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Metrology for high voltage direct current 高压直流计量
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543404
A. Bergman, U. Pogliano, J. Hallstrom, P. Wright, W. Lucas, A. Merev, G. Rietveld, M. Kurrat, J. Rickmann
{"title":"Metrology for high voltage direct current","authors":"A. Bergman, U. Pogliano, J. Hallstrom, P. Wright, W. Lucas, A. Merev, G. Rietveld, M. Kurrat, J. Rickmann","doi":"10.1109/CPEM.2010.5543404","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543404","url":null,"abstract":"HVDC energy transmission is crucial for a successful uptake of renewable energy sources in the grid. A research program is described, intended to provide metrology support for the needs of HVDC energy transmission. This program will provide improvements for the present HVDC metrology infrastructure: accurate measurement of HVDC, determination of losses in HVDC systems, on-site power quality measurements at HVDC substations, and DC metering. It is a combined effort of 7 European national metrology institutes, one university and one industrial partner.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"165 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116421749","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Anechoic chambers for EMC, APM and RCS measurements 用于EMC, APM和RCS测量的消声室
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543171
V. Rodriguez
{"title":"Anechoic chambers for EMC, APM and RCS measurements","authors":"V. Rodriguez","doi":"10.1109/CPEM.2010.5543171","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543171","url":null,"abstract":"This tutorial includes a brief introduction to anechoic chambers and absorber technology. It shows a typical, basic approach to anechoic chamber design for different applications from electromagnetic compatibility (EMC) and radar cross section (RCS) measurements to antenna pattern measurements (APM).","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121924366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design of the NIST 10 V Programmable Josephson Voltage Standard system NIST 10v可编程约瑟夫森电压标准系统的设计
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544234
C. Burroughs, P. Dresselhaus, A. Rufenacht, M. Elsbury, S. Benz
{"title":"Design of the NIST 10 V Programmable Josephson Voltage Standard system","authors":"C. Burroughs, P. Dresselhaus, A. Rufenacht, M. Elsbury, S. Benz","doi":"10.1109/CPEM.2010.5544234","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544234","url":null,"abstract":"NIST has developed and implemented a new Programmable Josephson Voltage Standard (PJVS) that operates at 10 V. This next-generation system is optimized for both dc metrology and stepwise-approximated ac voltage measurements for frequencies up to a few hundred hertz. The non-hysteretic Josephson junctions in these 10 V PJVS systems, which produce intrinsically stable voltages, provide a number of advantages and additional features as compared to conventional JVS systems.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124866525","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Improved dual Josephson voltage standard potentiometer for high precision arbitrary resistance ratio measurements 改进的双约瑟夫森电压标准电位器，用于高精度任意电阻比测量
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543762
M. F. Beug, L. Palafox, R. Behr
{"title":"Improved dual Josephson voltage standard potentiometer for high precision arbitrary resistance ratio measurements","authors":"M. F. Beug, L. Palafox, R. Behr","doi":"10.1109/CPEM.2010.5543762","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543762","url":null,"abstract":"This work presents an improved and much more flexible setup of the dual Josephson voltage standard potentiometer. It can be used for high precision arbitrary resistance ratio measurements. For this purpose a 18 channel DAC based current source was developed to control all segments of binary divided 1-V Josephson voltage standard arrays.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128336522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Realization and characterization of a waveguide calorimeter for the 5 TO 8.5 GHz frequency range 5 ~ 8.5 GHz频率范围波导量热计的实现与特性研究
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544045
A. Michaud, Chantal Pevost, D. Paulusse
{"title":"Realization and characterization of a waveguide calorimeter for the 5 TO 8.5 GHz frequency range","authors":"A. Michaud, Chantal Pevost, D. Paulusse","doi":"10.1109/CPEM.2010.5544045","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544045","url":null,"abstract":"We have built and characterized a calorimeter for RF power measurements in rectangular metal waveguide in the range from 5 to 8.5 GHz (WR-137, R-70). We describe the instrument, show the experimental results and evaluate its accuracy.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129365255","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
On the relativistic rate shift of frequency standards 论频率标准的相对论性速率移
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544396
G. Petit
{"title":"On the relativistic rate shift of frequency standards","authors":"G. Petit","doi":"10.1109/CPEM.2010.5544396","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544396","url":null,"abstract":"Comparison of distant frequency standards calls for the computation of their relativistic rate shift. This paper reviews the present needs and the methods used to perform this computation, and estimates the achievable uncertainty. The future situation with high-accuracy frequency standards is envisioned.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129607248","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Reduced nonlinearities in the NIST Johnson noise thermometry system 降低NIST约翰逊噪声测温系统的非线性
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543421
J. Qu, S. Benz, A. Pollarolo, H. Rogalla
{"title":"Reduced nonlinearities in the NIST Johnson noise thermometry system","authors":"J. Qu, S. Benz, A. Pollarolo, H. Rogalla","doi":"10.1109/CPEM.2010.5543421","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543421","url":null,"abstract":"Improved electronics and synthesized noise waveforms for the NIST quantum-voltage-standard-calibrated Johnson noise thermometer (JNT) have lead to reduced uncertainty in the temperature measurement. Recent measurements show that some of the distortion in the present electronics arises in the differential stage of both the preamplifier and the analog-digital converter (ADC). Distortion from the preamplifier can be reduced by compensating the DC offset of the signal at the inputs to the differential stage. A four-channel system with a new ADC is under construction to achieve the goal of re-determining the Boltzmann constant at a relative uncertainty of 6×10−6.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127176512","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
DC performance of a high accuracy thermal transfer standard 具有高精度直流传热性能标准
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544108
M. Early, M. Garcocz, L. Christian
{"title":"DC performance of a high accuracy thermal transfer standard","authors":"M. Early, M. Garcocz, L. Christian","doi":"10.1109/CPEM.2010.5544108","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544108","url":null,"abstract":"The dc performance of a widely-used high-accuracy commercial thermal transfer standard is found to be significantly affected by a variable contact resistance on its lower impedance ranges. This has a direct impact on the ac voltages measured by the instrument on these ranges. Cleaning the contacts and ensuring clearance around an input common mode choke effectively resolves the problem.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126943757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Comparison of frequency dependences of resistance standards made from surface mount resistors 表面贴装电阻标准的频率依赖性比较
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544765
J. Bohacek, J. Horská, R. Sedlácek
{"title":"Comparison of frequency dependences of resistance standards made from surface mount resistors","authors":"J. Bohacek, J. Horská, R. Sedlácek","doi":"10.1109/CPEM.2010.5544765","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544765","url":null,"abstract":"Two versions of four terminal-pair resistance standards have been made from surface mount resistors. Frequency characteristics of these standards, as well as frequency characteristics of a set of quadrifilar resistors with calculable frequency performance, have been measured by means of an Agilent 4285A precision LCR meter. In case of the quadrifilar resistors, the measured frequency characteristics agreed with the calculated ones within the stated uncertainties.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131959075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Linking AC quantum systems using a thermal converter 使用热转换器连接交流量子系统
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543981
T. Lipe, J. Kinard, B. Waltrip, Yi-hua Tang
{"title":"Linking AC quantum systems using a thermal converter","authors":"T. Lipe, J. Kinard, B. Waltrip, Yi-hua Tang","doi":"10.1109/CPEM.2010.5543981","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543981","url":null,"abstract":"The National Institute of Standards and Technology (NIST) has developed two types of ac sources that rely on Josephson Junction Arrays to provide quantum-accurate voltage. The pulsed-programmable AC Josephson Voltage Standard (ACJVS) and the Programmable Josephson Voltage Standard (PJVS) used as the basis for the NIST Quantum Watt can both be used to provide quantumaccurate ac signals; however, owing to hardware limitations, the output frequencies available do not overlap. We have used a thermal transfer standard with negligible frequency coefficient to link the two AC quantum standards. We describe the experiment, present the results, and describe plans to use these systems as the basis for ac voltage and current metrology at NIST.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130887939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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