{"title":"Electrical instabilities in stationary contacts: Al/Al and Al/brass junctions","authors":"R. Timsit","doi":"10.1109/HOLM.1988.16111","DOIUrl":null,"url":null,"abstract":"Electrical instabilities in Al/Al and Al/brass stationary point junctions has been examined in ultrahigh vacuum and in oxygen gas. It is found that Al/brass junctions are electrically stable in vacuum and in oxygen gas if the surfaces are sufficiently clean. The growth of intermetallic compounds in this interface affects stability only after a sufficiently long exposure of the contact, typically several hours, to a temperature typically higher than 150 degrees C. Surface contaminants, probably in the form of carbonaceous material, are deleterious to the performance of Al/Al and Al/brass junctions. However, the junctions often recover from contaminant-induced degeneration. This recovery is attributed in part to thermal dispersal of the contaminants from the electrical interface during the early stages of degeneration.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"452 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1988.16111","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
Electrical instabilities in Al/Al and Al/brass stationary point junctions has been examined in ultrahigh vacuum and in oxygen gas. It is found that Al/brass junctions are electrically stable in vacuum and in oxygen gas if the surfaces are sufficiently clean. The growth of intermetallic compounds in this interface affects stability only after a sufficiently long exposure of the contact, typically several hours, to a temperature typically higher than 150 degrees C. Surface contaminants, probably in the form of carbonaceous material, are deleterious to the performance of Al/Al and Al/brass junctions. However, the junctions often recover from contaminant-induced degeneration. This recovery is attributed in part to thermal dispersal of the contaminants from the electrical interface during the early stages of degeneration.<>