J. McBride, S. Spearing, L. Jiang, C. Chianrabutra
{"title":"Gold Coated Carbon-Nanotube Surfaces as Low Force Electrical Contacts for MEMS Devices: Part II, Fine Transfer Mechanisms","authors":"J. McBride, S. Spearing, L. Jiang, C. Chianrabutra","doi":"10.1109/HOLM.2011.6034800","DOIUrl":null,"url":null,"abstract":"Material transfer in switching contacts is considered at very low currents, (below 20mA). The transfer process is critical to a wide range of electronic switching technologies and is a limiting factor for MEMs relays. A test system is described and characterized for bench-marking surfaces. This is followed by a study of Multi-walled CNT's (MWCNT's), synthesized on a silicon planar and sputter coated with a gold film. The planar surfaces are mounted on the tip of a piezo-electric actuator and mated with a Au coated hemispherical surface. The switching contacts are tested under conditions typical of MEMS relay applications; 4V, 1mA; with a static contact force of 1mN, results are presented on the bounce process and on the opening characteristic with respect to the melting and boiling voltages for the materials tested.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2011.6034800","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
Material transfer in switching contacts is considered at very low currents, (below 20mA). The transfer process is critical to a wide range of electronic switching technologies and is a limiting factor for MEMs relays. A test system is described and characterized for bench-marking surfaces. This is followed by a study of Multi-walled CNT's (MWCNT's), synthesized on a silicon planar and sputter coated with a gold film. The planar surfaces are mounted on the tip of a piezo-electric actuator and mated with a Au coated hemispherical surface. The switching contacts are tested under conditions typical of MEMS relay applications; 4V, 1mA; with a static contact force of 1mN, results are presented on the bounce process and on the opening characteristic with respect to the melting and boiling voltages for the materials tested.