{"title":"Compact anechoic chamber for immunity test and EMI noise measurement","authors":"K. Ishino, Y. Hashimoto, M. Okamura, Y. Shimizu","doi":"10.1109/ISEMC.1991.148271","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148271","url":null,"abstract":"The distribution of the electromagnetic field in the compact anechoic chamber consisting of four walls, ceiling, and floor with ferrite absorbing materials was investigated. The compact anechoic chamber used for both immunity test and electromagnetic interference (EMI) noise measurement was developed by improved ferrite absorber. The compact chamber was extremely uniform, and the maximum deviation is less than 6 dB in the vertical plane. The site attenuation characteristics in the compact chamber were in good agreement with those in the open-field test site.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134584585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Hoeft, R. Karaskiewicz, J. Hofstra, W. Prather, W. R. Ayres
{"title":"Comparison of R/sup 2/SPG waveforms with simulated EMP","authors":"L. Hoeft, R. Karaskiewicz, J. Hofstra, W. Prather, W. R. Ayres","doi":"10.1109/ISEMC.1991.148242","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148242","url":null,"abstract":"Measurements were made on three cables in the electromagnetic pulse (EMP) testbed aircraft (EMPTAC) using the horizontally polarized dipole (HPD) and TRESTLE EMP simulators as well as the random repetitive square-wave pulse generator (R/sup 2/SPG) and a damped sine-wave generator. The currents were analyzed in both the time and frequency domains. The R/sup 2/SPG produced a greater induced current, by a factor of 4 to 60, than either of the EMP simulators. The pulsewidths and the frequency content were similar for all of the test points obtained with the R/sup 2/SPG and EMP simulators, and, by careful selection of the charge and feed cables, cold be made essentially identical. This confirms the assumption that the R/sup 2/SPG excited the cable system at its resonant frequency. The amplitudes of the R/sup 2/SPG and the damped sine-wave generator were closer to each other in both the time and frequency domains. The damped sine-wave generator was able to couple more energy to the cable when the lowest carrier frequencies (0.1 and 1 MHz) were used. On the other hand, the damped sine-wave current transient had a much narrower bandwidth than the R/sup 2/SPG-induced current transient. Thus the R/sup 2/SPG waveform was much more suitable for upset testing than the damped sine-wave.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133657107","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Speeding up quasi peak weighting EMI tests","authors":"K.-O. Muller","doi":"10.1109/ISEMC.1991.148206","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148206","url":null,"abstract":"The objective of electromagnetic interference (EMI) measurements is to determine if the emitted electromagnetic energy is low enough to fulfil the desired electromagnetic compatibility. Standards for EMI define maximum limits for the emission of interfering radio frequency (RFI) energy. The purpose of EMI measurements is, in most cases, to find out, whether or not the equipment under test (EUT) meets the limits. Two different principles to reduce time consumption of quasi-peak (QP) EMI measurements are explained. The two may be combined to minimize the test time.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116406120","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Signal distortion and EM radiation of clock distribution net on multichip module","authors":"Shi Yu, F. Chao","doi":"10.1109/ISEMC.1991.148267","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148267","url":null,"abstract":"The clock distribution is important in high-speed multichip module or printed circuit board design. Because the clock distribution net is long and carries the highest frequency signal in the system, it is one of the major sources of electromagnetic (EM) radiation. On the other hand, the clock signal is the time base of all synchronized components, so the waveform and timing skew should be controlled carefully. There are many kinds of clock routing methods, such as daisy chain, control stub length route, star route, and H-type route. Both the signal distortion and the radiation characteristics of the star and the H-type route are studied. The placement of the IC chip in each of the two kinds of distribution net is the same.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130385546","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The prediction of the EMC performance of electronic systems prior to fabrication","authors":"D. Wood","doi":"10.1109/ISEMC.1991.148202","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148202","url":null,"abstract":"The benefit to product development costs of applying computer-aided design (CAD) techniques to electromagnetic compatibility (EMC) early in the design life-cycle has been well established for some time. The methodology behind the development of a software-based engineering approach, known as EMCAD, to the predictive assessment of the EMC performance of large, distributed systems such as telecommunications networks early in the design and procurement stages is described. The core of this methodology is a software algorithm to predict the EMC performance of a printed circuit board (PCB) designed in a computer-aided engineering (CAE) environment. System designers can then apply this algorithm to other software packages either existing or under development, to assess the likely performance of the overall system at the earliest possible stage prior to fabrication and installation.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128869520","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Miyake, Y. Umezu, Y. Sagawa, T. Morita, R. Yoshino
{"title":"Investigation related to construction method and performance of an electromagnetic shielded enclosure","authors":"S. Miyake, Y. Umezu, Y. Sagawa, T. Morita, R. Yoshino","doi":"10.1109/ISEMC.1991.148197","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148197","url":null,"abstract":"Problems in construction of electromagnetic shielded enclosures include the metal foils and metal plates used widely as shield materials. Model experiments were performed in an electromagnetic compatibility (EMC) laboratory constructed by the authors for the purpose of measuring the electromagnetic shielding effectiveness of construction materials, parts, etc. A real-life scale model was created for measuring the electromagnetic shielding effectiveness with respect to simple processing methods for connection joints and with respect to defects in the shield layer caused by bolt holes, nail holes, and other construction-related defects in metal foil and metal plate. Results from the experiments are outlined.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121672201","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reciprocity in EMI-EMC","authors":"R.L. Coren","doi":"10.1109/ISEMC.1991.148210","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148210","url":null,"abstract":"The basis of and errors in interpreting the law of reciprocity are reviewed and applied to conducted and radiated electromagnetic interference-electromagnetic compatibility (EMI-EMC). Conditions for reciprocity include reversibility and passivity of elements in the reciprocal system. The law is expressed in circuit form and the reciprocal signals are clearly distinguished. Symmetric and asymmetric line filters are used as examples of reciprocity in conducted interference. It is shown that an incompletely shielded circuit can be regarded as an antenna, allowing one to establish radiation reciprocity between it and a measuring antenna. Some difficulties encountered in EMI-EMC measurements that give the impression of reciprocity being violated are discussed.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122628855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electromagnetic radiation from a VLSI package and heatsink configuration","authors":"C.F. Lee, K. Li, S. Y. Poh, R. Shin, J. Kong","doi":"10.1109/ISEMC.1991.148262","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148262","url":null,"abstract":"The electromagnetic radiation from a very large scale integration (VLSI) chip package and heatsink structure is analyzed by means of the finite-difference-time-domain (FD-TD) method. The FD-TD algorithm implemented incorporates a multizone gridding scheme to accommodate fine grid cells in the vicinity of the heatsink and package cavity and sparse gridding in the remainder of the computational domain. The issues pertaining to the effects of the heatsink in influencing the overall radiating capacity of the configuration are addressed. Analyses are facilitated by using simplified heatsink models and by using dipole elements as sources of electromagnetic energy to model the VLSI chip. The potential for enhancement of spurious emissions by the heatsink structure is illustrated. For heatsinks of typical dimensions, resonance is possible within the low gigahertz frequency range. The potential exploitation of the heatsink as an emissions shield by appropriate implementation schemes is discussed and evaluated.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122629102","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Comparative susceptibility study of pulse and constant amplitude illumination of wires over ground planes","authors":"K. Slattery","doi":"10.1109/ISEMC.1991.148243","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148243","url":null,"abstract":"Previous studies have shown the predicted voltage that can be impressed across a load when a wire over ground is illuminated by a constant amplitude plane wave. This study extends that work to the case of a wire over ground illuminated by a radar pulse. Three different pulsewidths are studied, 1 mu s, 100 ns, and 10 ns. It is shown that the two types of illumination are quite similar in their effect, with the major difference appearing at the radar signal frequency. As a final comparison, constant amplitude and pulse illumination are compared with illumination by a lightning-like pulse.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123162731","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Standardized automotive load dump testing","authors":"J. Dimech","doi":"10.1109/ISEMC.1991.148254","DOIUrl":"https://doi.org/10.1109/ISEMC.1991.148254","url":null,"abstract":"The intent of this study is to depict the load dump phenomenon in the electrical system of an automobile. The factors that determine the severity of the pulse and their effect on the variety of electronic components found in the cars of today are discussed. A detailed review of the existing load dump standards including pulse parameters, test methods and required equipment are included along with recommended amendments. This study clarifies the misconceptions that have arisen in the recent past, and addresses the problems associated with the simulation of a load dump. Once these misunderstandings are resolved and the inherent problems understood, a clear definition of the load dump simulation and methodology is conceived.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126257935","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}