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Automation of direct josephson voltage standard comparison and an application 直接约瑟夫逊电压标准的自动化比较及其应用
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544581
Y. Tang
{"title":"Automation of direct josephson voltage standard comparison and an application","authors":"Y. Tang","doi":"10.1109/CPEM.2010.5544581","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544581","url":null,"abstract":"A direct Comparison between two Josephson Voltage Standard (JVS) systems has been used in the Bureau International des Poids et Mesures (BIPM) key comparisons or regional supplementary comparisons to verify the performance of a JVS with an uncertainty of few parts in 1010. Most direct JVS comparisons were manually operated. Hardware and protocol for an automatic direct JVS comparison have been developed to improve the efficiency while retaining the same level of uncertainty attained from a manual comparison. The automatic JVS direct comparison greatly improves the efficiency of data acquisition. A case study examining the offset related to digital voltmeter (DVM) polarity in an automatic direct JVS comparison is presented.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130822349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Application of capacitive displacement sensor on Joule Balance 电容式位移传感器在焦耳天平上的应用
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5545281
L. Yunfeng, Q. He, J. Zhao
{"title":"Application of capacitive displacement sensor on Joule Balance","authors":"L. Yunfeng, Q. He, J. Zhao","doi":"10.1109/CPEM.2010.5545281","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5545281","url":null,"abstract":"This paper gives a high precision capacitive displacement sensor design which is applied in the Joule Balance proposed by NIM, China. The plate of sensor is made by non-magnetic material, and is for the Joule Balance special use. The distance of the capacitive displacement sensor reaches to 1mm. And the resolution is less than 0.019µm full scale, in part range of the full scale, this data will be far less.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130843621","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Swept frequency gain measurements for standard horn antennas 标准喇叭天线扫频增益测量
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543134
Y. Ji, F. M. Warner
{"title":"Swept frequency gain measurements for standard horn antennas","authors":"Y. Ji, F. M. Warner","doi":"10.1109/CPEM.2010.5543134","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543134","url":null,"abstract":"This paper describes a swept frequency gain measurement technique for standard horn antennas based on the three-antenna method. The method uses a swept frequency source, a VNA based mismatch evaluation and an averaging process with uniform steps of separation distance for minimizing mutual antenna reflections and results in a similar uncertainty level to the single frequency measurements.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130929307","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ultimate error detection circuit for the hybrid electron turnstiles 混合电子旋转门的极限误差检测电路
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544747
S. Lotkhov, A. Zorin
{"title":"Ultimate error detection circuit for the hybrid electron turnstiles","authors":"S. Lotkhov, A. Zorin","doi":"10.1109/CPEM.2010.5544747","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544747","url":null,"abstract":"In order to study error mechanisms in the hybrid superconductor-normal metal turnstiles, we implemented a single-electron device, based on such a turnstile, connected in series to a high-ohmic resistor and terminated by an electron trapping node, coupled capacitively to a single-electron electrometer. This layout brings an advantage, on a single-electron level both to quantify the leakage rates in the dc mode, and to model the pumping regime with the aid of an electron shuttling experiment.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131187474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AC-DC difference measurements relative to Josephson generated voltages 交流-直流差测量相对于约瑟夫森产生的电压
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543958
L. Palafox, R. Behr, T. Funck
{"title":"AC-DC difference measurements relative to Josephson generated voltages","authors":"L. Palafox, R. Behr, T. Funck","doi":"10.1109/CPEM.2010.5543958","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543958","url":null,"abstract":"In an extension from their original use as references for measuring dc voltage, Josephson generated voltages from programmable arrays have been employed to measure waveforms differentially. In this paper, the alternative of using these Josephson voltages as a reference for ac-dc difference measurements using thermal converters and sampling techniques is presented.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133625384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Impedance comparison at power frequency by asynchronous sampling 用异步采样法比较工频阻抗
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543768
L. Callegaro, V. D’Elia, E. Gasparotto
{"title":"Impedance comparison at power frequency by asynchronous sampling","authors":"L. Callegaro, V. D’Elia, E. Gasparotto","doi":"10.1109/CPEM.2010.5543768","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543768","url":null,"abstract":"We present a measurement setup for the comparison of four-terminal impedances at power frequency, based on synchronous sampling of the voltage drops on the impedances placed in series. Complex impedance ratio is determined with a sine-fitting technique. The impedances can have different moduli and phase angles; the setup is optimized for impedances having moduli ranging below 100 Ω. Although an evaluation of measurement uncertainty is still in progress, it is expected to be better than l×l0−4.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133428578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Tee connectors for ac-dc current shunts up to 100 A 用于交流-直流电流分流高达100a的三通连接器
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544746
M. Garcocz
{"title":"Tee connectors for ac-dc current shunts up to 100 A","authors":"M. Garcocz","doi":"10.1109/CPEM.2010.5544746","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544746","url":null,"abstract":"Special tee connectors are necessary to calibrate ac-dc current shunts up to 100 A in a stepup procedure. Influences of these tees on the measured ac-dc difference have been observed. The reason for this influence is shown and a solution suggested, which reduces uncertainties in the 20 A to 100 A range and provides customers with calibration values free from tee influences.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131865153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Precise millimeter-wave dielectric measurements of single crystal ferroelectric materials 单晶铁电材料的精确毫米波介电测量
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544817
M. Afsar, K. Korolev, Zijing Li
{"title":"Precise millimeter-wave dielectric measurements of single crystal ferroelectric materials","authors":"M. Afsar, K. Korolev, Zijing Li","doi":"10.1109/CPEM.2010.5544817","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544817","url":null,"abstract":"Transmittance measurements on various single crystal ferroelectric materials over a broad millimeter-wave frequency range have been performed. The frequency dependence of the complex dielectric permittivity has been determined in the millimeter wave region for the first time. The measurements have been employed using a free-space quasi-optical millimeter-wave spectrometer equipped with a set of high power backward wave oscillators (BWOs) as sources of coherent radiation, tunable in the range from 30 – 120 GHz. The uncertainties and possible sources of instrumentation and measurement errors related to the free-space millimeter-wave technique are discussed. This work has demonstrated that precise MMW permittivities can be obtained even on small thin crystals using the BWO quasi-optical approach. The real and imaginary parts of dielectric permittivity have been extracted from the accurate transmittance spectra. The effect of crystallographic orientation on complex permittivity, which is shown to be more than a factor of 1.5 between different orientations, has been carefully examined for Lithium Niobate.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115551610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Loading effect of the AC-DC transfer standard for low level AC voltage standard 交直流转换标准对低电平交流电压标准的负载效应
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543547
Sung-Won Kwon, Mun-Seog Kim, K. T. Kim, J. K. Jung
{"title":"Loading effect of the AC-DC transfer standard for low level AC voltage standard","authors":"Sung-Won Kwon, Mun-Seog Kim, K. T. Kim, J. K. Jung","doi":"10.1109/CPEM.2010.5543547","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543547","url":null,"abstract":"AC-DC transfer standard and micro-potentiometer are widely used for AC voltage standard at low level. Input impedance and 50-Ω load dependency of the standard are discussed for the ac voltage application below 200 mV and 1 MHz. The load dependency of the unit reaches 385 µV/V at 1 MHz, and this loading error should be corrected when calibrate the 50-Ω AC source using the standard.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115932288","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Josephson-based test bench for ac characterization of analog-to-digital converters 基于约瑟夫森的模拟-数字转换器交流特性试验台
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544779
F. Overney, A. Rufenacht, J. Braun, B. Jeanneret
{"title":"Josephson-based test bench for ac characterization of analog-to-digital converters","authors":"F. Overney, A. Rufenacht, J. Braun, B. Jeanneret","doi":"10.1109/CPEM.2010.5544779","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544779","url":null,"abstract":"To perform systematic characterization of high resolution analog-to-digital converters (ADC), a test bench based on a 1 V programmable Josephson voltage standard (PJVS) has been developed. The PJVS generates different waveforms used as references which are sampled by the digitizer under test. As a first and preliminary example, the integral nonlinearity of a commercial 24-bits delta-sigma converter has been measured. It was found to be smaller than 4 µV/V at a frequency of 16 Hz on its 1 V range.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124241507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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