2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)最新文献_第3页

A Summary Report on the Mechanism of Electric Contact Failure Due to Particle Contamination 微粒污染引起电触点失效机理综述

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034803

Ji Gao Zhang

{"title":"A Summary Report on the Mechanism of Electric Contact Failure Due to Particle Contamination","authors":"Ji Gao Zhang","doi":"10.1109/HOLM.2011.6034803","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034803","url":null,"abstract":"Particle contamination may cause serious electric contact failure. However a series of dust simulation tests could hardly reproduce the real contact problem of intermittent high resistance, i.e. very few contact failure has been found during the tests. This paper is based on testing and analyzing many practical failed connector contacts in mobile phones. The special features of the failed contacts that are due to particle contamination are then summarized. The mechanism of connector contact high resistance failure is that during micro movement, contaminated particles are accumulated and inserted at the interface instead of being pushed away. Therefore important criteria should be met: micro movement with irregular directions, variable moving lengths to wear out surface materials, stirring up particles of dust and corrosion products caused by the water soluble salts in the dust, trapping the dust particles and thus embed the particles into the contact surface, presence of some organics acting as adhesives to adhere particles together to prevent them from spreading away during micro movements. Materials within dust particles such as quartz, feldspar, mica, calcite and carbon etc. may also contribute to the contact failure. After several simulation tests it is verified that contact failure can occur only if the testing conditions and parameters include the above discussed phenomena. The testing and theoretical result have greatly convinced that further research is necessary in order to create and develop a workable simulation dust testing system for connectors.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130077727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Selected Aspects of the Electrical Behavior in Sliding Electrical Contacts 滑动电触点电气行为的若干方面

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034823

C. Holzapfel

引用次数: 17

Computational Modeling and Analysis of a Contact Pair for the Prediction of Fretting Dependent Electrical Contact Resistance 接触副微动相关电接触电阻预测的计算建模与分析

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034797

K. Mashimo, Y. Ishimaru

{"title":"Computational Modeling and Analysis of a Contact Pair for the Prediction of Fretting Dependent Electrical Contact Resistance","authors":"K. Mashimo, Y. Ishimaru","doi":"10.1109/HOLM.2011.6034797","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034797","url":null,"abstract":"A two-dimensional computational model of fretting corrosion was proposed by the authors. The two-dimensional simulation result was reported in the previous paper. Presently, the model is extended to three-dimensional space. This paper focuses on the electrical contact resistance profile, which is caused by particle generation, oxidation, and transportation at the interface of connector terminals. The material used in the study is tin-plated copper alloy. The scope of the simulation is limited between the initial state and the first peak of resistance profile curve. The model for particle generation, oxidation, and transportation is based on cellular automata. On the other hand, the resistance profile is calculated with the model based on equivalent resistor network. In this case, the calculation of overall resistance value is equivalent to the solution of simultaneous equations. Typically, the authors used the conjugate gradient method for solving the equations. The simulated resistance profiles were compared with experimental results. The peak heights of the resistance profile agree with the experimental results. Nevertheless, further investigation is still required on the compatibility with the physical theory. The results indicate that this model can describe the resistance altering tendency and the peak heights caused by fretting corrosion.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122381710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

Research on Fretting Resistance and Fretting Wear Property of Ni-Au Contact Pair Ni-Au接触副微动阻力及微动磨损性能研究

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034785

Xueyan Lin, Liang-jun Xu, Yan-Chao Shao, Guoping Luo, Hong-Xue Zhang

引用次数: 7

Transient Phenomena from Melting to Electric Discharge during Making and Breaking Operations of Electric Contacts 电触点合断过程中熔化到放电的瞬态现象

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034791

Takayuki Kudo, N. Wakatsuki, N. Takatsu

引用次数: 0

RF Current Produced from Electrical Arcing 电弧产生的射频电流

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034792

J. Shea, Jason B. Carrodus

引用次数: 12

Experimental Investigation of the Interaction of Interrupting Arcs and Gassing Polymer Walls 中断电弧与气体聚合物壁相互作用的实验研究

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034774

D. Gonzalez, H. Pursch, F. Berger

引用次数: 15

A Preliminary Investigation of Graphite, Graphene and Carbon Nanotubes (CNT's) as Solid State Lubricants 石墨、石墨烯和碳纳米管作为固态润滑剂的初步研究

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034776

A. Loyd, J. Hemond, R. Martens

引用次数: 5

Stress-Strain Response of Copper-Based Spring Materials under Forward and Reverse Deformations and Its Mathematical Description 正、反向变形下铜基弹簧材料的应力应变响应及其数学描述

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034819

Y. Hattori, K. Furukawa, F. Yoshida

{"title":"Stress-Strain Response of Copper-Based Spring Materials under Forward and Reverse Deformations and Its Mathematical Description","authors":"Y. Hattori, K. Furukawa, F. Yoshida","doi":"10.1109/HOLM.2011.6034819","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034819","url":null,"abstract":"The reliability of a connector depends on the contact force generated by the spring in the terminal of a connector. The springs are commonly formed by stamping from a strip of spring material. Therefore, the prediction of the force - displacement relation by the finite element method (FEM) is very important for the design of terminals. For simulation, an accurate model of stress-strain (s-s) responses of the materials is required. When the materials are deformed in the forward and then the reverse directions, almost all spring materials show different s-s responses between the two directions, due to the Bauschinger effect. This phenomenon makes simulation difficult because the s-s response depends on the prior deformation of the material. In this paper, the s-s response of copper-based materials, which were measured by tension and compression testing, will be presented. The mathematical description of experimental results will also be reported with the Yoshida-Uemori model, which is a constitutive model having high capability of describing the elastic and plastic behavior of cyclic deformation. The calculated s-s responses were in good agreement with the corresponding experimental results. Therefore, the use of this model for FE simulation would be recommended for a more accurate prediction of force-displacement relation of the spring.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130346022","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Degradation Phenomena of Electrical Contacts Using Hammering Oscillating Mechanism and Micro-Sliding Mechanism- Contact Resistance and Its Model 锤击振荡机构和微滑动机构电触点退化现象——触点电阻及其模型

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034821

S. Wada, K. Sawa

{"title":"Degradation Phenomena of Electrical Contacts Using Hammering Oscillating Mechanism and Micro-Sliding Mechanism- Contact Resistance and Its Model","authors":"S. Wada, K. Sawa","doi":"10.1109/HOLM.2011.6034821","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034821","url":null,"abstract":"Authors have developed the mechanism which gives damping vibration to electrical contacts by reciprocal hammering-oscillation and the other new mechanism which gives periodical micro-sliding to electrical contacts directly driven by a magmetostrictive actuator or a piezo-electrical one. It was shown that each mechanism was able to make a test simulate an actual degradation phenomenon on electrical contacts by the influence of micro-oscillation. Using the above mechanisms and their models they have studied the influences of a micro-oscillation on contact resistance. In this paper, first, it was shown that there was a degradation phenomenon of electrical contacts by experimental results using micro-sliding mechanism (MSM). And it was also shown that the phenomenon was depended on contact frictional force between a male-pin and a female-pin of a connector and sliding stroke. Second, it was made clear that there was the parallel degradation phenomenon of electrical contacts by experimental results using hammering oscillating mechanism (HOM). And the phenomenon was depended on the above contact frictional force and impulsive acceleration generated by a hammering ball. Finally, by comparing the above experimental results, the authors obtained that the similarity between two types of phenomena came from similar mechanical parameters like amplitude, natural frequency and damping ratio which characterized time-sequential relative displacement on an electrical contact, though the mechanism was quite different from each other, as the former by sliding and the latter by hammering. And they recognized that phenomena occurred more frequently in actual static contacts under the influence of some oscillation or vibration.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128391503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1