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A current-comparator-based system for calibrating high voltage conventional and non-conventional current transformers under actual operating conditions of high voltage and distorted current waveforms up to 100 kV and 2000 A 一个基于电流比较器的系统，用于在高达100kv和2000a的高压和畸变电流波形的实际工作条件下校准高压常规和非常规电流互感器
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544830
Eddy So, R. Arseneau, D. Bennett, M. Frigault
{"title":"A current-comparator-based system for calibrating high voltage conventional and non-conventional current transformers under actual operating conditions of high voltage and distorted current waveforms up to 100 kV and 2000 A","authors":"Eddy So, R. Arseneau, D. Bennett, M. Frigault","doi":"10.1109/CPEM.2010.5544830","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544830","url":null,"abstract":"The development of a current-comparator-based calibration system to evaluate the current ratio errors of high voltage conventional/non-conventional current transformers, under actual operating conditions of high voltage and distorted current waveforms, up to 100 kV and 2000 A will be presented. The importance and critical need of such calibration system will be described.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129040195","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A precision buffer amplifier for low-frequency metrology applications 用于低频计量应用的精密缓冲放大器
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544183
I. Budovsky, T. Hagen
{"title":"A precision buffer amplifier for low-frequency metrology applications","authors":"I. Budovsky, T. Hagen","doi":"10.1109/CPEM.2010.5544183","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544183","url":null,"abstract":"The paper presents the design and evaluation of a precision buffer amplifier with amplitude and phase uncertainties less than 1×10<sup>−6</sup> at audio frequencies and less than 1×10<sup>−4</sup> at 200 kHz.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126365226","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Analysis methods of coaxial microcalorimeter data 同轴微热计数据的分析方法
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543491
L. Brunetti, L. Oberto, M. Sellone, E. Vremera
{"title":"Analysis methods of coaxial microcalorimeter data","authors":"L. Brunetti, L. Oberto, M. Sellone, E. Vremera","doi":"10.1109/CPEM.2010.5543491","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543491","url":null,"abstract":"Coaxial Microcalorimeter based on thermoelectric detection is the system used to realize the broadband primary power standard at high frequency (HF) by Istituto Nazionale di Ricerca Metrologica (INRIM). The paper describes the analysis methods applied to the measurement data for correcting the value of the measurand and evaluating the system uncertainty. Data and associated analysis are relevant to the 7 mm and 3.5 mm coaxial insets, covering, therefore, the frequency range 10 MHz – 26.5 GHz.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"451 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123045040","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Binary-divided arrays with intrisically overdamped Nb/Al-AlOx/Nb (SNIS) junctions driven at 70 GHz 具有本质过阻尼Nb/Al-AlOx/Nb (SNIS)结的二分阵列，驱动频率为70 GHz
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543468
V. Lacquaniti, N. De Leo, M. Fretto, A. Sosso, F. Mueller, J. Kohlmann
{"title":"Binary-divided arrays with intrisically overdamped Nb/Al-AlOx/Nb (SNIS) junctions driven at 70 GHz","authors":"V. Lacquaniti, N. De Leo, M. Fretto, A. Sosso, F. Mueller, J. Kohlmann","doi":"10.1109/CPEM.2010.5543468","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543468","url":null,"abstract":"Binary-divided 1V arrays with 8192 overdamped Nb/Al-AlOx/Nb Josephson junctions, fabricated within a joint cooperation between INRIM and PTB, have been tested at 4.2 K and in a temperature range from 6 to 7 K. We measured the microwave-induced step amplitude and checked the uniformity of junction parameters and microwave response on the whole array and sub-segments.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126321677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of differential potentiometric stripping analysis instrument based on Virtual Instrument 基于虚拟仪器的差分电位溶出分析仪器的研制
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544735
Liu Jianfeng, Yang Baohe, Luo Pingping
{"title":"Development of differential potentiometric stripping analysis instrument based on Virtual Instrument","authors":"Liu Jianfeng, Yang Baohe, Luo Pingping","doi":"10.1109/CPEM.2010.5544735","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544735","url":null,"abstract":"Virtual Instrument technology is an advanced technique of electronic measurement and control, which merges computer and electronic measurement technology. A differential potentiometric stripping analysis and measurement instrument based on Virtual Instrument is introduced. After introducing the principle of the measurement instrument, how to implement it by using software and hardware circuit are discussed.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122226162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Calibrating E-field probes with a tapered cell 用锥形电池校准电磁场探头
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544796
W. Shay, W. Hong, R. Lao
{"title":"Calibrating E-field probes with a tapered cell","authors":"W. Shay, W. Hong, R. Lao","doi":"10.1109/CPEM.2010.5544796","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544796","url":null,"abstract":"Tapered cells can be used in E-filed probes calibration [1]. Nevertheless, few research documents on tapered cells are found presently. In our lab, we configured an E-field probe calibration system with a tapered cell. By using a reference probe as standard, we can determine the correction factors of E-field probes for frequency range from 200 MHz to 2.5 GHz. This paper describes the structure and characteristics of the tapered cell. The way to use it for probes calibration is also introduced.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114109442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Behavior of έ(ω) and tan δ for a class of low-loss materials 一类低损耗材料的έ(ω)和tan δ的行为
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544743
J. Baker-Jarvis, M. Janezic, B. Riddle, S. Kim
{"title":"Behavior of έ(ω) and tan δ for a class of low-loss materials","authors":"J. Baker-Jarvis, M. Janezic, B. Riddle, S. Kim","doi":"10.1109/CPEM.2010.5544743","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544743","url":null,"abstract":"We report a study on the relaxation behavior of the real part of the permittivity. We also discuss the loss tangent of a class of materials in the microwave to millimeter band of frequencies. For relaxation response we show that the permittivity is a monotonic decreasing function of frequency. Also, for many low-loss ceramics, glasses, crystals, and solid polymers we found that the loss tangent increases nearly linearly with frequency. This linearity is explained in terms of the pulse-response function and the Sparks-King-Mills model. We show that the linearity may be used to extrapolate the loss tangent beyond the measurement band.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"78 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120891983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Temperature dependence of Pd thin film cryo resistors 钯薄膜低温电阻器的温度依赖性
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544226
A. Satrapinski, O. Hahtela, A. Savin, S. Novikov, N. Lebedeva
{"title":"Temperature dependence of Pd thin film cryo resistors","authors":"A. Satrapinski, O. Hahtela, A. Savin, S. Novikov, N. Lebedeva","doi":"10.1109/CPEM.2010.5544226","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544226","url":null,"abstract":"Cryo resistors based on Pd thin films were designed and investigated in temperature range 50 mK – 300 K. The resistors in the range 100 kΩ – 1.3 MΩ were fabricated using thermal evaporation technique. Minimum temperature coefficient, −0.4 (37)·10{−6}/K, in temperature range 50 mK – 100 mK has been obtained for 20 nm thin film 560 kΩ resistor. Binary and decimal configuration of connection of resistive elements were used for flexible adjustment of resistance value.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116205200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Development of a precision resistive voltage divider for frequencies up to 100 kHz 频率高达100khz的精密电阻分压器的研制
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544087
T. Hagen, I. Budovsky
{"title":"Development of a precision resistive voltage divider for frequencies up to 100 kHz","authors":"T. Hagen, I. Budovsky","doi":"10.1109/CPEM.2010.5544087","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544087","url":null,"abstract":"A range of precision resistive voltage dividers for use in high frequency power standards is currently under development at the National Measurement Institute, Australia (NMIA). The paper describes the design of the resistive voltage divider (RVD) and the methods of its evaluation. The target uncertainty in the voltage ratio is 100 µV/V at 100 kHz for both amplitude and phase at voltages up to 240 V.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131269341","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Development of a four-channel system for Johnson Noise Thermometry 约翰逊噪声测温四通道系统的研制
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543592
A. Pollarolo, J. Qu, H. Rogalla, P. Dresselhaus, S. Benz
{"title":"Development of a four-channel system for Johnson Noise Thermometry","authors":"A. Pollarolo, J. Qu, H. Rogalla, P. Dresselhaus, S. Benz","doi":"10.1109/CPEM.2010.5543592","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543592","url":null,"abstract":"Long integration time is necessary to reach low uncertainty when measuring temperature through Johnson Noise Thermometry (JNT). The main goal of the NIST JNT experiment is to achieve a 6×10−6 relative uncertainty in the measurement of the water triple point, which could contribute to the re-determination of Boltzmann's constant. A four-channel JNT system, which will reduce the measurement time two-fold, is being developed with new components, including a switchboard, an analog to digital converter (ADC) and a programmable, recharging power supply system. While implementing the new ADC, a source of systematic error was revealed, as well as a means to increase the measurement bandwidth.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131505800","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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