IEEE 1991 International Symposium on Electromagnetic Compatibility最新文献

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One appraisal of composite shielding 复合屏蔽的一种评价
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148178
W. E. Stewart
{"title":"One appraisal of composite shielding","authors":"W. E. Stewart","doi":"10.1109/ISEMC.1991.148178","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148178","url":null,"abstract":"Weight is at a premium when designing for space applications. Equipment housings must be as light as possible and still meet both structural and electromagnetic shielding requirements. The favorable strength to weight properties of composite materials are well known. To reduce the weight of space avionics equipment, Honeywell initiated a program to examine the suitability of composite materials, for electromagnetic interference (EMI) shielding. The composite material investigated was an epoxy resin, filled 40% by weight with carbon fibers. The volume resistivity of the composite material was estimated to be 100 Omega -cm. The results of this investigation show that for some applications, composite materials may be used for EMI shielding without degrading EMI performance.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132018423","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Interference prediction for deep space spacecraft from ground stations: interference to the Galileo deep space spacecraft from the GOMS geostationary network
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148215
D. Bishop
{"title":"Interference prediction for deep space spacecraft from ground stations: interference to the Galileo deep space spacecraft from the GOMS geostationary network","authors":"D. Bishop","doi":"10.1109/ISEMC.1991.148215","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148215","url":null,"abstract":"A technique to predict the interference power spectral density from a ground station to a spacecraft in deep space is described. A computer simulation that performs the interference prediction throughout the complete mission is described. The distance between the ground station and the deep space spacecraft is computed. Off-axis antenna gains of the ground station and deep space spacecraft are used in the power spectral density computation. The simulation is used to predict the interference power spectral density from the Russian GOMS ground stations to the Galileo spacecraft. The time that the interference power spectral density is above the Galileo thermal noise density is predicted.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129171721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electrical fast transient (EFT) testing-an overview 电快速瞬变(EFT)测试综述
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148240
B. Cormier, W. Boxleitner
{"title":"Electrical fast transient (EFT) testing-an overview","authors":"B. Cormier, W. Boxleitner","doi":"10.1109/ISEMC.1991.148240","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148240","url":null,"abstract":"Tests have been developed which simulate a common, previously neglected, type of real-world interference, the electrical fast transient (EFT). An overview of the EFT is presented. The need for harmonized standards, test setups, and procedures, all of which are being developed, is discussed. EFT effects on circuits, test standards, generator parameters, coupling/decoupling methods, test severity levels, and equipment setup, including ground reference planes are detailed. Also presented is a brief look at the need for higher pulse repetition rates and higher severity levels.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"417 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124182643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
A possibility of correction of vital processes in plant cell with microwave radiation 用微波辐射校正植物细胞生命过程的可能性
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148225
I. Petrov, T. Moiseeva, E. Morozova
{"title":"A possibility of correction of vital processes in plant cell with microwave radiation","authors":"I. Petrov, T. Moiseeva, E. Morozova","doi":"10.1109/ISEMC.1991.148225","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148225","url":null,"abstract":"Based on earlier data about microwave radiation (MWR)-induced plant cell membrane potential changes and plant enzymatic system activation induced by these changes, investigations were held to determine the possibility of using microwave correction methods to raise productivity for certain vegetables. The experiments, held both in laboratory and hothouse conditions, have shown that, for any plant culture, the microwave treatment regimes that lead to reliable, beneficial physiological effects (namely seed sprouting rate increase, acceleration of seedling development, and green-mass weight increase) can be chosen. It is suggested that the data exposed are of interest for the development of new ecologically pure plant productivity raising technologies utilizing the sources of electromagnetic radiation, used earlier for military purposes.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116117647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
The EMC course: bridging the gap between academic preparation and industrial needs EMC课程:弥合学术准备和工业需求之间的差距
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148246
R. Nelson
{"title":"The EMC course: bridging the gap between academic preparation and industrial needs","authors":"R. Nelson","doi":"10.1109/ISEMC.1991.148246","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148246","url":null,"abstract":"A course entitled 'Designing for Electromagnetic Compatibility' was recently offered at North Dakota State University. The course had both a lecture and measurements component. A unique supplement to the measurements component was made possible by area industries. This study describes the course development and content.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114933798","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Non-invasive method for measuring or monitoring the shielding effectiveness of equipment enclosures exposed to high electromagnetic power 测量或监测暴露在高电磁功率下的设备外壳屏蔽效能的非侵入性方法
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148179
J. Quine, K.E. Larsen, G.A. Wellenc, J.P. Streeter, A. Pesta, M.F. Siefert
{"title":"Non-invasive method for measuring or monitoring the shielding effectiveness of equipment enclosures exposed to high electromagnetic power","authors":"J. Quine, K.E. Larsen, G.A. Wellenc, J.P. Streeter, A. Pesta, M.F. Siefert","doi":"10.1109/ISEMC.1991.148179","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148179","url":null,"abstract":"Summary form only given. Shielding effectiveness (SE) of an equipment enclosure with leakage holes on the outer surface has been determined conventionally as the ratio of voltages measured with B-dot probes placed inside the enclosure and on the outside surface of the enclosure. A simple and practical method for measuring SE without the use of internal probes is presented. The method can be used to measure or monitor the SE of enclosures for equipment under development or installed equipment.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126737885","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Radiation and coupling between antennas mounted on a complex metallic structure 安装在复杂金属结构上的天线之间的辐射和耦合
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148237
M. Balma, D. Bresciani
{"title":"Radiation and coupling between antennas mounted on a complex metallic structure","authors":"M. Balma, D. Bresciani","doi":"10.1109/ISEMC.1991.148237","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148237","url":null,"abstract":"A hybrid uniform theory of diffraction-method of moments (UTD-MOM) technique is applied to evaluate the radiation and the coupling among antennas mounted on the same structure. The most common application is represented by the electromagnetic characterization of an aircraft provided with either aperture antennas or wire antennas. After expanding the radiated far field with spherical sampling functions, both the directivity and the radiated power are valuated by means of an analytical integration on the radiation pattern. The coupling among the antennas is computed and compared with some measurements performed on some single geometrical bodies.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127479114","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Design of a communications system for multiple telemetry data channels operating simultaneously with a coherent turn-around ranging channel 多遥测数据通道同时工作的通信系统设计与一个连贯的回转测距通道
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148199
T.M. Nguyen, S.M. Hinedi, J.M. Gevargiz
{"title":"Design of a communications system for multiple telemetry data channels operating simultaneously with a coherent turn-around ranging channel","authors":"T.M. Nguyen, S.M. Hinedi, J.M. Gevargiz","doi":"10.1109/ISEMC.1991.148199","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148199","url":null,"abstract":"A simple technique to design a phase-modulated (PM) residual carrier communications link for optimum performance is presented. The emphasis is on two data channels which are operated simultaneously with a ranging signal. The data channels use PCM/PM and PCM/PSK/PM modulation schemes for high and low data rate channels, respectively. The technique proposed selects the optimum subcarrier frequency to minimize the interference between the two data channels, and modulation indices for optimum balance of power between the two telemetry data channels and the coherent turnaround ranging channel. The selected set of optimum modulation indices will allow for the specified bit error rate (BER) degradations in the two data channels. Although this technique is proposed to optimize the performance degradation for two data channels, generalizations can be made for more than two data channels.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125922575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Parasitic capacitances can cause demodulation RFI to differ in inverting and noninverting operational amplifier circuits 寄生电容会导致反相和非反相运算放大器电路中的解调RFI不同
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148203
H. Ghadamabadi, J. Whalen
{"title":"Parasitic capacitances can cause demodulation RFI to differ in inverting and noninverting operational amplifier circuits","authors":"H. Ghadamabadi, J. Whalen","doi":"10.1109/ISEMC.1991.148203","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148203","url":null,"abstract":"The demodulation RFI responses of an inverting operational amplifier (op amp) circuit and a noninverting op amp circuit are compared. The intended voltage gain of the inverting op amp circuit is A/sub 1/=-R2/R1=-10. The intended linear voltage gain of the noninverting op amp circuit is A/sub N1/=(R1+R2)/R1=11. For both circuits, the resistor values are R1=10 k Omega and R2=100 k Omega . Analysis shows that parasitic capacitances C/sub in/ (between the inverting and noninverting inputs of the op amp) and CR1 (shunted across R1) cause the inverting op amp circuit to have better RFI immunity than the noninverting op amp circuit. The derivation is based on the hypothesis that the demodulation RFI response is caused by a second-order nonlinearity so that a 3-dB reduction in the linear voltage gain causes the second-order demodulation RFI response characterized by the transfer function H/sub 2/ to be reduced by 6 dB. For the assumed values of C/sub in/=8 pF and CR1=0.4 pF. the measured and calculated values of the difference between H/sub 2/ values for the inverting and noninverting circuits were in good agreement.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129104457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A radar-to-radar interference prediction model 雷达对雷达干扰预测模型
IEEE 1991 International Symposium on Electromagnetic Compatibility Pub Date : 1991-08-12 DOI: 10.1109/ISEMC.1991.148214
T. Foreman
{"title":"A radar-to-radar interference prediction model","authors":"T. Foreman","doi":"10.1109/ISEMC.1991.148214","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148214","url":null,"abstract":"The radar interference prediction program (RIPP) is described. RIPP is a computer model that predicts interference between radars assuming antenna-to-antenna coupling. The measure of effect that RIPP calculates is the probability of interference (P/sub i/). P/sub i/ is defined as the probability that the interference-to-noise ratio (INR) exceeds the 50% probability of detection threshold. Results of a sample analysis are presented. The RIPP model assumes that the radars are in the same or adjacent bands. It also assumes that the radars are located in the antenna far field. This program has been used by the US Navy to determine the possible levels of interference between two radars and to select compatible frequency assignments.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130206534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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