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2015 85th Microwave Measurement Conference (ARFTG)最新文献

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Analyzing uncertainty matrices associated with multiple S-parameter measurements 分析与多个s参数测量相关的不确定矩阵
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162898
N. Ridler, M. Salter
{"title":"Analyzing uncertainty matrices associated with multiple S-parameter measurements","authors":"N. Ridler, M. Salter","doi":"10.1109/ARFTG.2015.7162898","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162898","url":null,"abstract":"This paper presents a detailed analysis of uncertainty matrices (i.e. measurement covariance matrices) associated with multiple complex-valued microwave scattering (S-) parameter measurements. The analysis is based on forming combinations of (2 × 2) sub-matrices from selected elements in the uncertainty matrix and using these sub-matrices to define uncertainty ellipses in two-dimensional measurement planes. These uncertainty ellipses can be used to assess the quality, accuracy and validity of the measurements. A simple example is given using measurements made on a waveguide mismatched line section at frequencies from 75 GHz to 110 GHz. The analysis is also useful when multiple S-parameter measurements are used as input quantities for measurement models used to determine other measurement quantities (i.e. as output quantities).","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"112 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121351344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A comparison of MIMO antenna efficiency measurements performed in Anechoic Chamber and Reverberation Chamber 在消声室和混响室中进行MIMO天线效率测量的比较
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162900
T. Loh, Wanquan Qi
{"title":"A comparison of MIMO antenna efficiency measurements performed in Anechoic Chamber and Reverberation Chamber","authors":"T. Loh, Wanquan Qi","doi":"10.1109/ARFTG.2015.7162900","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162900","url":null,"abstract":"Multiple-input-multiple-output (MIMO) antenna will play a key role in the development of fifth generation (5G) wireless mobile communication systems due to their performance-enhancement capability in multipath environment. Antenna radiation efficiency is an important parameter for MIMO antenna system. In this paper, we present a comparison of MIMO antenna efficiency measurements performed in Anechoic Chamber (AC) and Reverberation Chamber (RC) at the UK National Physical Laboratory. Two commercial available directional dual polarized full LTE band MIMO antennas were measured both in AC and RC between 1 GHz and 3 GHz.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132803097","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Effects of the effective efficiency of the thermistor mount with WR-22(33 to 50 GHz) microcalorimeter WR-22(33 ~ 50 GHz)微热量计热敏电阻安装有效效率的影响
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162920
Chao Ma, Xiaohai Cui, Wenze Yuan, Yong Li
{"title":"Effects of the effective efficiency of the thermistor mount with WR-22(33 to 50 GHz) microcalorimeter","authors":"Chao Ma, Xiaohai Cui, Wenze Yuan, Yong Li","doi":"10.1109/ARFTG.2015.7162920","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162920","url":null,"abstract":"In this paper, the effective efficiency of the thermistor mount was evaluated by three WR-22 (33-50 GHz) rectangular waveguide microcalorimeters. Three sets of microcalorimeter were made from the same design drawing. The only difference among them was some key parts (thermal conductive plate and heat isolation section) coming from different manufactures. The relative deviation of measurement results of each microcalorimeter was within one percent. However, the evaluated effective efficiencies of same DUT were highly inconsistent for different microcalorimeters in some frequency points. The preliminary conclusion was that manufacturing process of microcalorimeter would be likely to affect the effective efficiency evaluation of the thermistor mount, and some necessary improvement works have been planned in near future.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114627581","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Automated wideband test system, measurement uncertainty, and design of on-chip six-port reflectometers for 5G applications 自动宽带测试系统，测量不确定度，芯片上六端口反射计的设计，用于5G应用
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162901
B. Hur, W. Eisenstadt
{"title":"Automated wideband test system, measurement uncertainty, and design of on-chip six-port reflectometers for 5G applications","authors":"B. Hur, W. Eisenstadt","doi":"10.1109/ARFTG.2015.7162901","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162901","url":null,"abstract":"This paper introduces an automated wideband test system, measurement uncertainty, and designs of on-chip six-port reflectometers (SPRs) that can be used for 5G applications. The trial frequency bands of 5G technology research and development (R&D) include 15 GHz, 28 GHz, and 38 GHz. Reflection measurements at these high frequencies are an essential part of 5G R&D. A six-port reflectometer (SPR) can be used for the embedded reflection measurements. However, the complexity of its calibration makes measurements challenging. Performing multiple measurements at wideband frequencies is even more challenging. An automated test system of on-chip SPRs in this paper can alleviate this problem. The details of the automated test system are introduced. Automated measurements were performed from 12 GHz to 18 GHz, including 15 GHz. The discussion of the measurement uncertainty is included. The design, layout, and simulation results of a 28-GHz SPR are also presented.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"298 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123192463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Investigating scattering parameters measurements for 50GHz highspeed Printed Circuit Boards (PCBs) 50GHz高速印刷电路板(pcb)散射参数测量研究
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162907
Hui Huang, Di Liu, T. Guan, Xinmeng Liu
{"title":"Investigating scattering parameters measurements for 50GHz highspeed Printed Circuit Boards (PCBs)","authors":"Hui Huang, Di Liu, T. Guan, Xinmeng Liu","doi":"10.1109/ARFTG.2015.7162907","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162907","url":null,"abstract":"This paper describes some investigations, made using coaxial launch connectors and microwave probes, into the scattering parameters (S-parameters) measurements for a highspeed Printed Circuit Boards (PCBs) by using Vector Network Analyzers (VNAs) operating at microwave frequency up to 50GHz. The grounded Coplanar Waveguide (GCPW) transmission line with Electromagnetic Band Gap (EBG) in ground planes as one reference standard for S-parameters of the general high-speed PCBs, of which characteristic impedance is 50 ohm, is predicted and analyzed from electromagnetic theory. The paper describes the impedance standard in detail and compares experimental results, obtained using a VNA operating in the 10MHz to 50GHz band, with values predicted by electromagnetic modeling software. The measurement is implemented after using Multiline Thru-Reflect-Line (Multi-TRL) algorithm by Wincal XE4.5. The impedance mismatch is analyzed by Time-domain Reflection (TDR) method.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132033521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Power control for S-parameters and large signal characterization at (sub)-mmWave frequencies s参数的功率控制和(亚)毫米波频率下的大信号表征
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162903
L. Galatro, S. Galbano, A. Santaniello, M. Spirito
{"title":"Power control for S-parameters and large signal characterization at (sub)-mmWave frequencies","authors":"L. Galatro, S. Galbano, A. Santaniello, M. Spirito","doi":"10.1109/ARFTG.2015.7162903","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162903","url":null,"abstract":"In this contribution we present a frequency scalable approach to achieve an accurate power control for levelled s-parameters and large signal characterization of devices working at millimeter and sub-millimeter waves. The method is based on a software-aided control loop that mimics the behavior of an automatic level control system, allowing to dynamically adjust the power delivered to the DUT at every frequency. The proposed hardware configuration employs only the VNA mm-wave extender modules, bypassing the need of expensive add-on test-sets. Measurement results are provided in WR-10, WR-05 and WR-03 waveguide bands to show the applicability of the method at different frequencies and different hardware setups (i.e., VNA extender modules from different vendors). The power control at the system ports and the capabilities of the proposed setup for power controlled S-parameters and large signal measurements are reported.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131214050","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Towards a denser frequency grid in phase measurements using mixer-based receivers 在相位测量中用混频器为基础的接收器实现更密集的频率网格
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162893
D. Ribeiro, P. Cruz, N. Carvalho
{"title":"Towards a denser frequency grid in phase measurements using mixer-based receivers","authors":"D. Ribeiro, P. Cruz, N. Carvalho","doi":"10.1109/ARFTG.2015.7162893","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162893","url":null,"abstract":"In this paper a new method to achieve a dense frequency grid in synchronous phase measurements is presented. This technique is suitable to use with instruments that employ a mixer-based internal architecture. Contrary to other works, the grid density is not being enhanced through the increase of the comb-generator (CG) output tone density, nor through the use of successive multi-sine waveforms. The technique proposed uses the same reference signals for any band measurable by the instrument. Besides, the power of each CG output tone is also kept at a high level. The tradeoff is the requirement for wide-band receivers, which are already commonly present in modern instrumentation. Multi-sine phase measurements performed with a nonlinear vector network analyzer (NVNA) will be compared with results obtained using the new technique (and performed by commercial mixer-based receivers). The comparisons will be used to validate the suggested method.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121104707","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Design and analysis of a verification device for the nonlinear vector network analyzer 非线性矢量网络分析仪验证装置的设计与分析
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162895
Mohammad Rajabi, D. Humphreys, T. Nielsen, P. Barmuta, D. Schreurs
{"title":"Design and analysis of a verification device for the nonlinear vector network analyzer","authors":"Mohammad Rajabi, D. Humphreys, T. Nielsen, P. Barmuta, D. Schreurs","doi":"10.1109/ARFTG.2015.7162895","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162895","url":null,"abstract":"We propose a verification device to validate the calibration of a nonlinear vector measurement instruments such as Nonlinear Vector Network Analyzer (NVNA). The verification device is a two-port device that has two operating modes, namely linear and nonlinear. The designed circuit's response is almost insensitive to small harmonic mismatches of the instrument ports (|Γ| <; 0.1). Since neither an amplifier nor a circulator is used, the traceability procedure of the device to Electro-Optical Sampling (EOS) is less complicated compared to earlier prototypes.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116665080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Comparison of sampler and VNA based Large Signal Measurement Systems (LSNA) under CW and pulsed operation 基于采样器和VNA的大信号测量系统在连续波和脉冲下的比较
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162890
M. Casbon, P. Tasker
{"title":"Comparison of sampler and VNA based Large Signal Measurement Systems (LSNA) under CW and pulsed operation","authors":"M. Casbon, P. Tasker","doi":"10.1109/ARFTG.2015.7162890","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162890","url":null,"abstract":"Here we present a comparison of the Large Signal Measurements provided by both a VNA based and a sampler based LSNA system. In this study, in order to achieve a robust and reliable relative phase calibration a dual frequency phase differential method was used. Significantly this work compares measurements performed under both CW and pulse mode operation. Very similar RF I-V waveforms are achieved in both cases, verifying that both architectures can provide comparable measurements not only in CW but also under pulsed operation. The test device was a GaN on silicon carbide HFET.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127871831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A simple adaptive method of antenna frequency parameters measurements with local reflections 一种局部反射天线频率参数测量的简单自适应方法
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162918
A. Savin, V. G. Guba, O. N. Bykova
{"title":"A simple adaptive method of antenna frequency parameters measurements with local reflections","authors":"A. Savin, V. G. Guba, O. N. Bykova","doi":"10.1109/ARFTG.2015.7162918","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162918","url":null,"abstract":"This article presents an adaptive method for antenna reflection and transmission parameters measurements using a calibrated vector network analyzer without an anechoic chamber. The method is based on a special distance-frequency system model simulating signals of local reflectors. Antenna parameters are extracted from measurement results by using a special estimation algorithm based on the least mean squares method. Experiment was performed and verified the proposed method. Software implemented this method is developed.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129462802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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