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Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts最新文献

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Electrically and frictionally derived mound temperatures in carbon graphite brushes 碳石墨电刷中由电和摩擦引起的丘温
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1988-12-01 DOI: 10.1109/33.31428
M. D. Bryant, Y. G. Yune
{"title":"Electrically and frictionally derived mound temperatures in carbon graphite brushes","authors":"M. D. Bryant, Y. G. Yune","doi":"10.1109/33.31428","DOIUrl":"https://doi.org/10.1109/33.31428","url":null,"abstract":"Numerical and analytical simulations of mound temperatures are presented as the mound evolves from cold to hot. The temperature field about a thermal mound in an electrical brush is estimated using a heat conduction equation with frictional and electrical internal heat sources. Computed temperatures seem to agree with measured temperatures, but thermal nonlinearities can result in temperatures that are higher and hot zones that are larger than the mathematical sum of the frictional and joule thermal fields. It is found that combined heating coupled with nonlinear effects can significantly shorten the formation time of very hot temperature zones. Computed thermal fields mature within about 4 ms, the approximate lifetime of a stationary mound on the brush face. This suggests validity for the assumption that the mound is stationary on the brush during thermal evolution.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133926103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Electrical instabilities in stationary contacts: Al/Al and Al/brass junctions 固定触点的电不稳定性:Al/Al和Al/黄铜结
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1988-03-01 DOI: 10.1109/HOLM.1988.16111
R. Timsit
{"title":"Electrical instabilities in stationary contacts: Al/Al and Al/brass junctions","authors":"R. Timsit","doi":"10.1109/HOLM.1988.16111","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16111","url":null,"abstract":"Electrical instabilities in Al/Al and Al/brass stationary point junctions has been examined in ultrahigh vacuum and in oxygen gas. It is found that Al/brass junctions are electrically stable in vacuum and in oxygen gas if the surfaces are sufficiently clean. The growth of intermetallic compounds in this interface affects stability only after a sufficiently long exposure of the contact, typically several hours, to a temperature typically higher than 150 degrees C. Surface contaminants, probably in the form of carbonaceous material, are deleterious to the performance of Al/Al and Al/brass junctions. However, the junctions often recover from contaminant-induced degeneration. This recovery is attributed in part to thermal dispersal of the contaminants from the electrical interface during the early stages of degeneration.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"452 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125783348","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Fretting corrosion of tin at elevated temperatures 锡在高温下的微动腐蚀
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16101
A. Lee, A. Mao, M. Mamrick
{"title":"Fretting corrosion of tin at elevated temperatures","authors":"A. Lee, A. Mao, M. Mamrick","doi":"10.1109/HOLM.1988.16101","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16101","url":null,"abstract":"Fretting corrosion of a tin-plated copper alloy was investigated over the temperature range up to 110 degrees C using a dimple-flat contact configuration. Results, based on contact resistance (CR) characteristics and scanning electron microscopy examination, revealed that room temperature corrosion results are not valid at elevated temperatures. Specifically, the corrosion rate as well as the statistical scatter of the CR characteristics have a strong temperature dependence. For temperatures of 60-85 degrees C, the Cr rose several times faster, while, outside this temperature range, the corrosion rate was significantly slower.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"155 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122027242","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 46
Ellipsometric analysis for growth of Ag2S film and effect of oil film on corrosion resistance of Ag contact surface Ag2S膜生长及油膜对Ag接触面耐蚀性的影响
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/33.19011
T. Tamai
{"title":"Ellipsometric analysis for growth of Ag2S film and effect of oil film on corrosion resistance of Ag contact surface","authors":"T. Tamai","doi":"10.1109/33.19011","DOIUrl":"https://doi.org/10.1109/33.19011","url":null,"abstract":"By applying ellipsometric analysis, the relationship between the growth of Ag/sub 2/S film and exposure to a H/sub 2/S gas environment was clarified with respect to the contact resistance and formation of the film. Parameters for corrosion kinetics were deduced that are concerned with the growth laws of Ag/sub 2/S film. Furthermore, the effects of oil films on the corrosion resistance of an Ag surface were examined. Stearic acid was used as the oil specimen. The influence of the thickness of the oil film on the contact resistance property was studied for a clean Ag surface and for the surface exposed to an H/sub 2/S gas environment. The optimum thickness for the oil film to sustain low contact resistance was found.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127875951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Effects of composition and age hardening on precious metal electrical contacts 成分和时效硬化对贵金属电触点的影响
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16117
L. Pope, D. Peebles
{"title":"Effects of composition and age hardening on precious metal electrical contacts","authors":"L. Pope, D. Peebles","doi":"10.1109/HOLM.1988.16117","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16117","url":null,"abstract":"A pin-on-plate experimental configuration was used to evaluate two different palladium-alloy pins (ASTM B540 and ASTM B563) sliding on a gold-alloy plate (ASTM B541) age-hardened at two temperatures. For all combinations of test conditions except the higher-palladium-content alloy (ASTM B563), two stages of wear were observed: (1) a prow of Au alloy was formed on the palladium-alloy pin, and (2) work hardening and roughening of the wear track occurred with transfer and backtransfer of Au-alloy material. With the higher-palladium-alloy pin, a friction polymer was formed for laboratory air testing. Results of pin-on-plate tests for air, low partial pressures of O/sub 2/, and atmospheric pressure He are reported.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134161914","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Pure silver surface layer on the oxidized Ag-Sn-In material 纯银表面层上氧化Ag-Sn-In材料
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16089
Shen Yuan-Shou, A.M. Lima
{"title":"Pure silver surface layer on the oxidized Ag-Sn-In material","authors":"Shen Yuan-Shou, A.M. Lima","doi":"10.1109/HOLM.1988.16089","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16089","url":null,"abstract":"One of the drawbacks of internally oxidized Ag-Sn-Al alloy is that a pure silver layer always appears on the oxidized material surface after oxidation. Although the thickness of the pure silver layer varies only between 0.0002 and 0.001 in. (0.005 to 0.025 mm), the silver layer always causes light tack welding in the early stage of a switching operation. The severity depends on the device's mechanical design as well as the electric current. The surfaces of several Ag alloys were examined under an optical microscope and cross sections were then taken and investigated by the standard metallography method. It is found that one pure silver surface of the Ag-Sn-In material can be eliminated by oxidizing the material from one side.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117277028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Nonlinear distortion voltage testing of contact surfaces 接触面非线性畸变电压测试
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16129
I. Minowa, M. Kanno
{"title":"Nonlinear distortion voltage testing of contact surfaces","authors":"I. Minowa, M. Kanno","doi":"10.1109/HOLM.1988.16129","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16129","url":null,"abstract":"Contact resistance, second-order distortion voltages, and DC vias voltages, which minimize distortion, are measured on a copper surface for studying surface film conditions. Platinum contact members to a copper rod and a polished surface of a single copper crystal are tested. The results are statistically indicated and shown with histograms in order to compare the contact resistance to the DC bias voltage. The results, obtained using a dual-frequency method and DC source, suggest that the second-order distortion (result of rectification) would be caused by a potential difference (difference of work functions of the contact metals) through layers, since the second-order distortion is strongly influenced by a DC bias voltage and approaches zero at a characteristic value for the combination of metals.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123685853","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Advancement in cermet thick film technology for dry circuit applications 干电路用金属陶瓷厚膜技术的进展
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16125
R.M. Bolin, W. Bosze
{"title":"Advancement in cermet thick film technology for dry circuit applications","authors":"R.M. Bolin, W. Bosze","doi":"10.1109/HOLM.1988.16125","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16125","url":null,"abstract":"The primary limiting factor of the variable resistors presently available for operation in the low microampere range is output instability as a result of changes in contact resistance. These changes result from nonconductive films and dielectrics forming over time between the resistor element and wiper contact. The authors discuss a novel cermet technology that greatly reduces the effects of contact resistance, namely, recently developed Palirium system that improves output stability by creating a precious metal to metal contact point between the resistor's element and the wiper.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130826561","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Beryllium copper/palladium alloy electron beam welded sliding contacts 铍铜/钯合金电子束焊接滑动触点
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16118
J. Kaiser, G. Raykhtsaum
{"title":"Beryllium copper/palladium alloy electron beam welded sliding contacts","authors":"J. Kaiser, G. Raykhtsaum","doi":"10.1109/HOLM.1988.16118","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16118","url":null,"abstract":"The advantages and process limitations of the latest generation of electron-beam-welded materials are reviewed. The study of metallurgical properties in the weld zone utilizes scanning electron microscopy and metallographic techniques. Various material and weld parameters are evaluated at they relate to final mechanical properties. The relationships of design criteria to metallurgical characteristics and to the effects of heat treatment are discussed.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128827622","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experimental study on the process of cleaning the contacts of signal control relays 信号控制继电器触头清洗过程的实验研究
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI: 10.1109/HOLM.1988.16133
M. Ohba, K. Kuzukawa, K. Sakairi
{"title":"Experimental study on the process of cleaning the contacts of signal control relays","authors":"M. Ohba, K. Kuzukawa, K. Sakairi","doi":"10.1109/HOLM.1988.16133","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16133","url":null,"abstract":"The authors carried out a study of the effect of organic materials on contact resistance, taking as a typical contamination source paraffin hydrocarbons, which are the most general kind of contact contaminant and are used in the various machines in the manufacturing processes, to clarify the problem of contact reliability caused by contamination by organic materials during the manufacturing process. In addition, the authors also studied conventional methods of contact cleaning as well as cleaning methods that could conceivably be used instead of conventional methods. As a result of this study, it was found that, even when the thickness of organic membranes was around 100 AA, the contact resistance increased along with the passage of time. This trend was particularly prominent at the normally open contact side. The authors also found that alternate methods of removing these organic films, such as CO/sub 2/-laser cleaning, were quite effective.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131465972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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