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2010 IEEE International Symposium on Electromagnetic Compatibility最新文献

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Multi-band microstrip antenna with minimalization of radiation towards head 对头部辐射最小化的多波段微带天线
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711361
M. Wnuk
{"title":"Multi-band microstrip antenna with minimalization of radiation towards head","authors":"M. Wnuk","doi":"10.1109/ISEMC.2010.5711361","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711361","url":null,"abstract":"Intensive development of cellular personal communications system has been observed lately. Thus, protection of a man, and especially protection of his head against non-ionizing electromagnetic radiation generated by cellular telephones is becoming one of the most important problems. The results of elaborated microstrip antennas which have minimized radiation towards the user's head are presented in this paper.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122377434","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of coupling-induced jitter in FPGA transceiver FPGA收发器耦合抖动分析
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711340
Kundan Chand, Geping Liu, Daniel Chow
{"title":"Analysis of coupling-induced jitter in FPGA transceiver","authors":"Kundan Chand, Geping Liu, Daniel Chow","doi":"10.1109/ISEMC.2010.5711340","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711340","url":null,"abstract":"This paper analyses jitter increase mechanism due to parallel IO simultaneous switching noise (SSN), while FPGA transceiver operates at multi-gigabit data rates or higher. Several jitter measurement methods and relevant simulations are used to diagnose noise sources and coupling paths. This paper illustrates that transmitter jitter profile is related to power supply noise and inductive crosstalk characteristics. These findings helped improve PDN design resulting in better device jitter performance.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125807628","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Radiated spurious emissions measurement by substitution method 替代法测量辐射杂散发射
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711264
Qin Yu
{"title":"Radiated spurious emissions measurement by substitution method","authors":"Qin Yu","doi":"10.1109/ISEMC.2010.5711264","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711264","url":null,"abstract":"The total power substitution method is a measurement approach preferred by FCC and other authorities for evaluating the radiated spurious emissions of an RF product. This paper reviews and discusses the setup and procedures for conducting radiated spurious emissions measurement by using this approach. Two estimation methods, the free space path loss (FSPL) method and the site attenuation method, are also presented and elaborated in the paper. With a given field strength of a spurious signal at the receiving antenna, its effective radiated power (ERP) and the required input power to the substitution antenna can be estimated beforehand to save testing time and efforts. The calculated results are compared with the measured ones from both broadband EMC antennas and tunable dipoles. The pros and cons of each method are addressed as well.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126004275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Systematic design technique for improvements of mobile phone's immunity to electrostatic discharge soft failures 提高手机对静电放电软故障抗扰性的系统设计技术
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711299
Ki Hyuk Kim, J. Koo, Bong-Gyu Kang, S. Kwon, Yongsup Kim, J. Jeong
{"title":"Systematic design technique for improvements of mobile phone's immunity to electrostatic discharge soft failures","authors":"Ki Hyuk Kim, J. Koo, Bong-Gyu Kang, S. Kwon, Yongsup Kim, J. Jeong","doi":"10.1109/ISEMC.2010.5711299","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711299","url":null,"abstract":"A systematic design technique for the improvements of the mobile phone's immunity to the electrostatic discharge (ESD) soft failures is proposed. The design technique consists of two parallel processes; one is the ESD simulation and the other is the ESD characterization. The modeling methods of the mobile phone, the ESD gun and the ESD testing setup for the ESD simulations are also developed. The proposed technique is applied to design the countermeasures against the ESD soft failure of the slide-type mobile phone and the root causes of the ESD soft failure are analyzed based on the proposed technique. The RC low pass filters are designed to improve the ESD immunity of the mobile phone and the ESD simulation results of the improved mobile phone show more than 82% voltage level reductions of the signals which cause the ESD soft failure. The improved mobile phone's ESD immunity is characterized again and no ESD soft failure is detected.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127194721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Quantum-based SI traceable electric-field probe 基于量子的SI可追踪电场探针
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711293
J. Gordon, C. Holloway, S. Jefferts, T. Heavner
{"title":"Quantum-based SI traceable electric-field probe","authors":"J. Gordon, C. Holloway, S. Jefferts, T. Heavner","doi":"10.1109/ISEMC.2010.5711293","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711293","url":null,"abstract":"We are presently investigating the feasibility of developing a technique that will allow direct traceable microwave electric field (E-field) measurements. The new approach is based on atomic rf-resonance spectroscopy, where an applied electrical field causes a transition between high-lying Rydberg states of an atom. The new technique will allow direct E-field measurements traceable to fundamental physical constants and SI units. If successful, this self calibrating probe will provide more accurate field measurements along with better sensitivity than do present techniques. Direct traceable E-field measurements with sensitivities below 0.1 V/m could be possible.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"157 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127363944","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Aperture coupling near-field cavity effects for electromagnetic testing with measurements on a slotted circular cylinder 开槽圆柱电磁试验的孔径耦合近场空腔效应
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711248
M. L. Waller, T. Shumpert, R. Scharstein
{"title":"Aperture coupling near-field cavity effects for electromagnetic testing with measurements on a slotted circular cylinder","authors":"M. L. Waller, T. Shumpert, R. Scharstein","doi":"10.1109/ISEMC.2010.5711248","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711248","url":null,"abstract":"Electric field measurements for an electromagnetic wave excited from a log-periodic dipole array at two separation distances on a finite slotted circular cylinder are compared to an analytical model of a plane wave on an infinite slotted circular cylinder. The four foot diameter cylinder cross section is used to represent the cross section (1/2 scale) of an Army Blackhawk helicopter. The frequency range of interest is in the Very High Frequency (VHF) band where the first resonances of the cavity occur. Transverse Magnetic (TM) and Transverse Electric (TE) polarizations are considered.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128526974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Transient FDTD simulation validation 瞬态时域有限差分仿真验证
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711281
R. Jaúregui, P. Riu, Ferran Silva
{"title":"Transient FDTD simulation validation","authors":"R. Jaúregui, P. Riu, Ferran Silva","doi":"10.1109/ISEMC.2010.5711281","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711281","url":null,"abstract":"In computational electromagnetic simulations, most validation methods have been developed until now to be used in the frequency domain. However, the EMC analysis of the systems in the frequency domain many times is not enough to evaluate the immunity of current communication devices. Based on several studies, in this paper we propose an alternative method of validation of the transients in time domain allowing a rapid and objective quantification of the simulations results.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126308320","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Stirrer Blade Separation experiment in reverberation chambers 混响室内搅拌叶片分离实验
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711331
O. Lundén, N. Wellander, M. Backstrom
{"title":"Stirrer Blade Separation experiment in reverberation chambers","authors":"O. Lundén, N. Wellander, M. Backstrom","doi":"10.1109/ISEMC.2010.5711331","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711331","url":null,"abstract":"It is often claimed that it is the volume swept by the stirrers in relation to the reverberation chamber volume that is of importance for the efficiency of the stirrers. The impact of a change of the stirrer diameter is however approximately cubic compared with the change of the stirrer height. In this paper it is shown that it is mainly the periphery of the stirrers that contribute in the tuning of reverberation chambers.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117109501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Electromagnetic information leakage for side-channel analysis of cryptographic modules 密码模块侧信道分析中的电磁信息泄漏
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711254
N. Homma, T. Aoki, Akashi Satoh
{"title":"Electromagnetic information leakage for side-channel analysis of cryptographic modules","authors":"N. Homma, T. Aoki, Akashi Satoh","doi":"10.1109/ISEMC.2010.5711254","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711254","url":null,"abstract":"A new class of physical attacks against cryptographic modules, which is called the side-channel attack, is now drawing much attention. Side-channel attacks exploit information leakage from a physical implementation, such as power consumption and electro-magnetic (EM) radiation. This paper presents an overview of the recent trends in side-channel attacks, including EM analysis attacks, and related activities in the security evaluation of cryptographic modules.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117114051","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
Experimental validation of common-mode filtering performances of planar electromagnetic band-gap structures 平面电磁带隙结构共模滤波性能的实验验证
2010 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2010-07-25 DOI: 10.1109/ISEMC.2010.5711375
F. de Paulis, L. Raimondo, D. di Febo, B. Archambeault, S. Connor, A. Orlandi
{"title":"Experimental validation of common-mode filtering performances of planar electromagnetic band-gap structures","authors":"F. de Paulis, L. Raimondo, D. di Febo, B. Archambeault, S. Connor, A. Orlandi","doi":"10.1109/ISEMC.2010.5711375","DOIUrl":"https://doi.org/10.1109/ISEMC.2010.5711375","url":null,"abstract":"An experimental validation of an electromagnetic band-gap (EBG) based common mode filter is given in this paper. The proposed layout technique is based on planar EBG structures altered by removing the connecting bridges between adjacent patches. The patches are properly dimensioned for ensuring the presence of frequency notches at the frequencies that should be filtered in the common-mode transfer function. The notch frequency is associated with the first resonant mode of the patch.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127020061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
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