2010 IEEE International Symposium on Electromagnetic Compatibility最新文献_第6页

Information leakage of input operation on touch screen monitors caused by electromagnetic noise 电磁噪声导致触摸屏显示器输入操作信息泄露

2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711258

H. Sekiguchi

引用次数: 15

Development of an on-chip micro shielded-loop probe to evaluate performance of magnetic film to protect a cryptographic LSI from electromagnetic analysis 片上微屏蔽环探针的研制，以评估磁膜保护密码LSI免受电磁分析的性能

2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711255

M. Yamaguchi, Hideki Toriduka, Shoichi Kobayashi, T. Sugawara, Naofumi Hommaa, Akashi Satoh, T. Aoki

{"title":"Development of an on-chip micro shielded-loop probe to evaluate performance of magnetic film to protect a cryptographic LSI from electromagnetic analysis","authors":"M. Yamaguchi, Hideki Toriduka, Shoichi Kobayashi, T. Sugawara, Naofumi Hommaa, Akashi Satoh, T. Aoki","doi":"10.1109/ISEMC.2010.5711255","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711255","url":null,"abstract":"Two types of miniature shielded-loop type magnetic probes were used to analyze RF magnetic near field on the ISO/IEC 18033-3 Standard Cryptographic LSI made by 0.13 µm CMOS process with clock frequency of 24 MHz. The 180 × 180 µm2-size on-chip shielded loop probe we developed was applied to scan the magnetic near field on the LSI and clarified that the magnetic filed is strong not only on the targeting cryptographic circuit. Such a detailed map was depicted for the first time for cryptographic LSI. Then the differential electromagnetic analysis (DEMA) was performed with the shielded-loop probe (1000 × 500 µm2, CP-2S, NEC). All the BITEs of 16-BYTEs long secret key are decrypted by using only 1×104 waveform data in case the waveform is measured closely to the cryptographic circuit whereas the error rate does not converge to zero until the waveform number reaches 3×104 if the data were extracted far away from the circuit. As the countermeasure against DEMA, 25µm thick magnetic film (µr=50 at 1MHz, NEC Tokin Co, type E25) was attached on top of bare LSI chip to suppress magnetic field intensity by 6 dB, which can be a good candidate to protect cryptographic LSI from side channel attack.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117179538","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 17

Off-phase crosstalk behaviour and design considerations for high-speed memory buses 高速存储器总线的离相串扰行为和设计考虑

2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711319

A. J. Chen, Hao Wang

引用次数: 2

Simulated characteristics of optical electric field probe 光电场探头的仿真特性

2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711294

T. Ikenaga, H. Ota, K. Arai

引用次数: 2

EMI shielding effects of carbon nanotube cellulose nanocomposite 碳纳米管纤维素纳米复合材料的电磁干扰屏蔽效应

2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711271

P. Moilanen, Marko Luukkainen, Jari O. Jekkonen, Veijo Kangas

引用次数: 7

Skin-effect modeling of carbon nanotube bundles: The high-frequency effective impedance 碳纳米管束的表皮效应建模:高频有效阻抗

2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711390

M. D'amore, M. S. Sarto, A. D’Aloia

引用次数: 22

Assessment of emissions from electrical equipment regarding human exposure — Approaches for application of the generic standard IEC 62311 与人体接触有关的电气设备排放物的评估。通用标准IEC 62311的应用方法

2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711362

B. Jaekel, A. Mladenović, M. Perić, D. Vučković, Nenad N. Cvetković, S. Aleksic

{"title":"Assessment of emissions from electrical equipment regarding human exposure — Approaches for application of the generic standard IEC 62311","authors":"B. Jaekel, A. Mladenović, M. Perić, D. Vučković, Nenad N. Cvetković, S. Aleksic","doi":"10.1109/ISEMC.2010.5711362","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711362","url":null,"abstract":"In a lot of countries and regions there are requirements regarding electromagnetic emissions from electrical equipment. Such emissions can be looked at under two aspects: the emissions might interfere with other equipment in the vicinity causing potential malfunction (EMC aspect), or might be considered with regard to human exposure (EMF aspect). Limitation of such emissions related to the EMC aspect is part of EMC activities and is mostly due to the need to protect radio services from being interfered. Applicable limits depend on the type of equipment under concern and of the locations where equipment is intended to be operated. However, more and more such emissions are looked at also under a human exposure point of view within the frame of EMF regulations. As both aspects deal with entirely different objective targets consequently different limits, different measurement procedures and different assessment methods are to be applied. This could mean in practice that basically two kinds of measurements have to be carried out. This paper introduces an approach how to use results obtained by means of EMC measurements for the purpose of EMF assessments. As an example for an assessment the EMC data in the frequency range between 30 MHz and 230 MHz are used as part of an EMF assessment.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127011113","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Network model for the analysis of radiated emissions from horizontal PCB submodules 用于分析水平PCB子模块辐射发射的网络模型

2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711350

M. Friedrich, M. Leone

引用次数: 7

Transient perturbation analysis in digital radio 数字无线电中的瞬态扰动分析

2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711282

R. Jaúregui, M. Pous, Mireya Fernández, Ferran Silva

引用次数: 8

Designing shielding boxes made of conductive plastics using a new joining structure 采用新型连接结构设计导电塑料屏蔽盒

2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711328

J. Catrysse, F. Vanhee, D. Pissoort, R. Dewitte, D. Hellert

引用次数: 0