Ki Hyuk Kim, J. Koo, Bong-Gyu Kang, S. Kwon, Yongsup Kim, J. Jeong
{"title":"提高手机对静电放电软故障抗扰性的系统设计技术","authors":"Ki Hyuk Kim, J. Koo, Bong-Gyu Kang, S. Kwon, Yongsup Kim, J. Jeong","doi":"10.1109/ISEMC.2010.5711299","DOIUrl":null,"url":null,"abstract":"A systematic design technique for the improvements of the mobile phone's immunity to the electrostatic discharge (ESD) soft failures is proposed. The design technique consists of two parallel processes; one is the ESD simulation and the other is the ESD characterization. The modeling methods of the mobile phone, the ESD gun and the ESD testing setup for the ESD simulations are also developed. The proposed technique is applied to design the countermeasures against the ESD soft failure of the slide-type mobile phone and the root causes of the ESD soft failure are analyzed based on the proposed technique. The RC low pass filters are designed to improve the ESD immunity of the mobile phone and the ESD simulation results of the improved mobile phone show more than 82% voltage level reductions of the signals which cause the ESD soft failure. The improved mobile phone's ESD immunity is characterized again and no ESD soft failure is detected.","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Systematic design technique for improvements of mobile phone's immunity to electrostatic discharge soft failures\",\"authors\":\"Ki Hyuk Kim, J. Koo, Bong-Gyu Kang, S. Kwon, Yongsup Kim, J. Jeong\",\"doi\":\"10.1109/ISEMC.2010.5711299\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A systematic design technique for the improvements of the mobile phone's immunity to the electrostatic discharge (ESD) soft failures is proposed. The design technique consists of two parallel processes; one is the ESD simulation and the other is the ESD characterization. The modeling methods of the mobile phone, the ESD gun and the ESD testing setup for the ESD simulations are also developed. The proposed technique is applied to design the countermeasures against the ESD soft failure of the slide-type mobile phone and the root causes of the ESD soft failure are analyzed based on the proposed technique. The RC low pass filters are designed to improve the ESD immunity of the mobile phone and the ESD simulation results of the improved mobile phone show more than 82% voltage level reductions of the signals which cause the ESD soft failure. The improved mobile phone's ESD immunity is characterized again and no ESD soft failure is detected.\",\"PeriodicalId\":201448,\"journal\":{\"name\":\"2010 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2010.5711299\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2010.5711299","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Systematic design technique for improvements of mobile phone's immunity to electrostatic discharge soft failures
A systematic design technique for the improvements of the mobile phone's immunity to the electrostatic discharge (ESD) soft failures is proposed. The design technique consists of two parallel processes; one is the ESD simulation and the other is the ESD characterization. The modeling methods of the mobile phone, the ESD gun and the ESD testing setup for the ESD simulations are also developed. The proposed technique is applied to design the countermeasures against the ESD soft failure of the slide-type mobile phone and the root causes of the ESD soft failure are analyzed based on the proposed technique. The RC low pass filters are designed to improve the ESD immunity of the mobile phone and the ESD simulation results of the improved mobile phone show more than 82% voltage level reductions of the signals which cause the ESD soft failure. The improved mobile phone's ESD immunity is characterized again and no ESD soft failure is detected.