{"title":"功率接触界面中电流密度变化的影响","authors":"R. Malucci","doi":"10.1109/HOLM.2011.6034781","DOIUrl":null,"url":null,"abstract":"Greenwood's approach to interaction between current carrying contact spots was used to analyze the degradation of single spots. The degradation is assumed to occur from electro-migration which causes a non-uniform increase in the effective resistivity across each contact spot. The latter results were used to evaluate the degradation of a simulated multi-spot interface to demonstrate the cascade failure mode believed to occur in power contacts. In addition, factors such as spot size, position and interaction with nearby spots were assessed in their impact on current density variation across the contact region.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"The Effects of Current Density Variations in Power Contact Interfaces\",\"authors\":\"R. Malucci\",\"doi\":\"10.1109/HOLM.2011.6034781\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Greenwood's approach to interaction between current carrying contact spots was used to analyze the degradation of single spots. The degradation is assumed to occur from electro-migration which causes a non-uniform increase in the effective resistivity across each contact spot. The latter results were used to evaluate the degradation of a simulated multi-spot interface to demonstrate the cascade failure mode believed to occur in power contacts. In addition, factors such as spot size, position and interaction with nearby spots were assessed in their impact on current density variation across the contact region.\",\"PeriodicalId\":197233,\"journal\":{\"name\":\"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.2011.6034781\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2011.6034781","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Effects of Current Density Variations in Power Contact Interfaces
Greenwood's approach to interaction between current carrying contact spots was used to analyze the degradation of single spots. The degradation is assumed to occur from electro-migration which causes a non-uniform increase in the effective resistivity across each contact spot. The latter results were used to evaluate the degradation of a simulated multi-spot interface to demonstrate the cascade failure mode believed to occur in power contacts. In addition, factors such as spot size, position and interaction with nearby spots were assessed in their impact on current density variation across the contact region.
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