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Repeatability performance of non-contact probes in the 500–750GHz band 500-750GHz频段非接触式探头的重复性性能
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162909
C. Caglayan, G. Trichopoulos, K. Sertel
{"title":"Repeatability performance of non-contact probes in the 500–750GHz band","authors":"C. Caglayan, G. Trichopoulos, K. Sertel","doi":"10.1109/ARFTG.2015.7162909","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162909","url":null,"abstract":"We present the repeatability performance of an automated non-contact probe system for on-wafer device and integrated circuit characterization in the 500-750 GHz band. Unlike conventional contact-probe systems, a computer controlled x-y translation stage is employed to realize a completely automated non-contact probe setup. Thanks to this simplicity, far superior repeatability performance can be achieved with great ease. We present the repeatability study specifically for the 500-750 GHz band utilizing a precision servo system with 1 micron translation accuracy. At 625 GHz, our setup achieves 2.2° deviation in phase and 4.4% deviation in magnitude for 25 successive measurements spanning over 1.5 hours. This fully computerized non-contact probe system also facilitates intermittent re-calibrations that are normally needed for reliable sub-mmW measurements.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132979868","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Consideration of error model with cable flexure influences on waveguide vector network analyzers at submillimeter-wave frequency 考虑电缆弯曲对亚毫米波频率波导矢量网络分析仪误差模型的影响
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162906
M. Horibe, R. Kishikawa, Y. Kato, Yuta Tsukahara
{"title":"Consideration of error model with cable flexure influences on waveguide vector network analyzers at submillimeter-wave frequency","authors":"M. Horibe, R. Kishikawa, Y. Kato, Yuta Tsukahara","doi":"10.1109/ARFTG.2015.7162906","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162906","url":null,"abstract":"In microwave and millimeter wave frequency region, systematic error terms, i.e. directivity, matching and tracking, in vector network Analyzer (VNA) can be corrected by a calibration process. However, it is difficult to correct the other random error terms, i.e. connection repeatability and flexure influences of cables attached to test ports, etc. In the waveguide VNA using frequency extension modules, fortunately, it is unnecessary to consider cable flexure influences of test ports in the measurement uncertainty due to no test port cables being used. However, LO and RF cables making connection from frequency extension modules to microwave VNA have a large impact on the uncertainty in the transmission phase measurements. This paper proposes and demonstrates an evaluation technique of cable flexure influences of RF and LO cables in the millimeter and submillimeter wave VNA using frequency extension modules. Then, new VNA error model considering the LO and RF cable flexure influences are discussed.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131643844","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Physical models for 2.4 mm and 3.5 mm coaxial VNA calibration kits developed within the NIST microwave uncertainty framework 在NIST微波不确定度框架内开发的2.4 mm和3.5 mm同轴VNA校准套件的物理模型
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162913
J. Jargon, Chihyun Cho, Dylan F. Williams, P. Hale
{"title":"Physical models for 2.4 mm and 3.5 mm coaxial VNA calibration kits developed within the NIST microwave uncertainty framework","authors":"J. Jargon, Chihyun Cho, Dylan F. Williams, P. Hale","doi":"10.1109/ARFTG.2015.7162913","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162913","url":null,"abstract":"We developed physical models of commercially-available 2.4 mm and 3.5 mm coaxial calibration kits for vector network analyzers. These models support multiline thru-reflect-line (TRL) and open-short-load-thru (OSLT) calibrations, and include error mechanisms in each of the standards' constituent parameters that can be utilized in the NIST Microwave Uncertainty Framework to propagate uncertainties. For both connector sizes, we calibrated a network analyzer using the two calibration methods, and compared measurements and uncertainties made on a number of verification devices. In both cases, we showed that the two calibrations agree to within their respective uncertainties.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129625326","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
Impedance renormalization in CMOS-based single-element electronic de-embedding 基于cmos的单元件电子脱嵌中的阻抗重整化
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162910
Jun-Chau Chienand, A. Niknejad
{"title":"Impedance renormalization in CMOS-based single-element electronic de-embedding","authors":"Jun-Chau Chienand, A. Niknejad","doi":"10.1109/ARFTG.2015.7162910","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162910","url":null,"abstract":"In this work, an impedance renormalization technique dedicated for single-element de-embedding algorithm is proposed. By performing impedance modulation using CMOS transistors, reflection measurements with both ideal shorts and opens are generated from the measured two-port S-parameters. Such measurements with known terminations are further utilized for finding the solution to the test fixture and the characteristic impedance of the on-chip transmission line. As a single structure is sufficient, considerable savings in silicon area and improved accuracy due to reduced number of probing is achievable. Experimental results up to 65 GHz have validated the proposed single-element approach.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122747158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Measurement setup for X-Parameter characterization of bulk acoustic wave resonators 体声波谐振器x参数特性的测量装置
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162919
W. Akstaller, A. Tag, C. Musolff, R. Weigel, A. Hagelauer
{"title":"Measurement setup for X-Parameter characterization of bulk acoustic wave resonators","authors":"W. Akstaller, A. Tag, C. Musolff, R. Weigel, A. Hagelauer","doi":"10.1109/ARFTG.2015.7162919","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162919","url":null,"abstract":"In this work a modern measurement method has been utilized in order to characterize nonlinear behavior of bulk acoustic wave (BAW) solidly mounted resonators (SMR). Unlike typical nonlinearity characterization methods, the method which was employed here not only records amplitudes, but also the phase of generated harmonics. Furthermore, the relations between the harmonics of different order are given. The modeling approach being used is the poly harmonic distortion (PHD) modeling approach, realized by the measurement of X-Parameters. For that purpose it was necessary to extend a nonlinear vector network analyzer (NVNA) by external components in order to enable high power measurements. Afterwards, several optimization steps were required to perform phase calibration. This difficulty arose due to the high power incident tones and steep resonator impedance curves on the one hand and the limited power provided by the phase calibration standard on the other hand.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"284 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131671243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
A simplified calibration procedure for on-wafer power levelled S-parameter measurements at mm-wave 一种简化的毫米波晶圆上功率电平s参数测量校准程序
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162908
S. Galbano, L. Galatro, M. Spirito
{"title":"A simplified calibration procedure for on-wafer power levelled S-parameter measurements at mm-wave","authors":"S. Galbano, L. Galatro, M. Spirito","doi":"10.1109/ARFTG.2015.7162908","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162908","url":null,"abstract":"In this paper, we present a simplified calibration procedure to obtain on-wafer power levelled s-parameters when employing VNA extender modules. The approach presented removes the required calibration at the module interface (i.e., waveguide), by assuming symmetry in the tracking terms of the error coefficient and only requiring an on-wafer calibration and the knowledge of the two port s-parameters of the wafer probe. The calibration procedure with its mathematical approximation is then validated and compared to a conventional absolute power calibration using an equivalent model of the VNA front-end realized in a circuit simulator environment. The calibration technique is then implemented in a WR10 system employing OML inc. modules. The experimental results, demonstrating an error lower than 0.5dB in the entire waveguide band, are reported.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115306059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Rectangular-waveguide impedance 矩形波导阻抗
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162902
Dylan F. Williams, J. Jargon, U. Arz, P. Hale
{"title":"Rectangular-waveguide impedance","authors":"Dylan F. Williams, J. Jargon, U. Arz, P. Hale","doi":"10.1109/ARFTG.2015.7162902","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162902","url":null,"abstract":"We discuss the role of the wave impedance in power and temporal measurements and present an approach for accurately estimating the complex wave impedance of the TE10 mode in lossy rectangular waveguide from propagation-constant measurements.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"281 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114081734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
On the implementation of the LZZ calibration technique in the S-parameters measurement of devices mounted in test fixtures LZZ标定技术在测试夹具上装置s参数测量中的应用
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162916
M. Pulido-Gaytán, J. Reynoso‐Hernández, M. C. Maya‐Sanchez, A. Zarate-de Landa, J. R. Loo-Yau
{"title":"On the implementation of the LZZ calibration technique in the S-parameters measurement of devices mounted in test fixtures","authors":"M. Pulido-Gaytán, J. Reynoso‐Hernández, M. C. Maya‐Sanchez, A. Zarate-de Landa, J. R. Loo-Yau","doi":"10.1109/ARFTG.2015.7162916","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162916","url":null,"abstract":"This paper introduces a methodology for the design and verification of the set of microstrip structures necessary to implement the line, offset-open, offset-short (LZZ) calibration technique in the small-signal characterization of devices mounted in coaxial-to-microstrip test fixtures. The usefulness of the LZZ calibration in such application is verified by comparing the S-parameters of a GaN-HEMT packaged transistor corrected using the LZZ with those corrected using the thru-reflect-line (TRL) calibration technique.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"152 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127312029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Novel components for a fully automated PIM and S-Parameter test system 全自动PIM和s参数测试系统的新组件
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162915
Martin Grasl, Wolfgang Zisler
{"title":"Novel components for a fully automated PIM and S-Parameter test system","authors":"Martin Grasl, Wolfgang Zisler","doi":"10.1109/ARFTG.2015.7162915","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162915","url":null,"abstract":"As the spectrum utilization in modern mobile communication systems increases steadily, noise created by passive intermodulation becomes more likely. Thus passive intermodulation measurements are an obligatory part in the production of components for mobile communication infrastructure. However, these measurements are time-consuming and also costly. This paper describes a measurement system that reduces testing time by combination of S-Parameter and PIM measurements as well as automatic connecting of the device under test (DUT) to the test port.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122020016","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A 500 MHz portable evaluation platform for digital pre-distortion and envelope tracking power amplifiers 500 MHz便携式数字预失真和包络跟踪功率放大器评估平台
2015 85th Microwave Measurement Conference (ARFTG) Pub Date : 2015-05-22 DOI: 10.1109/ARFTG.2015.7162912
Jonmei J. Yan, T. Nakatani, P. Theilmann, D. Kimball
{"title":"A 500 MHz portable evaluation platform for digital pre-distortion and envelope tracking power amplifiers","authors":"Jonmei J. Yan, T. Nakatani, P. Theilmann, D. Kimball","doi":"10.1109/ARFTG.2015.7162912","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7162912","url":null,"abstract":"Efficiency and linearity are important design criteria for power amplifier (PA) designers. These two constraints usually contradict each other in the realm of PAs. However, with many recent efforts, various architectures such as envelope tracking, when used in conjunction with digital pre-distortion, allow the system to achieve both efficiency and linearity simultaneously. Many of the available evaluation platform/testbeds today are limited in bandwidth to ~200 MHz. This limits the bandwidth of the supported signal to ~40 MHz. As talk of future 5G LTE systems call for signal bandwidths of greater than 100 MHz, the need for an evaluation platform with 500 MHz is crucial. In this work, a 500 MHz bandwidth evaluation platform for DPD development and envelope tracking design will be presented.","PeriodicalId":228314,"journal":{"name":"2015 85th Microwave Measurement Conference (ARFTG)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124328738","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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