2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)最新文献

Influence of Capacitive and Inductive Loads on the Detectability of Arc Faults 容感性负载对电弧故障可检测性的影响

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034794

P. Muller, S. Tenbohlen, R. Maier, M. Anheuser

引用次数: 4

A Study on Mobile Communication Device Structure Design Resisting Dust Particles Ingress 抗粉尘颗粒侵入移动通信设备结构设计研究

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034805

Na Lu, L. Xu, Huang Feng, Y.S. Li

{"title":"A Study on Mobile Communication Device Structure Design Resisting Dust Particles Ingress","authors":"Na Lu, L. Xu, Huang Feng, Y.S. Li","doi":"10.1109/HOLM.2011.6034805","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034805","url":null,"abstract":"The reliability of mobile communication devices is affected by many factors, such as structure design, mechanical and electrical characteristic of devices, electromagnetic disturbance, electrical contact, dynamic environmental, temperature changes, , environmental pollution, etc. Studies show that 14% failure of the electronic products is caused by dust and salt mist. Dust particles ingress electronic device, and contaminate the internal components. This results in electric contact failure and reduced reliability of contact components. It is a very important consideration in electronic product design to protect internal components from operational impairment that due to ingress of dust particles and reduce the impact of dust on the communication device. This paper studies the ability of mobile communication device structure design to resist dust particles ingress and penetration the internal areas. It gives the dust distribution in the mobile phone by experiments and finite element analysis (FEA) using a mobile phone as the representation of the mobile communication device; it provides guidance for structure design and improves reliability of portable electronic products in the future.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"59 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113936705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Influence of Voltage and Current on Arc Duration and Energy of DC Electromagnetic Contactor 电压和电流对直流电磁接触器电弧持续时间和能量的影响

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034775

Kiyoshi Yoshida, K. Sawa, Kenji Suzuki, Masaaki Watanabe, H. Daijima

{"title":"Influence of Voltage and Current on Arc Duration and Energy of DC Electromagnetic Contactor","authors":"Kiyoshi Yoshida, K. Sawa, Kenji Suzuki, Masaaki Watanabe, H. Daijima","doi":"10.1109/HOLM.2011.6034775","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034775","url":null,"abstract":"In this paper, experimental results were described for a general DC electromagnetic contactor switching under a permanent magnet for arc extinguishing. The experiment circuit was a series circuit of source voltage E, resistive load R and DC electromagnetic contactor. The closed contact current Io was adjusted by R. The influence of E and Io on arc duration ta and arc energy Ea of break arc were experimented. The E had been changed within range of 50 -- 500V DC and Io was set from 5 to 30A at each voltage E. Arc voltage and current waveforms were measured with a digital oscilloscope. When E was high, arc duration ta became long. However, in 300V or more, ta shortens when Io is increased. In 200V, influence of Io on ta was not seen and arc duration became almost constant. In 50V, ta became long along with Io, it is clarified that permanent magnets doesn't influence for arc. However, shortening of the arc duration with permanent magnet was seen in 100V or more. We think that effect of Lorentz's force on the arc was different according to E and Io. In addition, when E and Io are high, it was found that arc energy Ea became large. Keywords -- DC electromagnetic contactor, arc discharge, arc duration, magnetic blast, arc energy, permanent magnet","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128467603","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Stress Analysis of Dust Particle on the Electrical Contact Surface 电接触表面粉尘颗粒的应力分析

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034818

Yang Lv, Liangjun Xu

引用次数: 0

A Study of Arc Duration on Supple Carbon Contacts in the Automotive Field 汽车领域柔性碳触点弧长研究

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034807

J. Praquin, C. Gautherot, J. Rivenc, N. Ben Jemaa, E. Carvou, J. B. Mitchell, R. El Abdi

{"title":"A Study of Arc Duration on Supple Carbon Contacts in the Automotive Field","authors":"J. Praquin, C. Gautherot, J. Rivenc, N. Ben Jemaa, E. Carvou, J. B. Mitchell, R. El Abdi","doi":"10.1109/HOLM.2011.6034807","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034807","url":null,"abstract":"Membrane switching technology is commonly used to operate electrical apparatus such as remote controls, automotive switches, mobile phones, etc. This technology is based on a movable contact, mounted in a supple elastomer frame which allows the contact to be pressed against a stationary contact, mounted on a Printed Circuit Board (PCB). The material of the movable contact is typically a carbon-loaded polymer or a metal whereas the PCB electrode structure is copper, coated with a layer of gold. The current trend is to use this technology for power applications such as operating a coil or a direct actuator control. As reported in the literature, for such currents <1A and inductive loads, microarcs occur between rigid, metallic contacts, during break and make. Their duration and subsequent damage depend highly on the material and the mechanical separation. On the other hand, the high contact resistance of a flexible carbon-loaded polymer and the progressive separation due to its flexibility are expected to modify arc ignition and persistence characteristics. In this paper, we present experimental measurements of the electrical characteristics of such contacts and the consequences of arcing on contact reliability. Long contact rise times of the voltage are found compared to common metallic contacts. These complex voltage characteristics have been analyzed to extract arc voltage and duration. It was found that this supple and resistive contact allows an inductive load to be switched with a minor over-voltage and self-protection against arcing compared to common rigid metallic contacts.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125238138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

An Experimental Study to Show the Behavior of Electrical Contact Resistance and Coefficient of Friction at Low Current Sliding Electrical Interfaces 小电流滑动电界面接触电阻和摩擦系数特性的实验研究

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034813

V. Siddeswara Prasad, P. Misra, J. Nagaraju

{"title":"An Experimental Study to Show the Behavior of Electrical Contact Resistance and Coefficient of Friction at Low Current Sliding Electrical Interfaces","authors":"V. Siddeswara Prasad, P. Misra, J. Nagaraju","doi":"10.1109/HOLM.2011.6034813","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034813","url":null,"abstract":"Electrical contact resistance (ECR) and coefficient of friction (COF) are the two parameters that characterize the performance of sliding electrical contacts. Due to geometrical minuteness of the electrical and mechanical phenomena occurring at the sliding interface, it has been extremely difficult to develop widely applicable theoretical models and analytical correlations. Consequently, experimental studies gain importance as the contact manufacturers have to depend on the available experimental data. The scope of present work is limited to light duty sliding contacts, which are commonly used in various radio-electronic devices and control and automated systems. Experimental studies conducted on oxygen-free high conductivity (OFHC) Cu contacts are presented in this paper. Effect of normal force, surface roughness, initial run-in, sliding speed, and liquid lubricants on ECR and COF is studied. Experiments are conducted with the help of indigenously developed test setup, consisting of a reciprocating pin-on-flat sliding arrangement. All contacts showed a decrease in ECR with increase in normal force. At small speeds (��U 1.0 mm/s), both ECR and COF are found to be independent of sliding speed. A significant decrease in ECR and COF is observed with progressive sliding during the initial cycles. Roughness of the flat sample is found to have significant effect on ECR and COF, especially during initial sliding cycles. Contacts exhibited an inverse relationship between ECR and COF in the mild wear regime (0.2 < COF ��U 0.4). Liquid lubricants having low viscosity exhibited reasonably low values of ECR and COF for prolonged sliding duration. Presence of wear debris at the sliding zone is found to have significant effect on both ECR and COF. Wear of the sliding surfaces is analyzed using scanning electron microscopy (SEM) and correlated with the observed behavior of ECR and COF.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133576680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Gold Coated Carbon-Nanotube Surfaces as Low Force Electrical Contacts for MEMS Devices: Part II, Fine Transfer Mechanisms 金涂层碳纳米管表面作为MEMS器件的低力电触点:第二部分，精细传递机制

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034800

J. McBride, S. Spearing, L. Jiang, C. Chianrabutra

引用次数: 12

Characteristics of Overheated Electrical Joints Due to Loose Connection 连接松动引起的电气接头过热的特点

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034795

Xin Zhou, T. Schoepf

引用次数: 10

Effect of Lubricant on Degradation Process of Au-Plated Slip-Ring and Ag-Pd Brush System for Small Electric Power 润滑油对小功率镀金滑环和银钯电刷系统降解过程的影响

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034810

K. Sawa, Yasunori Suzuki, N. Morita, T. Ueno, K. Endo

{"title":"Effect of Lubricant on Degradation Process of Au-Plated Slip-Ring and Ag-Pd Brush System for Small Electric Power","authors":"K. Sawa, Yasunori Suzuki, N. Morita, T. Ueno, K. Endo","doi":"10.1109/HOLM.2011.6034810","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034810","url":null,"abstract":"The authors have been investigating degradation process of Au plated slip ring and Ag-Pd brush system. In almost all cases the lifetime of the sliding system ends, when Au plating layer is worn out, the ring surface is oxidized to be black in color and contact resistance becomes very high. However, the lifetime is greatly changed case by case, while it is very short without lubricant. Even with lubricant the lifetime is varied from about 1000 hours to almost 7000 hours in the past experiments. It is an important issue where such variation comes from. In this paper the effect of lubricant on degradation process of contact resistance is focused on. In the past tests the lubricant is supplied only once before the test. In this test the lubricant is regularly supplied almost every 900 operation hours. The followings can be made clear. Just after the supply of the lubricant the contact resistance fall down just for a short time, but it comes back to the similar value before the supply. However the operation more than 8000 hours is realized. In addition the contact voltage drop increase gradually until 2600 hours and after that it stays almost constant around 70mV. It probably means that the Au plating layer is gradually worn out at the stage of increasing voltage drop, while the Ni base plating layer is totally exposed at the stage of constant voltage drop. The reason of long operation seems to be that the lubricant not only decreases wear but also suppresses oxidation of the Ni layer.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128255852","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Numerical Study of Asperity Distribution in an Electrical Contact 电接触中粗糙度分布的数值研究

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034796

Per Lindholm

引用次数: 3