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2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)最新文献

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Peculiar Phenomenon in Friction Coefficient of Tin Plated Connector Contacts with Application of Lubricant 镀锡连接器接触摩擦系数的特殊现象与润滑油的应用
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034817
T. Tamai, S. Sawada, Y. Hattori
{"title":"Peculiar Phenomenon in Friction Coefficient of Tin Plated Connector Contacts with Application of Lubricant","authors":"T. Tamai, S. Sawada, Y. Hattori","doi":"10.1109/HOLM.2011.6034817","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034817","url":null,"abstract":"For tin plated connector contacts, it was found that friction coefficient of the lubricated contacts was higher than that of non-lubricated contacts. This is very different from common knowledge of lubrication. In this paper, size of true contact areas of static contact condition was discussed by FEM analysis under conditions for both lubricated and non-lubricated contacts between platinum (Pt) hemisphere and tin (Sn) plated flat. In the result, it was clarified that the contact area with lubricant became lager than non-lubricated contacts. This is due to indentation depth of the hemisphere into tin plated layer. Projected area for sliding direction of the sunken contact surface was calculated by geometrical contact model. From these discussions, it was concluded that the increase in friction coefficient with lubricant was not caused by increase in adhesion area but by increase in depth of the contact trace and in plowing the flat.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132638244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts 镀锡触点微动腐蚀轨迹接触电阻分布的测量
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034786
Soushi Masui, S. Sawada, T. Tamai, Y. Hattori, K. Iida
{"title":"Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts","authors":"Soushi Masui, S. Sawada, T. Tamai, Y. Hattori, K. Iida","doi":"10.1109/HOLM.2011.6034786","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034786","url":null,"abstract":"It is observed that contact resistance of tin plated contact in automotive connectors increased due to fretting corrosion, which is originated from heat cycle or vibration. In this study, the measurement condition is established to obtain the contact resistance distribution on fretting corrosion trace of tin plated contact in order to clarify the relationship between contact resistance and oxide formation. As the result, in the region of higher concentration of oxygen measured by EDX analysis, the contact resistance is tended to be measured higher. And the contact resistance of whole contact trace is estimated¿@by static electric field analysis based on contact resistance distribution at contact trace. These analysis results are approximately agreement with the contact resistance on fretting corrosion experimentally.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117170329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A Nano-Scale Investigation of Material Transfer Phenomena at Make in a MEMS Switch MEMS开关制造过程中材料转移现象的纳米尺度研究
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034801
C. Poulain, A. Peschot, M. Vincent, N. Bonifaci
{"title":"A Nano-Scale Investigation of Material Transfer Phenomena at Make in a MEMS Switch","authors":"C. Poulain, A. Peschot, M. Vincent, N. Bonifaci","doi":"10.1109/HOLM.2011.6034801","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034801","url":null,"abstract":"MEMS switches have considerably improved over the last decade, however their lack of reliability remains a weak point for a large scale production. The main limiting factor comes from the electrical contacts. In particular, material transfer at the nano-scale is of significant importance in terms of performance and lifetime, however the existing literature remains rather limited. In this paper we present original experiments carried out in air using a modified atomic force microscope (AFM) equipped with a tipless conductive cantilever representing the mobile contact. The fixed contact is composed of a Si substrate covered with the metal of interest (Au, Ru or Pt). The experimental setup is configured to perform successive commutations at extremely low closing/opening speeds of about 10nm/s. This study focuses on the closing sequence under 5V DC, the current being limited to 1mA. The results show a sudden current increase when the contact gap becomes smaller than a few tens of nanometers. This emission of electrons from the cathode tends to follow the Fowler-Nordheim theory and leads to the damage of the opposite contact member (anode) thus causing, by impact heating, the evaporation of the anode material and its deposition on the opposite contact member (cathode). A material transfer from anode to cathode can then be observed and explained.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"46 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120816158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Direct Observation of Current Density Distribution in Contact Area by Using Light Emission Diode Wafer 利用发光二极管晶片直接观察接触区电流密度分布
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034782
S. Tsukiji, S. Sawada, T. Tamai, Y. Hattori, K. Iida
{"title":"Direct Observation of Current Density Distribution in Contact Area by Using Light Emission Diode Wafer","authors":"S. Tsukiji, S. Sawada, T. Tamai, Y. Hattori, K. Iida","doi":"10.1109/HOLM.2011.6034782","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034782","url":null,"abstract":"Theoretically the Laplace equation can be used to calculate the current constriction behavior in electrical contacts. On the actual behavior of current constriction, although there are many reports on the contact resistance measurement, not many reports on the detailed behavior of current density distribution in the contact area experimentally. Therefore, we attempted to observe the behavior of the current density distribution in the contact by using semiconductor wafers in this study. As a result, it was confirmed that electric current is uniformly distributed over the contact area covered by an oxide film, while it is concentrated at the periphery of the contact if there is no oxide film. These results qualitatively agree with the results of the earlier theory and electric field analysis.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127803206","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Low-Voltage Arc Simulation with Out-Gassing Polymers 用放气聚合物模拟低压电弧
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034770
C. Rumpler, H. Stammberger, A. Zacharias
{"title":"Low-Voltage Arc Simulation with Out-Gassing Polymers","authors":"C. Rumpler, H. Stammberger, A. Zacharias","doi":"10.1109/HOLM.2011.6034770","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034770","url":null,"abstract":"Polymer walls and inserts are an important design criterion in low-voltage switching devices. Besides their good insulation properties they are used to influence the switching arc. An important part of the energy dissipated in the arc is absorbed by the walls of the arc chamber. This leads to degradation and evaporation of the polymer and subsequent impact on and interaction with the switching arc. This contribution explains the enhancements of an existing simulation model for the interaction between the low-voltage switching arc and walls composed of polyamide PA 66. This includes a model of plastic ablation, the influence of the plastic vapor on the transport properties of the arc as well as on its radiation. Calculations and comparisons with experimental results show the applicability of the model in arc chambers that are close to reality.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130498378","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 28
Arc Fault Model of Conductance. Application to the UL1699 Tests Modeling 电导电弧故障模型。应用于UL1699测试建模
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034778
J. Andrea, P. Schweitzer, Jean-Mary Martel
{"title":"Arc Fault Model of Conductance. Application to the UL1699 Tests Modeling","authors":"J. Andrea, P. Schweitzer, Jean-Mary Martel","doi":"10.1109/HOLM.2011.6034778","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034778","url":null,"abstract":"Differents types of arc faults can be responsible for the start of an electrical fire. Depending on the power system and the application (photovoltaic, vehicule, aircraft, residential wiring) the arc fault may involve contact or non-contact arcing with eventually semi-conductive materials in the vicinity. Other characteristics such as the gap distance or the electrode material and geometry may also strongly differ. An electrical model was developed to fit with the arc fault scenarios described in the standard for AFCI UL1699. The contact arcing copper-graphite electrodes produced by the arc generator and the non-contact arcing on carbonized track produced with the arc clearing time tester were observed and their electrical characteristics (restrike and burning voltage, time constant and stability) could be verified thanks to the electrical model with a very good agreement. A qualitative study showing the various parameters used for fitting shows that the model is applicable regardless of the arc ignition principle.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126264036","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Effects of Rotational Motion of Break Arcs on Arc Duration and Contact Erosion 断弧旋转运动对电弧持续时间和接触侵蚀的影响
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034808
J. Sekikawa, T. Kubono
{"title":"Effects of Rotational Motion of Break Arcs on Arc Duration and Contact Erosion","authors":"J. Sekikawa, T. Kubono","doi":"10.1109/HOLM.2011.6034808","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034808","url":null,"abstract":"An electrical rivet contact in which a column-shaped permanent magnet is embedded in the rivet shank beneath the contact head is mounted on a relay as the stationary contact. The moving contact is a conventional rivet without the magnet. The magnet forms radial magnetic field to rotate break arcs around the center axis of electrical contacts. A series of switching experiments are carried out in a 42VDC resistive circuit at currents of 7A, 10A and 14A. The contact material is Ag/SnO2 12wt%. Experimental results for break-only operations with the magnet are compared with those without the magnet. Effects of rotational motion of break arcs driven by the magnet are investigated for the contact erosion and arc duration. Without the magnet, the area of contact erosion on the contact surfaces is concentrated on the tip of contacts. With the magnet, on the other hand, the area of contact erosion is widespread on contact surfaces by the rotational motion of break arcs. The effect of the magnet is confirmed to result in a uniform contact erosion area. The arc duration is also shortened and found to be effective for larger circuit current.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128871906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Pantograph Arcing's Impact on Locomotive Equipments 受电弓电弧对机车设备的影响
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034812
Tianzhi Li, Guangning Wu, Lijun Zhou, Guoqiang Gao, Wangang Wang, Bo Wang, Donglai Liu, Dajian Li
{"title":"Pantograph Arcing's Impact on Locomotive Equipments","authors":"Tianzhi Li, Guangning Wu, Lijun Zhou, Guoqiang Gao, Wangang Wang, Bo Wang, Donglai Liu, Dajian Li","doi":"10.1109/HOLM.2011.6034812","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034812","url":null,"abstract":"Pantograph arcing is a common phenomenon when the pantograph head and contact wire have sliding electrical contact. With the speed up of trains, the arcing becomes particularly serious for the irregularity of catenary and tracks¿Cvibration between catenary and pantograph. It is dangerous to the equipment in locomotives for the over-voltage and harmonic caused by the arcing. In order to deal with it, the mechanism and process of pantograph arcing has been analyzed. Over-voltage amplitude and duration caused by the arcing have been studied. Meanwhile, harmonic spectrum, current waveform distortion and their influence to traction transformer have been studied. With the above analyzing results, some effective methods to reduce the hazards have been discussed at last.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129879560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Development of Contact Material Solutions for Low-Voltage Circuit Breaker Applications (2) 低压断路器触点材料解决方案的发展(2)
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2010-11-09 DOI: 10.1109/HOLM.2011.6034790
T. Mutzel, R. Niederreuther
{"title":"Development of Contact Material Solutions for Low-Voltage Circuit Breaker Applications (2)","authors":"T. Mutzel, R. Niederreuther","doi":"10.1109/HOLM.2011.6034790","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034790","url":null,"abstract":"The focus of the experimental studies was in the influence of contact material composition, production parameters and the contact material - breaker interaction, as the performance of the breaker is a function of breaker design, contact material and especially their interaction. Therefore, typical material combinations used for low voltage protection devices were compared by means of their switching behavior and performance. Model-switch tests have been carried out to show this performance under stable and well defined boundary conditions. The chosen test parameters simulate device tests, excluding the influence of switching device kinematics and tolerances. Focus of the tests was to scrutinize the influence of the material composition on the erosion behavior and contact resistance for AgWC materials. Additionally a comparison on the performance of different silver refractory metals like AgW or AgMo at comparable vol.-% refractory metal was made. Furthermore, the impact of different graphite contents, manufacturing parameters and fiber orientation of AgC materials on weld break forces have been worked out. This experimental quantification of influences can be seen as a basis for contact material selection during protection device design.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114254759","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
The Effect of Coil on Combined Three-Subsection Permanent Magnet in Close Magnetic Circuit Model 闭合磁路模型中线圈对组合三分段永磁体的影响
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2008-11-08 DOI: 10.1109/HOLM.2011.6034799
You Jiaxin, Liang Huimin, Ye Xuerong, Zhai Guofu
{"title":"The Effect of Coil on Combined Three-Subsection Permanent Magnet in Close Magnetic Circuit Model","authors":"You Jiaxin, Liang Huimin, Ye Xuerong, Zhai Guofu","doi":"10.1109/HOLM.2011.6034799","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034799","url":null,"abstract":"Working characteristic of the permanent magnet (PM) is a key point of PM relays design. Soft magnetic material and coil will effect the working characteristic of PM. In order to analyze the effect of coil, a combined three-subsection PM in close magnetic circuit model (CTPMC) is built based on the equivalent magnetic circuit, and its theoretical model is established under the magnetic potential effect. Through the theoretical deduction, it is concluded that each PM subsection works at different recoil lines and the working points would change due to the effect of coil. Finally, the above theoretical analysis results are validated by simulation and experiments.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-11-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115630398","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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