{"title":"电快速瞬变(EFT)测试综述","authors":"B. Cormier, W. Boxleitner","doi":"10.1109/ISEMC.1991.148240","DOIUrl":null,"url":null,"abstract":"Tests have been developed which simulate a common, previously neglected, type of real-world interference, the electrical fast transient (EFT). An overview of the EFT is presented. The need for harmonized standards, test setups, and procedures, all of which are being developed, is discussed. EFT effects on circuits, test standards, generator parameters, coupling/decoupling methods, test severity levels, and equipment setup, including ground reference planes are detailed. Also presented is a brief look at the need for higher pulse repetition rates and higher severity levels.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"417 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Electrical fast transient (EFT) testing-an overview\",\"authors\":\"B. Cormier, W. Boxleitner\",\"doi\":\"10.1109/ISEMC.1991.148240\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Tests have been developed which simulate a common, previously neglected, type of real-world interference, the electrical fast transient (EFT). An overview of the EFT is presented. The need for harmonized standards, test setups, and procedures, all of which are being developed, is discussed. EFT effects on circuits, test standards, generator parameters, coupling/decoupling methods, test severity levels, and equipment setup, including ground reference planes are detailed. Also presented is a brief look at the need for higher pulse repetition rates and higher severity levels.<<ETX>>\",\"PeriodicalId\":243730,\"journal\":{\"name\":\"IEEE 1991 International Symposium on Electromagnetic Compatibility\",\"volume\":\"417 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-08-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1991 International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1991.148240\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1991 International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1991.148240","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electrical fast transient (EFT) testing-an overview
Tests have been developed which simulate a common, previously neglected, type of real-world interference, the electrical fast transient (EFT). An overview of the EFT is presented. The need for harmonized standards, test setups, and procedures, all of which are being developed, is discussed. EFT effects on circuits, test standards, generator parameters, coupling/decoupling methods, test severity levels, and equipment setup, including ground reference planes are detailed. Also presented is a brief look at the need for higher pulse repetition rates and higher severity levels.<>