature of HPM. Due to the gigahertz-band frequencies (4 to 20 GHz) involved, HPM has the capability to penetrate not only radio front-ends, but also the most minute shielding penetrations throughout the equipment. At sufficiently high levels, as discussed, the potential exists for significant damage to devices and circuits. For these reasons, HPM should be of interest to the broad spectrum of EMC practitioners. Some introductory concepts are presented. A range of topics. including threats, sources, and possible protective techniques are discussed.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127911719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Closed form expressions for computing the occupied bandwidth of PCM/PSK/PM signals 计算PCM/PSK/PM信号占用带宽的封闭形式表达式
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148266
T.M. Nguyen
{"title":"Closed form expressions for computing the occupied bandwidth of PCM/PSK/PM signals","authors":"T.M. Nguyen","doi":"10.1109/ISEMC.1991.148266","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148266","url":null,"abstract":"A computational technique to determine the occupied bandwidth for a class of PCM/PSK/PM signals is presented. The signals considered use either a squarewave or sinewave subcarrier. Closed-form expressions for the occupied bandwidth as a function of the subcarrier frequency-to-bit-rate ratio with modulation index as a parameter are derived using linear-fitting techniques. It is found that the occupied bandwidth for squarewave subcarrier at low modulation index is about 10 to 15 times larger than the sinewave.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114439210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Reference antenna options for 309 MHz to 80 MHz 参考天线选项为309 MHz至80 MHz
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148235
C. Brench, B. L. Brench
{"title":"Reference antenna options for 309 MHz to 80 MHz","authors":"C. Brench, B. L. Brench","doi":"10.1109/ISEMC.1991.148235","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148235","url":null,"abstract":"There are two antenna presently used as the reference for radiated emission requirements. These are the halfwave tuned dipole, as required by the FCC, and the short dipole (resonant at 80 MHz) as required by CISPR. In a previous paper, (C.E. Brench, 1990) the difficulty of correlating these antennas to each other and to other commonly used antennas for vertically polarized emissions was examined. Some attractive options to these antennas for the 30 MHz to 80 MHz range are examined.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"183 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121026648","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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