{"title":"基于约瑟夫森的模拟-数字转换器交流特性试验台","authors":"F. Overney, A. Rufenacht, J. Braun, B. Jeanneret","doi":"10.1109/CPEM.2010.5544779","DOIUrl":null,"url":null,"abstract":"To perform systematic characterization of high resolution analog-to-digital converters (ADC), a test bench based on a 1 V programmable Josephson voltage standard (PJVS) has been developed. The PJVS generates different waveforms used as references which are sampled by the digitizer under test. As a first and preliminary example, the integral nonlinearity of a commercial 24-bits delta-sigma converter has been measured. It was found to be smaller than 4 µV/V at a frequency of 16 Hz on its 1 V range.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Josephson-based test bench for ac characterization of analog-to-digital converters\",\"authors\":\"F. Overney, A. Rufenacht, J. Braun, B. Jeanneret\",\"doi\":\"10.1109/CPEM.2010.5544779\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To perform systematic characterization of high resolution analog-to-digital converters (ADC), a test bench based on a 1 V programmable Josephson voltage standard (PJVS) has been developed. The PJVS generates different waveforms used as references which are sampled by the digitizer under test. As a first and preliminary example, the integral nonlinearity of a commercial 24-bits delta-sigma converter has been measured. It was found to be smaller than 4 µV/V at a frequency of 16 Hz on its 1 V range.\",\"PeriodicalId\":222495,\"journal\":{\"name\":\"CPEM 2010\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"CPEM 2010\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.2010.5544779\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"CPEM 2010","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2010.5544779","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Josephson-based test bench for ac characterization of analog-to-digital converters
To perform systematic characterization of high resolution analog-to-digital converters (ADC), a test bench based on a 1 V programmable Josephson voltage standard (PJVS) has been developed. The PJVS generates different waveforms used as references which are sampled by the digitizer under test. As a first and preliminary example, the integral nonlinearity of a commercial 24-bits delta-sigma converter has been measured. It was found to be smaller than 4 µV/V at a frequency of 16 Hz on its 1 V range.