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2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)最新文献

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A Summary Report on the Mechanism of Electric Contact Failure Due to Particle Contamination 微粒污染引起电触点失效机理综述
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034803
Ji Gao Zhang
{"title":"A Summary Report on the Mechanism of Electric Contact Failure Due to Particle Contamination","authors":"Ji Gao Zhang","doi":"10.1109/HOLM.2011.6034803","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034803","url":null,"abstract":"Particle contamination may cause serious electric contact failure. However a series of dust simulation tests could hardly reproduce the real contact problem of intermittent high resistance, i.e. very few contact failure has been found during the tests. This paper is based on testing and analyzing many practical failed connector contacts in mobile phones. The special features of the failed contacts that are due to particle contamination are then summarized. The mechanism of connector contact high resistance failure is that during micro movement, contaminated particles are accumulated and inserted at the interface instead of being pushed away. Therefore important criteria should be met: micro movement with irregular directions, variable moving lengths to wear out surface materials, stirring up particles of dust and corrosion products caused by the water soluble salts in the dust, trapping the dust particles and thus embed the particles into the contact surface, presence of some organics acting as adhesives to adhere particles together to prevent them from spreading away during micro movements. Materials within dust particles such as quartz, feldspar, mica, calcite and carbon etc. may also contribute to the contact failure. After several simulation tests it is verified that contact failure can occur only if the testing conditions and parameters include the above discussed phenomena. The testing and theoretical result have greatly convinced that further research is necessary in order to create and develop a workable simulation dust testing system for connectors.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130077727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Selected Aspects of the Electrical Behavior in Sliding Electrical Contacts 滑动电触点电气行为的若干方面
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034823
C. Holzapfel
{"title":"Selected Aspects of the Electrical Behavior in Sliding Electrical Contacts","authors":"C. Holzapfel","doi":"10.1109/HOLM.2011.6034823","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034823","url":null,"abstract":"In this study, a simple model system is used for describing selected aspects of the electrical behavior in sliding electrical contacts. The resistance of a slip ring consists of static components (e.g. brushes), systematically varying components (effective track resistance) as well as non-periodic components (contact noise). Depending on the speed and wear state of the system the electrical behavior will be fundamentally different.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125232725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Computational Modeling and Analysis of a Contact Pair for the Prediction of Fretting Dependent Electrical Contact Resistance 接触副微动相关电接触电阻预测的计算建模与分析
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034797
K. Mashimo, Y. Ishimaru
{"title":"Computational Modeling and Analysis of a Contact Pair for the Prediction of Fretting Dependent Electrical Contact Resistance","authors":"K. Mashimo, Y. Ishimaru","doi":"10.1109/HOLM.2011.6034797","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034797","url":null,"abstract":"A two-dimensional computational model of fretting corrosion was proposed by the authors. The two-dimensional simulation result was reported in the previous paper. Presently, the model is extended to three-dimensional space. This paper focuses on the electrical contact resistance profile, which is caused by particle generation, oxidation, and transportation at the interface of connector terminals. The material used in the study is tin-plated copper alloy. The scope of the simulation is limited between the initial state and the first peak of resistance profile curve. The model for particle generation, oxidation, and transportation is based on cellular automata. On the other hand, the resistance profile is calculated with the model based on equivalent resistor network. In this case, the calculation of overall resistance value is equivalent to the solution of simultaneous equations. Typically, the authors used the conjugate gradient method for solving the equations. The simulated resistance profiles were compared with experimental results. The peak heights of the resistance profile agree with the experimental results. Nevertheless, further investigation is still required on the compatibility with the physical theory. The results indicate that this model can describe the resistance altering tendency and the peak heights caused by fretting corrosion.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122381710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Research on Fretting Resistance and Fretting Wear Property of Ni-Au Contact Pair Ni-Au接触副微动阻力及微动磨损性能研究
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034785
Xueyan Lin, Liang-jun Xu, Yan-Chao Shao, Guoping Luo, Hong-Xue Zhang
{"title":"Research on Fretting Resistance and Fretting Wear Property of Ni-Au Contact Pair","authors":"Xueyan Lin, Liang-jun Xu, Yan-Chao Shao, Guoping Luo, Hong-Xue Zhang","doi":"10.1109/HOLM.2011.6034785","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034785","url":null,"abstract":"Au-Au plated contact pairs have long been the most frequently used in electrical and telecommunication system due to their outstanding electrical, physical and chemical properties. However, the increasingly high cost of gold plated connectors forces the manufacturers to seek some inexpensive substitution due to serious global competition. Ni and/or Ni alloy are naturally chosen to make Ni-Au contact pairs. In this paper, Ni-Au contact pairs, that is, Ni is used as probe and gold plating as coupon, are done fretting researches. Fretting tests are finished at the condition of fretting amplitude 200 ¿Ym, fretting speed 400¿Ym/s, 3 various normal forces and 5 different number of fretting cycles, 3 repeat times for every fretting conditions. Contact resistance is recorded by capture card with speed 14 data/fretting cycle and measured at constant DC current 100mA and limited voltage 1V. Morphology and element composition of fretting wear track are observed and analyzed to study the fretting process and mechanism of Ni-Au contact pairs.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"176 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127176334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Transient Phenomena from Melting to Electric Discharge during Making and Breaking Operations of Electric Contacts 电触点合断过程中熔化到放电的瞬态现象
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034791
Takayuki Kudo, N. Wakatsuki, N. Takatsu
{"title":"Transient Phenomena from Melting to Electric Discharge during Making and Breaking Operations of Electric Contacts","authors":"Takayuki Kudo, N. Wakatsuki, N. Takatsu","doi":"10.1109/HOLM.2011.6034791","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034791","url":null,"abstract":"During breaking contact, contact voltage vc shows irregular, random, or unexpected responses after vc=Um until mechanical contact current shutdown or arc ignition. The dependencies of the phenomena on energizing current and residual inductance were confirmed. Different contact materials (Ag, Au, Ir, Pd, Pt, Zn) show the same contact current and voltage features. Measured index values are slightly different. Combined contact of Pt and Zn electrodes shows that the phenomena mainly depend on the negative electrode metal. In our paper, it is confirmed that the so-called \"initial arc\" phenomenon has a close relation with arc ignition, but is independent of arc phenomena.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127440823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
RF Current Produced from Electrical Arcing 电弧产生的射频电流
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034792
J. Shea, Jason B. Carrodus
{"title":"RF Current Produced from Electrical Arcing","authors":"J. Shea, Jason B. Carrodus","doi":"10.1109/HOLM.2011.6034792","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034792","url":null,"abstract":"The RF current produced by an air arc in a 480Vac line-line system was investigated for arcing currents in the range of 5Arms to 100Arms. Time resolved frequency maps, obtained using a real-time spectrum analyzer (RSA), were used to show how polarity and electrode material affected the measured RF intensity. In addition to the experimental data, a model was created to support a new theory explaining the origins of the RF current. This proposed theory takes into consideration the electrode surface geometry, cathode spot current density, and spot motion/stability properties to develop an electrical model of the arc. The model was used to illustrate how the RF current intensity changes with arc current magnitude. This work is useful to those who want to gain an understanding of RF currents generated in arcs, especially for those developing arc fault sensing devices.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"228 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116238847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Experimental Investigation of the Interaction of Interrupting Arcs and Gassing Polymer Walls 中断电弧与气体聚合物壁相互作用的实验研究
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034774
D. Gonzalez, H. Pursch, F. Berger
{"title":"Experimental Investigation of the Interaction of Interrupting Arcs and Gassing Polymer Walls","authors":"D. Gonzalez, H. Pursch, F. Berger","doi":"10.1109/HOLM.2011.6034774","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034774","url":null,"abstract":"Gassing polymer walls are used in circuit breakers to improve their interrupting and current limiting performance. The energy of the arc will be partially absorbed by the polymer walls, causing chemical degradation and evaporation. The evaporated gas reaches the arc plasma changing its composition and influencing its burning conditions. The resulting increase on pressure and arc voltage contributes to current limiting and reduction of arcing time. This paper deals with experimental results of the investigation of the interaction between the arc and gassing polymer walls. The simultaneous detection of pressure in the arc chamber, of arc current and voltage and the use of high speed photography and SEM analysis contribute to the characterisation of the influence of the polymer gases on the arc behaviour. The results of the ex-periments are used to verify numerical models.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117002824","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
A Preliminary Investigation of Graphite, Graphene and Carbon Nanotubes (CNT's) as Solid State Lubricants 石墨、石墨烯和碳纳米管作为固态润滑剂的初步研究
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034776
A. Loyd, J. Hemond, R. Martens
{"title":"A Preliminary Investigation of Graphite, Graphene and Carbon Nanotubes (CNT's) as Solid State Lubricants","authors":"A. Loyd, J. Hemond, R. Martens","doi":"10.1109/HOLM.2011.6034776","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034776","url":null,"abstract":"Graphite is well known and has been extensively characterized in its performance as a solid state lubricant, but has not typically been successfully implemented for low voltage/current electrical contacts. Recent advances have shown that both graphene and carbon nanotubes (CNT) exhibit novel properties and could find potential use as solid state lubricants. A comparison of various properties including contact resistance and friction behavior on Au, Ag, and Sn surface finishes has been undertaken to explore the similarities and differences in these different forms of carbon.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130657153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Compliant Carbon Nanotube-Metal Contact Structures 柔性碳纳米管-金属接触结构
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034802
O. Yaglioglu, R. Martens, A. Cao, Alexander H. Slocum
{"title":"Compliant Carbon Nanotube-Metal Contact Structures","authors":"O. Yaglioglu, R. Martens, A. Cao, Alexander H. Slocum","doi":"10.1109/HOLM.2011.6034802","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034802","url":null,"abstract":"This paper discusses a method to fabricate contact structures using carbon nanotubes (CNTs) and thin film metal deposition which can be used in applications such as electromechanical probes. We discuss the electrical resistance of CNT structures and electrical enhancement schemes using various metal deposition techniques including sputtering and electroless metal plating. Functional CNT-metal composite contact structures are demonstrated and test results, along with failure mechanisms are discussed. We also discuss factors affecting mechanical compliance, electrical resistance and trade offs between them.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"279 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127288521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Evaluation of Contact Surface Damages with an Optical Cross-Section Method 用光学截面法评价接触面损伤
2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034788
M. Hasegawa, Keisuke Takahashi
{"title":"Evaluation of Contact Surface Damages with an Optical Cross-Section Method","authors":"M. Hasegawa, Keisuke Takahashi","doi":"10.1109/HOLM.2011.6034788","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034788","url":null,"abstract":"Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during switching operations. Conventionally, erosion and transfer characteristics of various contact materials under different load conditions have been mainly studied based on observation and evaluation of contact surfaces after switching operation tests. A further detailed study will become possible if we can observe and numerically evaluate a changing process of surface damages (especially, growth of a crater and/or a pip) on contact surfaces during switching operations. For that purpose, a numerical evaluation system of contact surface damages by way of an optical cross-section method is being constructed. In this paper, Ag contacts were operated to break a DC inductive 14V-2A load current for 50,000 operations, and the contact surface profile (a crater growth process) was numerically evaluated with this system at every 2,000 operations during the switching operations. From the results, certain changes in the cathode surface during the switching operations were able to be observed.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"82 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120893938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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