Josephson-based test bench for ac characterization of analog-to-digital converters

Abstract

To perform systematic characterization of high resolution analog-to-digital converters (ADC), a test bench based on a 1 V programmable Josephson voltage standard (PJVS) has been developed. The PJVS generates different waveforms used as references which are sampled by the digitizer under test. As a first and preliminary example, the integral nonlinearity of a commercial 24-bits delta-sigma converter has been measured. It was found to be smaller than 4 µV/V at a frequency of 16 Hz on its 1 V range.