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2015 85th Microwave Measurement Conference (ARFTG)最新文献

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Complex LO waveforms for wideband systems: Some frequency-converter measurement implications 宽带系统的复杂本征波形:一些频率转换器测量含义
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162899
J. Martens
{"title":"Complex LO waveforms for wideband systems: Some frequency-converter measurement implications","authors":"J. Martens","doi":"10.1109/ARFTG.2015.7162899","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162899","url":null,"abstract":"Systems containing frequency-conversion stages using complex Local Oscillator (LO) waveforms, sometimes under the heading of compressive sampling, have been proposed for general wideband communications, 5G applications (large-scale MIMO), signal intelligence and for other purposes. The characterization of the converters used in those applications can be critical for link budgets but those measurements can be complicated by the LO spectral distribution. Aside from the expected waveform dependence of linearity, image response complications and converter operating state questions can lead to multiple dB (or even 10s of dB) variations in the more small-signal-esque conversion efficiency and noise power measurements when taking into account only average or peak power.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130402843","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
De-embedding differential noise figure using the correlation of output noise waves 利用输出噪声波的相关性去嵌入差分噪声图
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162917
Y. Andee, C. Arnaud, F. Graux, F. Danneville
{"title":"De-embedding differential noise figure using the correlation of output noise waves","authors":"Y. Andee, C. Arnaud, F. Graux, F. Danneville","doi":"10.1109/ARFTG.2015.7162917","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162917","url":null,"abstract":"This paper presents a measurement technique for de-embedding the noise figure of all sorts of differential amplifiers having arbitrary common-mode rejection. It is based on the measurement of the correlation of the noise waves at the output ports of the differential amplifier. It makes use of a hybrid coupler and takes into account the phase and amplitude imbalances of the latter. Measurement results of a radio-frequency low-noise amplifier demonstrate the validity of this general technique.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128947732","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
An automatized time-domain set-up for on-wafer charaterization, doherty oriented, of high power GaN HEMTS 用于高功率GaN HEMTS晶圆上表征的自动化时域装置
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162905
L. Ayari, M. Ayad, E. Byk, M. Camiade, G. Neveux, D. Barataud
{"title":"An automatized time-domain set-up for on-wafer charaterization, doherty oriented, of high power GaN HEMTS","authors":"L. Ayari, M. Ayad, E. Byk, M. Camiade, G. Neveux, D. Barataud","doi":"10.1109/ARFTG.2015.7162905","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162905","url":null,"abstract":"This paper presents an automatized on-wafer time-domain active load-pull set-up specifically developed for the characterization of High Power GaN High-Electron Mobility Transistors (HEMTs). This set-up is associated to a specific methodology for the design of Doherty Power Amplifier (DPA). This methodology has been applied to a GaN technology transistor: from the on-wafer measured Time-Domain Waveforms (TDW) acquisition, all data required for the design of a Doherty power amplifier are directly extracted. Designers have the direct knowledge of the optimal characteristics of high power transistors along the output back-off (OBO) at fundamental frequency and also the maximum obtainable operating bandwidth of the final desired Doherty PA.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127087353","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Microstrip open — Problematic calibration standard 微带打开-有问题的校准标准
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162921
M. Haase, K. Hoffmann, Z. Škvor
{"title":"Microstrip open — Problematic calibration standard","authors":"M. Haase, K. Hoffmann, Z. Škvor","doi":"10.1109/ARFTG.2015.7162921","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162921","url":null,"abstract":"Microstrip open end (Open) applied as a calibration standard in frequency band up to 26 GHz was analyzed using CST Microwave Studio (CST). Arlon CuClad 233 with thickness 0.508mm was used for simulations. Different lengths of the microstrip lines in front of the Open were considered. Significant influence of the radiated field and the length of the microstrip line on the reflection coefficient magnitude of the standard in the order 0.01 was discovered. Physical explanation of the phenomenon is given.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131236178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Transient temperature measurement of microwave devices 微波器件瞬态温度测量
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162914
D. Kendig, K. Yazawa, A. Shakouri
{"title":"Transient temperature measurement of microwave devices","authors":"D. Kendig, K. Yazawa, A. Shakouri","doi":"10.1109/ARFTG.2015.7162914","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162914","url":null,"abstract":"Decreased feature sizes with today's advanced microwave devices has led to increased functionality and decreasing chip sizes. Not only higher power density but also localized hotspots have become a significant concern for transistor performance and long term reliability. Arrhenius's law in chemical reaction dominates the reliability of highly doped semiconductors designed for higher switching speeds. With higher integration, the device features are significantly small such as a 100 nm line width line for a transistor gate electrode. As the dimensions decrease, the thermal time constant decreases simultaneously. Hence, it is major challenge to detect and measure hotspot temperatures.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"9 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120926286","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Multi-line TRL revisited 重新访问了多线路TRL
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162897
Y. Rolain, Mariya Ishteva, E. Van Nechel, F. Ferranti
{"title":"Multi-line TRL revisited","authors":"Y. Rolain, Mariya Ishteva, E. Van Nechel, F. Ferranti","doi":"10.1109/ARFTG.2015.7162897","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162897","url":null,"abstract":"An alternative is proposed for the line pairing process that underspans the multi-line Thru-Reflect-Load (M-TRL) calibration. The tensor decomposition based method shows a potential to further improve the calibration accuracy.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116696865","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
V- and W-band waveguide microcalorimeters for millimeter-wave power standards 毫米波功率标准的V波段和w波段波导微热量计
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162911
J. Kwon, Young-Pyo Hong, Dong-Joon Lee, T. Kang
{"title":"V- and W-band waveguide microcalorimeters for millimeter-wave power standards","authors":"J. Kwon, Young-Pyo Hong, Dong-Joon Lee, T. Kang","doi":"10.1109/ARFTG.2015.7162911","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162911","url":null,"abstract":"This paper introduces a recently constructed V-band and an under development W-band waveguide microcalorimeters that will serve as primary power standards in KRISS. The design scheme of the V- and W-band microcalorimeters is briefly presented, and their basic performance was checked. We propose a thermoelectric reference standard that will cover V- and W- bands. We also propose an in-house V-band source signal module for high RF power and low signal impurity output.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115663000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Calibration of channel mismatch in time-interleaved real-time digital oscilloscopes 时间交错实时数字示波器中信道失配的校正
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162896
Chihyun Cho, Joo-Gwang Lee, P. Hale, J. Jargon, P. Jeavons, J. Schlager, A. Dienstfrey
{"title":"Calibration of channel mismatch in time-interleaved real-time digital oscilloscopes","authors":"Chihyun Cho, Joo-Gwang Lee, P. Hale, J. Jargon, P. Jeavons, J. Schlager, A. Dienstfrey","doi":"10.1109/ARFTG.2015.7162896","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162896","url":null,"abstract":"A novel method is proposed for the calibration of channel mismatch in a time-interleaved real-time digital oscilloscope (RTDO). A simple simultaneous equation is derived from the Fourier transform of the time-interleaved signals. Thus, it only requires a transfer function of time-interleaved ADCs (TIADCs), while most of previous works have employed additional filters. A measurement method for the transfer function of a commercial RTDO is also proposed. The accuracy of the calibration method is determined by the noise produced after the interleaving process. To validate the proposed method, we measure two-tone signals using a commercial RTDO. The calibrated results clearly show signals at spurious frequencies are substantially reduced.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129511773","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Full-wave electromagnetic modeling of sub-millimeter wave HEMT parasitics 亚毫米波HEMT寄生的全波电磁建模
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162904
Y. Karisan, C. Caglayan, G. Trichopoulos, K. Sertel
{"title":"Full-wave electromagnetic modeling of sub-millimeter wave HEMT parasitics","authors":"Y. Karisan, C. Caglayan, G. Trichopoulos, K. Sertel","doi":"10.1109/ARFTG.2015.7162904","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162904","url":null,"abstract":"We present a new distributed parasitic equivalent circuit model to accurately reproduce the frequency response of electromagnetic field couplings within the structure of submillimeter-wave high electron mobility transistors in the millimeter-wave and terahertz bands. To construct the proposed circuit model, we develop a multi-step parameter extraction algorithm, and demonstrate its accuracy through comprehensive comparisons between full-wave simulated, measured and modeled frequency responses of the presented test patterns up to 750 GHz.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123842287","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A compact millimeter-wave comb generator for calibrating broadband vector receivers 用于校准宽带矢量接收机的紧凑型毫米波梳状发生器
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162894
P. Hale, K. Remley, Dylan F. Williams, J. Jargon, C. M. Wang
{"title":"A compact millimeter-wave comb generator for calibrating broadband vector receivers","authors":"P. Hale, K. Remley, Dylan F. Williams, J. Jargon, C. M. Wang","doi":"10.1109/ARFTG.2015.7162894","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162894","url":null,"abstract":"We propose a compact and low-cost waveform source that can be used to calibrate the magnitude and phase response of vector receivers over a bandwidth as large as a few gigahertz. The generator consists of a broadband comb generator followed by a filter and amplifier. As a demonstration, we constructed and calibrated a source suitable for calibrating vector signal analyzers operating between 43 GHz and 46.5 GHz. We then used the source to characterize the response of a commercially available vector signal analyzer. We compared the result with calibrations performed with a general-purpose source.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133044516","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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