提高手机对静电放电软故障抗扰性的系统设计技术

Ki Hyuk Kim, J. Koo, Bong-Gyu Kang, S. Kwon, Yongsup Kim, J. Jeong
{"title":"提高手机对静电放电软故障抗扰性的系统设计技术","authors":"Ki Hyuk Kim, J. Koo, Bong-Gyu Kang, S. Kwon, Yongsup Kim, J. Jeong","doi":"10.1109/ISEMC.2010.5711299","DOIUrl":null,"url":null,"abstract":"A systematic design technique for the improvements of the mobile phone's immunity to the electrostatic discharge (ESD) soft failures is proposed. The design technique consists of two parallel processes; one is the ESD simulation and the other is the ESD characterization. The modeling methods of the mobile phone, the ESD gun and the ESD testing setup for the ESD simulations are also developed. The proposed technique is applied to design the countermeasures against the ESD soft failure of the slide-type mobile phone and the root causes of the ESD soft failure are analyzed based on the proposed technique. The RC low pass filters are designed to improve the ESD immunity of the mobile phone and the ESD simulation results of the improved mobile phone show more than 82% voltage level reductions of the signals which cause the ESD soft failure. The improved mobile phone's ESD immunity is characterized again and no ESD soft failure is detected.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Systematic design technique for improvements of mobile phone's immunity to electrostatic discharge soft failures\",\"authors\":\"Ki Hyuk Kim, J. Koo, Bong-Gyu Kang, S. Kwon, Yongsup Kim, J. Jeong\",\"doi\":\"10.1109/ISEMC.2010.5711299\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A systematic design technique for the improvements of the mobile phone's immunity to the electrostatic discharge (ESD) soft failures is proposed. The design technique consists of two parallel processes; one is the ESD simulation and the other is the ESD characterization. The modeling methods of the mobile phone, the ESD gun and the ESD testing setup for the ESD simulations are also developed. The proposed technique is applied to design the countermeasures against the ESD soft failure of the slide-type mobile phone and the root causes of the ESD soft failure are analyzed based on the proposed technique. The RC low pass filters are designed to improve the ESD immunity of the mobile phone and the ESD simulation results of the improved mobile phone show more than 82% voltage level reductions of the signals which cause the ESD soft failure. The improved mobile phone's ESD immunity is characterized again and no ESD soft failure is detected.\",\"PeriodicalId\":201448,\"journal\":{\"name\":\"2010 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2010.5711299\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2010.5711299","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

提出了一种提高手机对静电放电(ESD)软故障抗扰度的系统设计技术。设计技术包括两个并行的过程;一个是ESD仿真,另一个是ESD表征。研究了手机的建模方法、防静电枪和用于防静电仿真的防静电测试装置。将该技术应用于滑盖型手机ESD软失效的对策设计,并基于该技术分析了造成手机ESD软失效的根本原因。为了提高手机的ESD抗扰度,设计了RC低通滤波器,改进后的手机的ESD仿真结果表明,导致ESD软失效的信号电压电平降低82%以上。改进后的手机对ESD抗扰度进行了再次表征,未检测到ESD软失效。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Systematic design technique for improvements of mobile phone's immunity to electrostatic discharge soft failures
A systematic design technique for the improvements of the mobile phone's immunity to the electrostatic discharge (ESD) soft failures is proposed. The design technique consists of two parallel processes; one is the ESD simulation and the other is the ESD characterization. The modeling methods of the mobile phone, the ESD gun and the ESD testing setup for the ESD simulations are also developed. The proposed technique is applied to design the countermeasures against the ESD soft failure of the slide-type mobile phone and the root causes of the ESD soft failure are analyzed based on the proposed technique. The RC low pass filters are designed to improve the ESD immunity of the mobile phone and the ESD simulation results of the improved mobile phone show more than 82% voltage level reductions of the signals which cause the ESD soft failure. The improved mobile phone's ESD immunity is characterized again and no ESD soft failure is detected.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信