Simulated characteristics of optical electric field probe

Abstract

To perform electric near-field measurements with high accuracy in the gigahertz frequency range, we are developing an optical electric field probe by employing an electrooptic crystal and a laser beam for signal transmission. In this paper, we report the results of a FDTD (Finite Difference Time Domain) simulation of the invasiveness of probes when measuring the electric field distribution above a microstrip line (MSL). The purpose is to verify the measurement accuracy and clarify the design guidelines for optical electric field probes.