Mohammad Rajabi, D. Humphreys, T. Nielsen, P. Barmuta, D. Schreurs
{"title":"Design and analysis of a verification device for the nonlinear vector network analyzer","authors":"Mohammad Rajabi, D. Humphreys, T. Nielsen, P. Barmuta, D. Schreurs","doi":"10.1109/ARFTG.2015.7162895","DOIUrl":null,"url":null,"abstract":"We propose a verification device to validate the calibration of a nonlinear vector measurement instruments such as Nonlinear Vector Network Analyzer (NVNA). The verification device is a two-port device that has two operating modes, namely linear and nonlinear. The designed circuit's response is almost insensitive to small harmonic mismatches of the instrument ports (|Γ| <; 0.1). Since neither an amplifier nor a circulator is used, the traceability procedure of the device to Electro-Optical Sampling (EOS) is less complicated compared to earlier prototypes.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 85th Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2015.7162895","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
We propose a verification device to validate the calibration of a nonlinear vector measurement instruments such as Nonlinear Vector Network Analyzer (NVNA). The verification device is a two-port device that has two operating modes, namely linear and nonlinear. The designed circuit's response is almost insensitive to small harmonic mismatches of the instrument ports (|Γ| <; 0.1). Since neither an amplifier nor a circulator is used, the traceability procedure of the device to Electro-Optical Sampling (EOS) is less complicated compared to earlier prototypes.