Automated wideband test system, measurement uncertainty, and design of on-chip six-port reflectometers for 5G applications

Abstract

This paper introduces an automated wideband test system, measurement uncertainty, and designs of on-chip six-port reflectometers (SPRs) that can be used for 5G applications. The trial frequency bands of 5G technology research and development (R&D) include 15 GHz, 28 GHz, and 38 GHz. Reflection measurements at these high frequencies are an essential part of 5G R&D. A six-port reflectometer (SPR) can be used for the embedded reflection measurements. However, the complexity of its calibration makes measurements challenging. Performing multiple measurements at wideband frequencies is even more challenging. An automated test system of on-chip SPRs in this paper can alleviate this problem. The details of the automated test system are introduced. Automated measurements were performed from 12 GHz to 18 GHz, including 15 GHz. The discussion of the measurement uncertainty is included. The design, layout, and simulation results of a 28-GHz SPR are also presented.