2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)最新文献_第2页

Contact Resistance with Dissimilar Materials: Bulk Contacts and Thin Film Contacts 不同材料的接触电阻:大块触点和薄膜触点

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034777

Peng Zhang, Y. Lau, W. Tang, M. Gomez, D. French, J. Zier, R. Gilgenbach

引用次数: 8

The Effects of Current Density Variations in Power Contact Interfaces 功率接触界面中电流密度变化的影响

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034781

R. Malucci

引用次数: 9

There is Tin and there is Tin - Characterisation of Tribological and Electrical Properties of Electroplated Tin Surfaces 有锡，也有锡——电镀锡表面摩擦学和电学性能的表征

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034814

F. Ostendorf, T. Wielsch, M. Reiniger

{"title":"There is Tin and there is Tin - Characterisation of Tribological and Electrical Properties of Electroplated Tin Surfaces","authors":"F. Ostendorf, T. Wielsch, M. Reiniger","doi":"10.1109/HOLM.2011.6034814","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034814","url":null,"abstract":"Electroplated tin surfaces are one of the most used and wide spread contact surfaces for connectors in fields of electrical connectivity and applications. The current study focused on a detailed characterisation of tribological and electrical properties of different electroplated matt and bright tin surfaces to get a deeper insight to the relation of wear failure mechanisms and electrical contact resistance characteristics. The experiments were carried out with a special in-house developed tribometer with variable sliding path, dynamically changeable normal loads and sliding velocities to simulate the sliding motion of connector contacts during insertion and withdrawal. This setup can not only record the occurring friction forces, but has also the capability to measure the contact resistance during every sliding cycle. In a first step we have determined the influence of normal load, sliding distance and velocity on the contact resistance and the friction force by means of a statistical DoE analysis. Hereby we found, that from an electrical point of view matt tin surfaces have a more stable contact resistance characteristic than bright tin surfaces, but under pure tribological aspects bright tin surfaces excel by initially lower friction force values. In the second step the wear tracks were investigated by means of SEM, EDX and optical 3D-microscopy to clarify which major wear failure mechanisms cause the observed different electrical and tribological properties. Within these investigations we were able to identify tin surface specific wear failure mechanisms which can be brought into correlation to the findings of the DoE analysis and can explain the observed contact resistance characteristics.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"287 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116236993","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Pantograph Arc's Energy Characters under Various Load 不同载荷下受电弓电弧的能量特性

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034811

Bo Wang, Guangning Wu, Lijun Zhou, Guoqiang Gao, Wangang Wang, Donglai Liu, Dajian Li, Tianzhi Li

{"title":"Pantograph Arc's Energy Characters under Various Load","authors":"Bo Wang, Guangning Wu, Lijun Zhou, Guoqiang Gao, Wangang Wang, Donglai Liu, Dajian Li, Tianzhi Li","doi":"10.1109/HOLM.2011.6034811","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034811","url":null,"abstract":"Sliding electrical contact is the main process for locomotive to carry current in electrical railways. The relative sliding velocity between pantograph and cantenary increases with the speeding up of locomotive, However¿Cthe adhesiveness between pantograph and cantenary decreases. Meanwhile, the contact status of pantograph and catenary get worse. Pantograph arc occurred frequently under these conditions. Pantograph arcing eroded pantograph slider and contact wire seriously. That affected the contacting morphology between pantograph and contact wire severely. The erosion degree is mainly determined by arcing energy. In this paper, the pantograph arc's electrical parameters such as voltage, current and energy were tested under different load by Pantograph-Catenary Arcing Experiment System (PCAES). Relationship between arc's average duration and traction current was analyzed. Influence of load power factor was studied too. Relationship between arc energy and load character was studied at last. It is demonstrated that arc's average duration becomes longer with the increasing of traction current. Arc duration under inductive load is longer than resistive load. Arc energy decreases when load power factor increase.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123555661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Fretting Behavior of Nickel Coatings for Electrical Contact Applications 电接触用镍镀层的微动性能

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034784

S. Noel, D. Alamarguy, S. Correia, P. Laurat

{"title":"Fretting Behavior of Nickel Coatings for Electrical Contact Applications","authors":"S. Noel, D. Alamarguy, S. Correia, P. Laurat","doi":"10.1109/HOLM.2011.6034784","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034784","url":null,"abstract":"Fretting remains a major cause of connector failure and can impair reliability in complex systems. Oxidizable metals such as tin, copper and nickel are particularly prone to fretting degradation. We report here the first results of an investigation on fretting of nickel contacts with two types of deposits. Sulfate nickel layers are electrodeposited in different conditions and show very different behaviours during fretting tests. The characteristics of the layers are analyzed and show different compositions and microstructures. The compositions are measured by X-Ray Photoelectron Spectroscopy (XPS) which allows determining the chemical nature of the compounds formed during exposure to air. Topography is measured by AFM and the roughness and grain characteristics are assessed. Electrical properties at the micro/nanoscale are measured with the CP-AFM technique. Various loads are applied to the cantilever beam; the electrical characterization is performed versus the load. The results of fretting experiments are analyzed in terms of fretting regimes. The fretting regimes occurring during the test of the matte layers involve partial slip which delays the occurrence of contact resistance (Rc) increase. Gross slip in the interface is shown to create very poorly conducting wear debris leading to drastic increase of Rc. This study is part of a larger one aiming at tailoring coatings allowing the best tribological and electrical behaviors during fretting of nickel contacts.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122316887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

Method to Design Arc Fault Detection Algorithm Using FPGA 基于FPGA的电弧故障检测算法设计方法

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034793

Michael Rabla, P. Schweitzer, E. Tisserand

引用次数: 8

Correlation of Intrinsic Thin Film Stress Evolution and IMC Growth with Whisker Growth 薄膜内禀应力演化及IMC生长与晶须生长的关系

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034804

C. L. Rodekohr, G. Flowers, M. Bozack, R. Jackson, R. Martens, Z. Zhao, E. R. Crandall, V. Starman, T. Bitner, J. Street

引用次数: 6

High Current Arc Erosion on Copper Electrodes in Air 空气中铜电极的大电流电弧腐蚀

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034779

Thomas Øyvang, E. Fjeld, W. Rondeel, S. T. Hagen

引用次数: 10

Contact Resistance Characteristics of Relays Operated in Silicone-Vapor-Containing and Non-Silicone Atmospheres with Different Electrical Load Conditions 不同电负载条件下含硅气和非硅气环境下继电器的接触电阻特性

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034787

M. Hasegawa, N. Kobayashi, Y. Kohno

{"title":"Contact Resistance Characteristics of Relays Operated in Silicone-Vapor-Containing and Non-Silicone Atmospheres with Different Electrical Load Conditions","authors":"M. Hasegawa, N. Kobayashi, Y. Kohno","doi":"10.1109/HOLM.2011.6034787","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034787","url":null,"abstract":"Influences of vapors evaporated from an acryl-based non-silicone-type polymeric cured material and conventional silicone-containing polymeric cured materials were evaluated with respect to their effects on contact resistance characteristics of relay contacts at an ambient temperature of 120ºC. More specifically, a commercially-available mechanical relay (AgSnIn contacts) was sealed into a metal can with one of these materials, and placed in a heating chamber to operate, at an operating frequency of 0.5 Hz, 40,000 break operations of an inductive DC 14V-1A, 14V-0.4A, 10V-1A, 5V-1A load currents, or a resistive DC 14V-1A load current. Contact resistance values were measured at every 50 operations. As a result, the relays sealed with the acryl-based non-silicone-type polymeric cured material showed no deterioration in contact resistances, irrespective of the load conditions. On the other hand, the relays sealed with the silicone-containing polymeric cured materials showed more significant deteriorations and fluctuations of the contact resistance characteristics, and certain influences of load conditions on their behaviors were recognized.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115623363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Discrete Analysis of Gold Surface Asperities Deformation under Spherical Nano-Indentation Towards Electrical Contact Resistance Calculation 面向接触电阻计算的球形纳米压痕下金表面凹凸变形离散分析

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034798

B. Arrazat, P. Duvivier, V. Mandrillon, K. Inal

{"title":"Discrete Analysis of Gold Surface Asperities Deformation under Spherical Nano-Indentation Towards Electrical Contact Resistance Calculation","authors":"B. Arrazat, P. Duvivier, V. Mandrillon, K. Inal","doi":"10.1109/HOLM.2011.6034798","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034798","url":null,"abstract":"MEMS ohmic switches have demonstrated interesting performances due in part to their low contact resistance which depends on multiple contributions, one amongst them is the roughness of the contact area. In fact, the contact area is composed by clusters asperities that have different sizes, heights and curvature radii. In this work, we investigate the discrete mechanical deformation of asperities at the nano-scale, in the micro-switch pressure range. Loads from 250 µN up to 2 mN are applied by a nano-indenter with a spherical diamond tip (48.5 µm curvature radius). The resulting contact areas are investigated by AFM topography measurements and treated by digital image processing. As a result for each applied loads, the asperities in plastic deformation mode are sorted and used to determine a value of \"surface hardness\", coherent with the hardness measured by Berkovich nano-indentation. Finally, the asperities identified in plastic deformation mode are used as inputs for the calculation of the electrical contact resistances of equivalent micro-switches.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123448456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 15