2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)最新文献_第4页

AC Electrical Arcs with Graphite Electrodes 石墨电极交流电弧

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034809

E. Carvou, J. B. Mitchell, N. Ben Jemaa, S. Tian, Z. Belhaja

{"title":"AC Electrical Arcs with Graphite Electrodes","authors":"E. Carvou, J. B. Mitchell, N. Ben Jemaa, S. Tian, Z. Belhaja","doi":"10.1109/HOLM.2011.6034809","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034809","url":null,"abstract":"In order to improve the safety of potentially hazardous situations such as \"hot\" disconnections of equipment or deteriorated connections, a deeper knowledge of the characteristics of the arcs thus produced and their subsequent damage to contact materials, insulating and wiring, is needed. Numerous studies have been performed on DC arcs as they appear in automotive applications. There is however, a strong need to study arcs in the domain of alternating current, in order to understand their consequences to safety and reliability in domestic applications. The purpose of this study is to extend our knowledge of AC-arc characteristics and consequences (e.g. risk of fire ignition) in order to improve the reliability of security devices such as arc fault circuit interrupters (AFCI). Conditions when arcs could initiate and reinitiate are determined, for a voltage of 220V (50Hz), a current from 1A to 4A, electrodes made with copper or graphite and gaps from 10µm to 1000µm. The conclusion of this work is that arcs produced by graphite electrodes present some characteristics which differ significantly from metallic electrode arcs, especially regarding ignition and re-ignition capability. This behavior should be taken into count for safety considerations.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128994492","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Stress-Strain Response of Copper-Based Spring Materials under Forward and Reverse Deformations and Its Mathematical Description 正、反向变形下铜基弹簧材料的应力应变响应及其数学描述

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034819

Y. Hattori, K. Furukawa, F. Yoshida

{"title":"Stress-Strain Response of Copper-Based Spring Materials under Forward and Reverse Deformations and Its Mathematical Description","authors":"Y. Hattori, K. Furukawa, F. Yoshida","doi":"10.1109/HOLM.2011.6034819","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034819","url":null,"abstract":"The reliability of a connector depends on the contact force generated by the spring in the terminal of a connector. The springs are commonly formed by stamping from a strip of spring material. Therefore, the prediction of the force - displacement relation by the finite element method (FEM) is very important for the design of terminals. For simulation, an accurate model of stress-strain (s-s) responses of the materials is required. When the materials are deformed in the forward and then the reverse directions, almost all spring materials show different s-s responses between the two directions, due to the Bauschinger effect. This phenomenon makes simulation difficult because the s-s response depends on the prior deformation of the material. In this paper, the s-s response of copper-based materials, which were measured by tension and compression testing, will be presented. The mathematical description of experimental results will also be reported with the Yoshida-Uemori model, which is a constitutive model having high capability of describing the elastic and plastic behavior of cyclic deformation. The calculated s-s responses were in good agreement with the corresponding experimental results. Therefore, the use of this model for FE simulation would be recommended for a more accurate prediction of force-displacement relation of the spring.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130346022","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Degradation Phenomena of Electrical Contacts Using Hammering Oscillating Mechanism and Micro-Sliding Mechanism- Contact Resistance and Its Model 锤击振荡机构和微滑动机构电触点退化现象——触点电阻及其模型

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034821

S. Wada, K. Sawa

{"title":"Degradation Phenomena of Electrical Contacts Using Hammering Oscillating Mechanism and Micro-Sliding Mechanism- Contact Resistance and Its Model","authors":"S. Wada, K. Sawa","doi":"10.1109/HOLM.2011.6034821","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034821","url":null,"abstract":"Authors have developed the mechanism which gives damping vibration to electrical contacts by reciprocal hammering-oscillation and the other new mechanism which gives periodical micro-sliding to electrical contacts directly driven by a magmetostrictive actuator or a piezo-electrical one. It was shown that each mechanism was able to make a test simulate an actual degradation phenomenon on electrical contacts by the influence of micro-oscillation. Using the above mechanisms and their models they have studied the influences of a micro-oscillation on contact resistance. In this paper, first, it was shown that there was a degradation phenomenon of electrical contacts by experimental results using micro-sliding mechanism (MSM). And it was also shown that the phenomenon was depended on contact frictional force between a male-pin and a female-pin of a connector and sliding stroke. Second, it was made clear that there was the parallel degradation phenomenon of electrical contacts by experimental results using hammering oscillating mechanism (HOM). And the phenomenon was depended on the above contact frictional force and impulsive acceleration generated by a hammering ball. Finally, by comparing the above experimental results, the authors obtained that the similarity between two types of phenomena came from similar mechanical parameters like amplitude, natural frequency and damping ratio which characterized time-sequential relative displacement on an electrical contact, though the mechanism was quite different from each other, as the former by sliding and the latter by hammering. And they recognized that phenomena occurred more frequently in actual static contacts under the influence of some oscillation or vibration.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128391503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

The Effect of Various Atmospheric Temperature on the Contact Resistance of Sliding Contact on Silver Coating Slip Ring and Silver Graphite Brush 不同大气温度对镀银滑环和银石墨刷滑动触点接触电阻的影响

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034816

Emad Barnawi, K. Sawa, N. Morita, T. Ueno

{"title":"The Effect of Various Atmospheric Temperature on the Contact Resistance of Sliding Contact on Silver Coating Slip Ring and Silver Graphite Brush","authors":"Emad Barnawi, K. Sawa, N. Morita, T. Ueno","doi":"10.1109/HOLM.2011.6034816","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034816","url":null,"abstract":"The performance and reliability of electric motors, electric devices and electrical connections depend on the quality of their materials. One suitable material that is used in the electrical field is silver, because of its high electrical and thermal conductivities. Laboratory studies were made of the effect of temperature changes on a silver coated slip ring and silver graphite brushes. Over the past months, a study have been made on sliding contact using copper ring and natural graphite brush, as compare the copper ring and natural graphite brush, and silver coating ring and silver graphite brush. The contact voltage drop of the copper ring and natural graphite brush increased with the sliding time. However, the contact voltage drop of the silver coated ring and silver graphite brush had little change. In this study we focused on the contact voltage drop, surface film and brush wear at low temperature range -15 to 0 ¿Z under using silver material. The main rule of low current sliding contact should combine high wear resistance, low friction with stable contact voltage drop. To meet this requirement we realized that at 70 wt% silver brush, we could reach to this requirement.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129156313","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Effect of Contact Parameters on Current Density Distribution in a Contact Interface 接触参数对接触界面电流密度分布的影响

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034783

M. Myers, M. Leidner, H. Schmidt

引用次数: 15

Study on Characterization of Electrical Contact between Pantograph and Catenary 受电弓与接触网电接触特性的研究

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034815

Wangang Wang, Anping Dong, Guangning Wu, Guoqiang Gao, Lijun Zhou, Bo Wang, Yi Cui, Donglai Liu, Dajian Li, Tianzhi Li

{"title":"Study on Characterization of Electrical Contact between Pantograph and Catenary","authors":"Wangang Wang, Anping Dong, Guangning Wu, Guoqiang Gao, Lijun Zhou, Bo Wang, Yi Cui, Donglai Liu, Dajian Li, Tianzhi Li","doi":"10.1109/HOLM.2011.6034815","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034815","url":null,"abstract":"Perfect sliding contact which requires appropriate contact force between pantograph and contact wire is the key point to guarantee the stability of current collection in locomotive. In order to study on characterization of electrical contact between pantograph and catenary, first, a novel test apparatus of pantograph electrical contact has been developed according to the filed application. The apparatus can simulate laterally (zigzag) movement, vertical vibration and the flexible line contact between pantograph contact strip and contact wire. Then, electrical contact experiments are carried out using this apparatus. Characteristics of static contact resistance under various contact force and traction current are analyzed. A fitted formula for contact resistance is proposed which have two independent variables of contact force and traction current. Possible mechanism for variation of contact resistance is represented in microscopic view of contact surface. It is demonstrated that the static contact resistance decreases with the contact force and traction current increasing.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124957231","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 18

The Influence of the Organic Compounds on the Contaminated Electrical Contacts 有机化合物对污染电触点的影响

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034822

Yilin Zhou, Yang Lv, Hao Wang

引用次数: 5

Growth of Sn Whiskers under Net Compressive and Tensile Stress States 净压缩和拉应力状态下Sn晶须的生长

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034820

E. R. Crandall, G. Flowers, R. Jackson, P. Lall, M. Bozack

{"title":"Growth of Sn Whiskers under Net Compressive and Tensile Stress States","authors":"E. R. Crandall, G. Flowers, R. Jackson, P. Lall, M. Bozack","doi":"10.1109/HOLM.2011.6034820","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034820","url":null,"abstract":"Studies of tin (Sn) whiskers have emphasized the role of compressive stress as the driving force for whisker production, thought to be a necessary condition for Sn whisker growth. The goal of this work is to characterize Sn whisker growth in film systems having measurable net compressive, zero, and tensile intrinsic stress states. The stress states were generated for the case of ~ 0.2 µm sputtered Sn films on Si (which has no interfacial intermetallic) by controlling the background Ar pressure in the magnetron sputtering system, which produces differing bond energies (and stresses) in the resultant films. Verification of the stress states was accomplished by curvature techniques using stylus profilometry and Stoney's equation. The results show that, after three months of incubation at room temperature, high whisker densities are observed under both tensile (12,000 whiskers/cm2) and compressive (16,000 whiskers/cm2) stress conditions, with a minimum whisker density generated in the zero stress (4,000 whiskers/cm2) condition. It is likely that the zero stress condition produced whiskers due to the difficulty in achieving the narrow range (7-9 mTorr) of background pressures necessary to produce the zero stress state. Relative average whisker lengths were 56µm (tensile stress); 4µm (compressive stress); and 1.5µm (zero stress). Subsequent measurements of whisker density (currently at 96 days of incubation) show no reversals/variations in the stress-density relationship.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131244535","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 9

Whisker Growth under Controlled Humidity Exposure 湿度控制下的晶须生长

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034780

E. R. Crandall, G. Flowers, P. Lall, M. Bozack

{"title":"Whisker Growth under Controlled Humidity Exposure","authors":"E. R. Crandall, G. Flowers, P. Lall, M. Bozack","doi":"10.1109/HOLM.2011.6034780","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034780","url":null,"abstract":"Studies of Sn whiskers under controlled, calibrated humidity conditions shows that the highest whisker densities occur for ~ 85% RH. The whisker specimens were 1500 Å Sn films sputtered under compressive stress conditions on silicon and electrochemically polished brass. Subsequently, the samples were exposed to a series of saturated aqueous salt solutions (which generated calibrated relative humidity values of 33, 43, 70, 76, 85, 98% RH) for ~140 days at room temperature. The Sn on brass case at 85% RH produced 6X greater whisker densities than Sn on brass exposed to pure O2, which in turn produced 9X greater whisker densities than Sn on brass exposed to ambient room temperature/humidity. The longest average whisker lengths (6.1 µm for Sn on brass and 9.3 µm for Sn on Si) occurred for 70% RH on both substrates. Corrosion features were observed on all samples, but the 98% RH samples experienced excessive corrosion. Generally, we find a dramatic increase in whisker density at > 60% RH and especially around 85% RH, in agreement with batch processed whisker experiments involving humidity [H. Reynolds et. al., IEEE Trans. Electron. Packag. Manuf. 33 (2010) and P. Oberndorff et. al., IEEE Electronic Comp. and Tech. Conference (2005) 429].","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131336873","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 8

The effect of mechanical parameters of switch-type contact on relay operation characteristics 开关式触点机械参数对继电器动作特性的影响

2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) Pub Date : 2011-10-06 DOI: 10.1109/HOLM.2011.6034789

W. Ren, Songjun Ma, G. Zhai, Huadong Xu

引用次数: 1